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1. 发明授权

US07995211B2 Contra-propagative wave spectograph 有权
标题翻译：对比传播波分析仪
公开(公告)号：US07995211B2
公开(公告)日：2011-08-09
申请号：US12063214
申请日：2006-08-04
申请人： Etienne Le Coarer , Pierre Benech , Pierre Kern , Gilles Lerondel , Sylvain Blaize , Alain Morand
发明人： Etienne Le Coarer , Pierre Benech , Pierre Kern , Gilles Lerondel , Sylvain Blaize , Alain Morand
IPC分类号： G01B9/02 , G01J3/45
CPC分类号： G01J3/4531 , G01J3/02 , G01J3/0218 , G01J3/0259 , G01J3/2803 , G01J3/4532
摘要： The invention relates to a spectrograph (11) comprising a waveguide (10) provided with accesses (10; 10b, 12), a means for injecting two guided contra-propagative waves by each accesses in such a way that a spatial interference is formed in the waveguide, means (19, 20, 14, 16) for detecting the energy of the evanescent wave of the guided field produced by the interference of said contra-propagative waves.
摘要翻译：本发明涉及一种包括设置有存取（10; 10b，12）的波导（10）的光谱仪（11），用于通过每次访问注入两个引导的反向传播波的装置，以便形成空间干扰波导，用于检测由所述反向传播波的干涉产生的引导场的ev逝波的能量的装置（19,20,14,16）。

2. 发明申请

US20090219543A1 CONTRA-PROPAGATIVE WAVE SPECTOGRAPH 有权
标题翻译：对比波动图
公开(公告)号：US20090219543A1
公开(公告)日：2009-09-03
申请号：US12063214
申请日：2006-08-04
申请人： Etienne Le Coarer , Pierre Benech , Pierre Kern , Gilles Lerondel , Sylvain Blaize , Alain Morand
发明人： Etienne Le Coarer , Pierre Benech , Pierre Kern , Gilles Lerondel , Sylvain Blaize , Alain Morand
IPC分类号： G01J3/45 , G01B9/02
CPC分类号： G01J3/4531 , G01J3/02 , G01J3/0218 , G01J3/0259 , G01J3/2803 , G01J3/4532
摘要： The invention relates to a spectrograph (11) comprising a waveguide (10) provided with accesses (10; 10b, 12), a means for injecting two guided contra-propagative waves by each accesses in such a way that a spatial interference is formed in the waveguide, means (19, 20, 14, 16) for detecting the energy of the evanescent wave of the guided field produced by the interference of said contra-propagative waves.
摘要翻译：本发明涉及一种包括设置有存取（10; 10b，12）的波导（10）的光谱仪（11），用于通过每次访问注入两个引导的反向传播波的装置，以便形成空间干扰波导，用于检测由所述反向传播波的干涉产生的引导场的ev逝波的能量的装置（19,20,14,16）。

3. 发明授权

US09683891B2 Compact spectrometer for two-dimensional sampling 有权
公开(公告)号：US09683891B2
公开(公告)日：2017-06-20
申请号：US12935772
申请日：2009-03-17
申请人： Yassine Hadjar , Sylvain Blaize , Aurelien Bruyant , Gilles Lerondel , Pascal Royer
发明人： Yassine Hadjar , Sylvain Blaize , Aurelien Bruyant , Gilles Lerondel , Pascal Royer
IPC分类号： G01J3/02 , G01J3/28 , G01J3/453 , G01J3/45
CPC分类号： G01J3/0205 , G01J3/02 , G01J3/021 , G01J3/2803 , G01J3/45 , G01J3/453
摘要： A spectrometer for sampling interferograms in two dimensions offering a large spectral band and high spectral resolution with a relative compactness. The spectrometer includes a refracting surface, an array of detecting elements and an array of diffusion elements capturing means at the refracting surface of an interferogram delivered from two interference beams (F1, F2) and forming interference lines parallel to each other along the transverse axis (Ox) of the interferogram within the plane (xOy) of the refracting surface, the array of detection elements being parallel to the plane of the refracting surface and arranged to detect the spatial distribution of the interferogram, wherein the array is a two-dimensional array over an entirety of which the detections elements are disposed equidistantly, and wherein interference lines exhibit an angular shift with the capturing means.

4. 发明申请

US20150116720A1 COMPACT SPECTROMETER FOR TWO-DIMENSIONAL SAMPLING 有权
标题翻译：用于二维采样的精密光谱仪
公开(公告)号：US20150116720A1
公开(公告)日：2015-04-30
申请号：US12935772
申请日：2009-03-17
申请人： Yassine Hadjar , Sylvain Blaize , Aurélien Bruyant , Gilles Lerondel , Pascal Royer
发明人： Yassine Hadjar , Sylvain Blaize , Aurélien Bruyant , Gilles Lerondel , Pascal Royer
IPC分类号： G01J3/02 , G01J3/45
CPC分类号： G01J3/0205 , G01J3/02 , G01J3/021 , G01J3/2803 , G01J3/45 , G01J3/453
摘要： The present invention relates to a spectrometer including a diopter (11); capturing means (15, 18) at said diopter (11) of an interferogram (12) originating from two interference beams (F1, F2) and forming interference lines (13) along the transverse axis (Ox) of the interferogram (12) within the plane (xOy) of the diopter (11), said capturing means (15, 18) including a network (18) of detection elements (19) so arranged to detect the spatial distribution of said interferogram (12), characterized in that said network (18) of detection elements (19) is two-dimensional and in that at least a portion of said capturing means (15, 18) and said interferogram (12) are tilted with regard to each other along the transverse axis (Ox) of the interferogram (12). The present invention also relates to a spectroscopic imaging device, including means for emitting two interference beams (F1, F2), and to such a spectrometer.
摘要翻译：本发明涉及一种包括屈光度（11）的光谱仪; 在来自两个干涉光束（F1，F2）的干涉图（12）的所述屈光度（11）的所述屈光度计（11）处的捕获装置（15,18），并沿着干涉图（12）的横轴（Ox）形成干涉线屈光度计（11）的平面（xOy），所述捕获装置（15,18）包括检测元件（19）的网络（18），以便检测所述干涉图（12）的空间分布，其特征在于：检测元件（19）的网络（18）是二维的，并且所述捕获装置（15,18）和所述干涉图（12）的至少一部分相对于彼此沿着横向轴线（Ox）倾斜，的干涉图（12）。本发明还涉及一种分光成像装置，包括用于发射两个干涉光束（F1，F2）的装置以及这种光谱仪。

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