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1. 发明授权

US09424792B2 Test method and test device for line defect of display panel 有权
标题翻译：显示面板线路缺陷的测试方法和测试设备
公开(公告)号：US09424792B2
公开(公告)日：2016-08-23
申请号：US14389031
申请日：2013-09-17
申请人： BOE TECHNOLOGY GROUP CO., LTD. , HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
发明人： Ming Li , Jongseok Jang , Yong Sub Kim , Xiaotao Liu
IPC分类号： G09G5/00 , G09G3/36 , H01L29/04 , G06T7/00
CPC分类号： G09G3/3648 , G06T7/001 , G06T2207/30121 , G09G3/006 , G09G3/3677 , G09G2310/0202
摘要： A test method for line defect in a display panel (10) comprises: inputting a first ON signal and a first OFF signal into odd rows of gate scanning lines (GE12) and even rows of gate scanning lines (GS13) of the display panel (10) respectively, to turn on transistors controlled by the odd rows of gate scanning lines (GE12), and turn off transistors controlled by the even rows of gate scanning lines (GS13), thereby obtaining a first test image; inputting a second OFF signal and a second ON signal into the odd rows of gate scanning lines (GE12) and even rows of gate scanning lines (GS13) of the display panel (10) respectively, to turn off the transistors controlled by the odd rows of gate scanning lines (GE12), and turn on the transistors controlled by the even rows of gate scanning lines (GE13), thereby obtaining a second test image; comparing the first test image with the second test image to determine that line display defect appearing in the first test image or the second test image are true display defect. Also is disclosed a test device for line defect in a display panel (10). This method allows the test result to approach the lighting test result under module signal input state and can detect true defect of the display panel (10).
摘要翻译：一种显示面板（10）中的线缺陷的测试方法，包括：将第一ON信号和第一OFF信号输入到奇数行的栅极扫描线（GE12）和偶数行的栅极扫描线（GS13） 10）分别导通由奇数行的栅极扫描线（GE12）控制的晶体管，并关闭由栅极扫描线（GS13）的偶数行控制的晶体管，从而获得第一测试图像; 将第二OFF信号和第二ON信号分别输入到显示面板（10）的栅极扫描线（GE12）和偶数行栅极扫描线（GS13）的奇数行中，以关闭由奇数行控制的晶体管的栅极扫描线（GE12），并接通由栅极扫描线（GE13）的偶数行控制的晶体管，从而获得第二测试图像; 将第一测试图像与第二测试图像进行比较，以确定出现在第一测试图像或第二测试图像中的线显示缺陷是真实显示缺陷。还公开了一种用于显示面板（10）中的线路缺陷的测试装置。该方法允许测试结果在模块信号输入状态下接近照明测试结果，并可以检测显示面板（10）的真实缺陷。

2. 发明授权

US09829729B2 Display panel and detection method thereof 有权
公开(公告)号：US09829729B2
公开(公告)日：2017-11-28
申请号：US14407280
申请日：2014-05-16
申请人： BOE TECHNOLOGY GROUP CO., LTD. , HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
发明人： Ming Li , Yong Sub Kim , Xiaotao Liu
IPC分类号： G02F1/13 , G02F1/1343 , G02F1/1362 , G02F1/1335
CPC分类号： G02F1/1309 , G02F1/133514 , G02F1/133528 , G02F1/134309 , G02F1/136259 , G02F1/136286 , G02F2001/136254
摘要： A display panel and a detection method thereof are provided. Wireless signals are transmitted to a gate-line wireless sensing electrode connected to gate lines and a data-line wireless sensing electrode connected to data lines that are preset at a dummy zone of the display panel (1, 1′), respectively, through wireless signal transmitting electrodes (6) connected to a transmitter, so as to generate a gate-line detection signal and a data-line detections signal, thereby realizing detection of the display panel. The gate-line wireless sensing electrode and the data-line wireless sensing electrode are formed at the dummy zone on the array substrate (1, 1′) in the technological process of producing the gate lines and the data lines of the array substrate of the display panel, respectively. Therefore, poorness of a display can be detected without cutting of a display panel (1, 1′), poorness is detected early, and repair is made timely. Thus, the issue that a defective product flows to a subsequent process and a waste of cost results from it is avoided.

3. 发明授权

US10569440B2 Clearing device, operating method thereof, and cutting device 有权
公开(公告)号：US10569440B2
公开(公告)日：2020-02-25
申请号：US15823730
申请日：2017-11-28
申请人： BOE TECHNOLOGY GROUP CO., LTD. , Hefei Xinsheng Optoelectronics Technology Co., Ltd.
发明人： Ping Liu , Qingyu Hu , Yong Sub Kim
IPC分类号： B26D7/18 , B26D5/00 , B26D7/22 , C03B33/03 , C03B33/037 , B08B13/00 , B08B1/00 , B08B5/04 , B08B3/02 , B08B5/02
摘要： A clearing device, an operating method thereof, and a cutting device are provided. The clearing device includes: an operating platform, including an operating surface; a first clearing unit, provided on a side of the operating platform close to the operating surface; a control unit, configured to communicate with the first clearing unit and control a clearing operation and a count of the operation of the first clearing unit; at least one detecting unit, provided on the operating platform and communicatively connected to the control unit, wherein the first clearing unit is configured to clear a foreign matter on the operating surface, the detecting unit is configured to detect a degree of cleanliness of the operating surface and send to the control unit a data signal which reflects the degree of cleanliness of the operating surface.

4. 发明申请

US20200009689A1 LASER CUTTING DEVICE, CONTROL METHOD AND CONTROL APPARATUS 审中-公开
公开(公告)号：US20200009689A1
公开(公告)日：2020-01-09
申请号：US16316636
申请日：2018-05-11
申请人： HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD. , BOE TECHNOLOGY GROUP CO., LTD.
发明人： Ping Liu , Qingyu Hu , Yong Sub Kim
IPC分类号： B23K26/38 , B23K26/03 , B23K26/08 , B23K26/402
摘要： A laser cutting device, a control method and a control apparatus, the device comprising: a conveying mechanism (1) comprising a feeding end and a discharging end; a working platform (2) disposed at the discharging end of the conveying mechanism (1); a first counter (3) and a second counter (4) oppositely disposed at a side of the working platform (2) near the discharging end of the conveying mechanism (1) and driven respectively by two opposite side edges of a substrate (6) to rotate for counting; a laser cutter (5) disposed above the working platform (2); a control device (13) for determining a modified cutting motion path of the laser cutter according to a set cutting path, and starting and ending times of counting values of the first counter (3) and second counter (4), and for controlling the laser cutter to cut the substrate (6) according to the modified cutting motion path.

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