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    • 8. 发明授权
    • Test method and test device for line defect of display panel
    • 显示面板线路缺陷的测试方法和测试设备
    • US09424792B2
    • 2016-08-23
    • US14389031
    • 2013-09-17
    • BOE TECHNOLOGY GROUP CO., LTD.HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
    • Ming LiJongseok JangYong Sub KimXiaotao Liu
    • G09G5/00G09G3/36H01L29/04G06T7/00
    • G09G3/3648G06T7/001G06T2207/30121G09G3/006G09G3/3677G09G2310/0202
    • A test method for line defect in a display panel (10) comprises: inputting a first ON signal and a first OFF signal into odd rows of gate scanning lines (GE12) and even rows of gate scanning lines (GS13) of the display panel (10) respectively, to turn on transistors controlled by the odd rows of gate scanning lines (GE12), and turn off transistors controlled by the even rows of gate scanning lines (GS13), thereby obtaining a first test image; inputting a second OFF signal and a second ON signal into the odd rows of gate scanning lines (GE12) and even rows of gate scanning lines (GS13) of the display panel (10) respectively, to turn off the transistors controlled by the odd rows of gate scanning lines (GE12), and turn on the transistors controlled by the even rows of gate scanning lines (GE13), thereby obtaining a second test image; comparing the first test image with the second test image to determine that line display defect appearing in the first test image or the second test image are true display defect. Also is disclosed a test device for line defect in a display panel (10). This method allows the test result to approach the lighting test result under module signal input state and can detect true defect of the display panel (10).
    • 一种显示面板(10)中的线缺陷的测试方法,包括:将第一ON信号和第一OFF信号输入到奇数行的栅极扫描线(GE12)和偶数行的栅极扫描线(GS13) 10)分别导通由奇数行的栅极扫描线(GE12)控制的晶体管,并关闭由栅极扫描线(GS13)的偶数行控制的晶体管,从而获得第一测试图像; 将第二OFF信号和第二ON信号分别输入到显示面板(10)的栅极扫描线(GE12)和偶数行栅极扫描线(GS13)的奇数行中,以关闭由奇数行控制的晶体管 的栅极扫描线(GE12),并接通由栅极扫描线(GE13)的偶数行控制的晶体管,从而获得第二测试图像; 将第一测试图像与第二测试图像进​​行比较,以确定出现在第一测试图像或第二测试图像中的线显示缺陷是真实显示缺陷。 还公开了一种用于显示面板(10)中的线路缺陷的测试装置。 该方法允许测试结果在模块信号输入状态下接近照明测试结果,并可以检测显示面板(10)的真实缺陷。