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    • 1. 发明授权
    • Magnetic random access memory using current through MTJ write mechanism
    • 磁性随机存取存储器采用电流通过MTJ写入机制
    • US06269018B1
    • 2001-07-31
    • US09549171
    • 2000-04-13
    • Douwe Johannes MonsmaStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • Douwe Johannes MonsmaStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • G11C1122
    • H01L27/224G11C11/15G11C11/16G11C13/0069G11C2013/0073G11C2213/79H01L27/228
    • A non-volatile memory array includes a plurality of memory cells. Each memory cell includes a magnetic tunnel junction device having a first free ferromagnetic layer, a second free ferromagnetic layer and a highly conductive layer. The first ferromagnetic layer of each magnetic tunnel junction device extends in a direction that is substantially parallel to the second ferromagnetic layer of the magnetic tunnel junction device. The highly conductive layer of each magnetic tunnel junction device is formed between the first ferromagnetic layer and the second ferromagnetic layer of the magnetic tunnel junction device. A write current through each selected memory cell flows into the highly conductive layer and along at least a portion of the highly conductive layer. A self-field associated with the write current changes a first predetermined magnetization of the first and second ferromagnetic layers to a second predetermined magnetization. In a second embodiment, each memory cell includes a magnetic tunnel junction device having a first free ferromagnetic layer, a second pinned ferromagnetic layer, and a tunneling barrier layer formed between the first and second ferromagnetic layers. The first free ferromagnetic layer has a magnetization in a form of a vortex. The second pinned ferromagnetic layer has substantially the same shape as the shape of the first free ferromagnetic layer and a magnetization in a form of a vortex. A write current flows through the memory cell and producing a self-field that changes a magnetic vortex state of the first free ferromagnetic layer from a first predetermined handedness to a second predetermined handedness.
    • 非易失性存储器阵列包括多个存储器单元。 每个存储单元包括具有第一自由铁磁层,第二自由铁磁层和高导电层的磁性隧道结器件。 每个磁性隧道结装置的第一铁磁层沿与磁性隧道结装置的第二铁磁层基本平行的方向延伸。 每个磁性隧道结装置的高导电层形成在磁性隧道结装置的第一铁磁层和第二铁磁层之间。 通过每个选定的存储单元的写入电流流入高导电层并且沿着高导电层的至少一部分流动。 与写入电流相关联的自相位将第一和第二铁磁层的第一预定磁化改变为第二预定磁化。 在第二实施例中,每个存储单元包括具有第一自由铁磁层,第二钉扎铁磁层和形成在第一和第二铁磁层之间的隧道势垒层的磁性隧道结器件。 第一自由铁磁层具有涡旋形式的磁化。 第二钉扎铁磁层具有与第一自由铁磁层的形状和涡旋形式的磁化基本相同的形状。 写入电流流过存储器单元并产生将第一自由铁磁层的磁涡流状态从第一预定手性改变为第二预定手性的自场。
    • 2. 发明授权
    • Magnetic random access memory using a non-linear memory element select mechanism
    • 磁性随机存取存储器采用非线性存储元件选择机制
    • US06515897B1
    • 2003-02-04
    • US09549211
    • 2000-04-13
    • Douwe Johannes MonsmaStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • Douwe Johannes MonsmaStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • G11C1115
    • G11C11/15
    • A non-volatile memory array having a substrate, a first plurality of electrically conductive traces formed on the substrate, a second plurality of electrically conductive traces formed on the substrate and overlapping first plurality of traces at a plurality of intersection regions, and a plurality of memory cells. Each memory cell is located at an intersection region between one of the first plurality of traces and one of the second plurality of traces. At least one memory cell includes a non-linear magnetic tunnel junction storage element. The non-linear magnetic tunnel junction storage element has at least a first ferromagnetic layer, a barrier layer and a second ferromagnetic layer. The non-linear magnetic tunnel junction storage element has a non-linearity that is defined by a current having a first magnitude flowing through the non-linear magnetic tunnel junction storage element for a bias across the non-linear magnetic tunnel junction storage element of about 0.5 VA that is ten times or more smaller than a current having a second magnitude flowing through the non-linear magnetic tunnel junction storage element for a bias across the non-linear magnetic tunnel junction storage element of about 1 VA, where VA is an operating voltage for a memory cell. The non-linearity is used for minimizing sneak currents through unselected cells, and allowing read or write selection of a particular memory element in a large array.
    • 一种非易失性存储器阵列,其具有衬底,形成在衬底上的第一多个导电迹线,形成在衬底上的第二多个导电迹线,并且在多个交叉区域上与第一多个迹线重叠, 记忆细胞 每个存储器单元位于第一多个迹线之一和第二多个迹线中的一个之间的交叉区域。 至少一个存储单元包括非线性磁性隧道结存储元件。 非线性磁性隧道结存储元件具有至少第一铁磁层,阻挡层和第二铁磁层。 非线性磁性隧道结存储元件具有非线性,其由具有流过非线性磁性隧道结存储元件的第一幅度的电流限定,用于横跨非线性磁性隧道结存储元件的偏置约为 0.5VA是比具有第二幅度的电流的十倍或更小,该电流流过非线性磁性隧道结存储元件,用于跨过非线性磁性隧道结存储元件的约1VA的偏压,其中VA是操作的 一个存储单元的电压。 非线性用于通过未选择的单元最小化潜行电流,并允许以大阵列对特定存储器元件进行读取或写入选择。
    • 3. 发明授权
    • Magnetic random access memory using a series tunnel element select mechanism
    • 磁性随机存取存储器采用串联隧道元素选择机制
    • US06331944B1
    • 2001-12-18
    • US09549172
    • 2000-04-13
    • Douwe Johannes MonsmaStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • Douwe Johannes MonsmaStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • G11C1300
    • H01L27/224G11C11/15
    • A non-volatile memory array includes first and second pluralities of electrically conductive traces formed on a substrate. The second plurality of electrically conductive traces overlap first plurality of traces at a plurality of intersection regions. Each of a plurality of memory cells is located at an intersection region between one of the first plurality of traces and one of the second plurality of traces. At least one of the memory cells includes a non-linear selection element in series with a magnetic tunnel junction storage element. The non-linear selection element includes at least a first metallic electrode layer, a barrier layer and a second metallic electrode layer metal. The non-linear selection element has a non-linearity defined by a current having a first magnitude flowing through the non-linear selection element for a first bias voltage across the non-linear selection element that is ten times or more smaller than a current having a second magnitude flowing through the non-linear selection element for a second bias voltage across the non-linear selection element, such that the second bias voltage is about two times greater than the first bias voltage. The magnetic tunnel junction storage element includes at least a first ferromagnetic layer, a thin insulating layer and a second ferromagnetic layer.
    • 非易失性存储器阵列包括形成在衬底上的第一和第二多个导电迹线。 第二多个导电迹线在多个交叉区域处与第一多个迹线重叠。 多个存储器单元中的每一个位于第一多个迹线中的一个和第二多个迹线中的一个之间的交叉区域。 至少一个存储单元包括与磁性隧道结存储元件串联的非线性选择元件。 非线性选择元件至少包括第一金属电极层,阻挡层和第二金属电极层金属。 非线性选择元件具有由具有流过非线性选择元件的第一幅度的电流定义的非线性,该电流是非线性选择元件的跨越非线性选择元件的第一偏置电压的十倍或更小, 第二幅度流经所述非线性选择元件,以跨越所述非线性选择元件的第二偏置电压流动,使得所述第二偏置电压大约是所述第一偏置电压的两倍。 磁性隧道结存储元件至少包括第一铁磁层,薄绝缘层和第二铁磁层。
    • 4. 发明授权
    • Magnetic memory array using magnetic tunnel junction devices in the
memory cells
    • 磁存储阵列在存储单元中使用磁性隧道结器件
    • US5640343A
    • 1997-06-17
    • US618004
    • 1996-03-18
    • William Joseph GallagherJames Harvey KaufmanStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • William Joseph GallagherJames Harvey KaufmanStuart Stephen Papworth ParkinRoy Edwin Scheuerlein
    • G11C11/15G11C11/16H01L21/8246H01L27/22G11C13/00
    • H01L27/224B82Y10/00G11C11/15G11C11/16
    • A nonvolatile magnetic random access memory (MRAM) is an array of individual magnetic memory cells. Each memory cell is a magnetic tunnel junction (MTJ) element and a diode electrically connected in series. Each MTJ is formed of a pinned ferromagnetic layer whose magnetization direction is prevented from rotating, a free ferromagnetic layer whose magnetization direction is free to rotate between states of parallel and antiparallel to the fixed magnetization of the pinned ferromagnetic layer, and an insulating tunnel barrier between and in contact with the two ferromagnetic layers. Each memory cell has a high resistance that is achieved in a very small surface area by controlling the thickness, and thus the electrical barrier height, of the tunnel barrier layer. The memory cells in the array are controlled by only two lines, and the write currents to change the magnetic state of an MTJ, by use of the write currents' inherent magnetic fields to rotate the magnetization of the free layer, do not pass through the tunnel barrier layer. All MTJ elements, diodes, and contacts are vertically arranged at the intersection regions of the two lines and between the two lines to minimize the total MRAM surface area. The power expended to read or sense the memory cell's magnetic state is reduced by the high resistance of the MTJ and by directing the sensing current through a single memory cell.
    • 非易失磁性随机存取存储器(MRAM)是单个磁存储单元阵列。 每个存储单元是磁性隧道结(MTJ)元件和串联电连接的二极管。 每个MTJ由其磁化方向被阻止旋转的被钉扎的铁磁层形成,一个自由铁磁层,其磁化方向在被固定的铁磁层的固定磁化平行和反平行的状态之间自由旋转;以及绝缘隧道势垒 并与两个铁磁层接触。 每个存储单元具有通过控制隧道势垒层的厚度以及因此控制电势势垒高度而在非常小的表面积中实现的高电阻。 阵列中的存储单元仅由两条线控制,并且通过使用写入电流的固有磁场来旋转自由层的磁化,改变MTJ的磁状态的写入电流不会通过 隧道势垒层。 所有MTJ元件,二极管和触点垂直布置在两条线和两条线之间的交叉区域,以最小化总MRAM表面积。 消耗读取或感测存储单元的磁状态的功率被MTJ的高电阻降低,并通过将感测电流引导通过单个存储单元。