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1. 发明授权

US06754049B1 Transducers for perpendicular recording with inductive cancellation at MR sensor 有权
标题翻译： MR传感器用于电感消除的垂直记录传感器
公开(公告)号：US06754049B1
公开(公告)日：2004-06-22
申请号：US09978435
申请日：2001-10-16
申请人： David J. Seagle , Yugang Wang
发明人： David J. Seagle , Yugang Wang
IPC分类号： G11B533
CPC分类号： G11B5/1278 , Y10S977/934
摘要： Perpendicular recording and magnetoresistive sensing transducers are disclosed having additional coil windings carrying current in an opposite direction to windings encircled by a core. The magnetic influence of the recording transducer on the sense transducer is reduced or eliminated. The inductance of the coils used to drive the recording transducer is reduced, facilitating high-frequency operation. Moreover, the magnetic flux induced by the coils and transmitted by the recording pole tip is increased, improving recording capabilities.
摘要翻译：公开了垂直记录和磁阻感测传感器，其具有附加的线圈绕组，其沿与芯围绕的绕组相反的方向承载电流。记录传感器对感测传感器的磁影响减小或消除。用于驱动记录换能器的线圈的电感减小，便于高频操作。此外，由线圈感应并由记录极尖传递的磁通量增加，从而提高记录能力。

2. 发明授权

US07116517B1 Stitched pole write element with a T-shaped pole tip portion 有权
标题翻译：带有T形极端部分的针脚写入元件
公开(公告)号：US07116517B1
公开(公告)日：2006-10-03
申请号：US10323128
申请日：2002-12-18
申请人： Qing He , Hirohiko Kamimura , Shuhei Otani , Yugang Wang , David J. Seagle
发明人： Qing He , Hirohiko Kamimura , Shuhei Otani , Yugang Wang , David J. Seagle
IPC分类号： G11B5/147
CPC分类号： G11B5/3116 , G11B5/3113 , G11B5/3133
摘要： A T-shaped pole tip portion of an upper pole of a write element for a magnetic disk drive is provided. One end of the pole tip portion, constituting the bottom of the “T,” forms a narrow nose segment at an air bearing surface, while a wing segment at the opposite end of the pole tip portion constitutes the cross-bar top of the “T.” A transition segment extends between the nose segment and the wing segment. A yoke portion of the upper pole includes a surface that is parallel to the air bearing surface and recessed therefrom by a P3R depth. The transition segment does not widen significantly until after the P3R depth, accordingly, the wing segment is recessed from the air bearing surface by more than the P3R depth.
摘要翻译：提供了用于磁盘驱动器的写入元件的上极的T形极尖部分。构成“T”底部的极端部的一端在空气轴承面形成窄的鼻部，而在极尖部的另一端的翼部构成“ T.“ 过渡段在鼻段和翼段之间延伸。上极的轭部包括平行于空气轴承表面并且通过P 3 R深度从其中凹入的表面。在P 3 R深度之后，过渡段不会显着扩大，因此翼段从空气轴承表面凹陷多于P 3 R深度。

3. 发明授权

US07919967B2 Verification of a fabrication process used to form read elements in magnetic heads 有权
标题翻译：用于在磁头中形成读取元件的制造工艺的验证
公开(公告)号：US07919967B2
公开(公告)日：2011-04-05
申请号：US11965502
申请日：2007-12-27
申请人： Satoru Araki , Robert S. Beach , David J. Seagle
发明人： Satoru Araki , Robert S. Beach , David J. Seagle
IPC分类号： G01R31/08 , G01R27/08
CPC分类号： G01R31/2884 , G01R33/1207 , G11B5/127
摘要： Test methods and components are disclosed for testing the quality of a fabrication process used to form read elements in magnetic heads. A wafer is populated with one or more test components along with magnetic heads. The test components are formed by the same or similar fabrication processes as the read elements, but do not include a conductive MR sensor between the test leads. By measuring the resistance of the test components, the formation of parasitic shunts can be identified in the test components, which may indicate the formation of parasitic shunts in the read elements. Thus, the quality of the fabrication process in forming read elements in magnetic head may be determined.
摘要翻译：公开了用于测试用于在磁头中形成读取元件的制造工艺的质量的测试方法和部件。晶片与磁头一起安装有一个或多个测试部件。测试部件通过与读取元件相同或相似的制造工艺形成，但不包括测试引线之间的导电MR传感器。通过测量测试部件的电阻，可以在测试部件中识别寄生分流器的形成，这可以指示在读取元件中形成寄生分流。因此，可以确定在磁头中形成读取元件的制造工艺的质量。

4. 发明授权

US07855553B2 Test components fabricated with large area sensors used for determining the resistance of an MR sensor 有权
标题翻译：用大面积传感器制造的测试部件用于确定MR传感器的电阻
公开(公告)号：US07855553B2
公开(公告)日：2010-12-21
申请号：US11965587
申请日：2007-12-27
申请人： Robert S. Beach , Mary K. Gutberlet , David J. Seagle
发明人： Robert S. Beach , Mary K. Gutberlet , David J. Seagle
IPC分类号： G01R33/12
CPC分类号： G11B20/1816 , G11B5/3166 , G11B5/3173 , G11B5/3193 , G11B5/3903 , G11B2220/2516
摘要： Test methods and components are disclosed for testing resistances of magnetoresistance (MR) sensors in read elements. Test components are fabricated on a wafer with a first test lead, a test MR sensor, and a second test lead. The test leads and test MR sensor are fabricated with similar processes as first shields, MR sensors, and second shields of read elements on tie wafer. However, the test MR sensor is fabricated with an area that is larger than areas of the MR sensors in the read elements. The larger area of the test MR sensor causes the resistance of the test MR sensor to be insignificant compared to the lead resistance. Thus, a resistance measurement of the test component represents the lead resistance of a read element. An accurate resistance measurement of an MR sensor in a read element may then be determined by subtracting the lead resistance.
摘要翻译：公开了用于测试读取元件中的磁阻（MR）传感器的电阻的测试方法和组件。在具有第一测试导线，测试MR传感器和第二测试导线的晶片上制造测试部件。测试引线和测试MR传感器采用与晶片上的读取元件的第一屏蔽，MR传感器和第二屏蔽类似的工艺制造。然而，测试MR传感器的制造面积大于读取元件中MR传感器的面积。测试MR传感器的较大面积导致测试MR传感器的电阻与引线电阻相比不显着。因此，测试部件的电阻测量表示读取元件的引线电阻。然后可以通过减去引线电阻来确定读取元件中的MR传感器的精确电阻测量。

5. 发明授权

US07564110B2 Electrical lapping guides made from tunneling magnetoresistive (TMR) material 失效
标题翻译：由隧道磁阻（TMR）材料制成的电气研磨导轨
公开(公告)号：US07564110B2
公开(公告)日：2009-07-21
申请号：US11379321
申请日：2006-04-19
申请人： Robert S. Beach , Daniele Mauri , David J. Seagle , Jila Tabib
发明人： Robert S. Beach , Daniele Mauri , David J. Seagle , Jila Tabib
IPC分类号： H01L29/82
CPC分类号： G11B5/3173 , B82Y10/00 , B82Y25/00 , G11B5/3169 , G11B5/3906 , G11B5/3909 , H01L43/12
摘要： Tunneling magnetoresistive (TMR) electrical lapping guides (ELG) are disclosed for use in wafer fabrication of magnetic sensing devices, such as magnetic recording heads using TMR read elements. A TMR ELG includes a TMR stack comprising a first conductive layer, a barrier layer, and a second conductive layer of TMR material. The TMR ELG also includes a first lead and a second lead that connect to conductive pads used for applying a sense current to the TMR ELG in a current in plane (CIP) fashion. The first lead contacts one side of the TMR stack so that the first lead contacts both the first conductive layer and the second conductive layer of the TMR stack. The second lead contacts the other side of the TMR stack so that the second lead contacts both the first conductive layer and the second conductive layer of the TMR stack.
摘要翻译：公开了隧道磁阻（TMR）电研磨引导件（ELG），用于磁感测装置的晶片制造，例如使用TMR读取元件的磁记录头。 TMR ELG包括TMR堆叠，其包括第一导电层，阻挡层和TMR材料的第二导电层。 TMR ELG还包括连接到用于以当前平面（CIP）方式向TMR ELG施加感测电流的导电焊盘的第一引线和第二引线。第一引线接触TMR堆叠的一侧，使得第一引线接触TMR堆叠的第一导电层和第二导电层。第二引线接触TMR堆叠的另一侧，使得第二引线接触TMR堆叠的第一导电层和第二导电层。

6. 发明申请

US20090168268A1 Dedicated noncorrosive smear detector 有权
标题翻译：专用非腐蚀性涂片检测仪
公开(公告)号：US20090168268A1
公开(公告)日：2009-07-02
申请号：US12006296
申请日：2007-12-31
申请人： David P. Druist , David J. Seagle , Jila Tabib
发明人： David P. Druist , David J. Seagle , Jila Tabib
IPC分类号： G11B5/33
CPC分类号： G11B5/455 , B82Y10/00 , B82Y25/00 , G11B5/3169 , G11B5/3173 , G11B5/3909 , G11B2005/3996
摘要： A disk drive head slider for a magnetic disk drive is provided. The head slider includes a tunnel magnetic resistance device for reading data on a magnetic disk and a dedicated noncorrosive smear detector for measuring resistance wherein the resistance corresponds to a level of smear associated with the head slider.
摘要翻译：提供了用于磁盘驱动器的磁盘驱动器磁头滑块。磁头滑块包括用于读取磁盘上的数据的隧道磁阻装置和用于测量电阻的专用非腐蚀性涂片检测器，其中电阻对应于与磁头滑块相关联的拖尾水平。

7. 发明申请

US20090168214A1 VERIFICATION OF A FABRICATION PROCESS USED TO FORM READ ELEMENTS IN MAGNETIC HEADS 有权
标题翻译：用于形成读取磁头元件的制造工艺的验证
公开(公告)号：US20090168214A1
公开(公告)日：2009-07-02
申请号：US11965502
申请日：2007-12-27
申请人： Satoru Araki , Robert S. Beach , David J. Seagle
发明人： Satoru Araki , Robert S. Beach , David J. Seagle
IPC分类号： G11B27/36
CPC分类号： G01R31/2884 , G01R33/1207 , G11B5/127
摘要： Test methods and components are disclosed for testing the quality of a fabrication process used to form read elements in magnetic heads. A wafer is populated with one or more test components along with magnetic heads. The test components are formed by the same or similar fabrication processes as the read elements, but do not include a conductive MR sensor between the test leads. By measuring the resistance of the test components, the formation of parasitic shunts can be identified in the test components, which may indicate the formation of parasitic shunts in the read elements. Thus, the quality of the fabrication process in forming read elements in magnetic head may be determined.
摘要翻译：公开了用于测试用于在磁头中形成读取元件的制造工艺的质量的测试方法和部件。晶片与磁头一起安装有一个或多个测试部件。测试部件通过与读取元件相同或相似的制造工艺形成，但不包括测试引线之间的导电MR传感器。通过测量测试部件的电阻，可以在测试部件中识别寄生分流器的形成，这可以指示在读取元件中形成寄生分流。因此，可以确定在磁头中形成读取元件的制造工艺的质量。

8. 发明授权

US5603156A Lapping process for minimizing shorts and element recession at magnetic head air bearing surface 失效
标题翻译：用于最小化磁头空气轴承表面的短路和元件衰退的研磨工艺
公开(公告)号：US5603156A
公开(公告)日：1997-02-18
申请号：US358124
申请日：1994-12-16
申请人： Robert G. Biskeborn , Carol Y. Inouye , David J. Seagle , Albert J. Wallash , Robert O. Barr , Glen A. Garfunkel , Sanford J. Lewis
发明人： Robert G. Biskeborn , Carol Y. Inouye , David J. Seagle , Albert J. Wallash , Robert O. Barr , Glen A. Garfunkel , Sanford J. Lewis
IPC分类号： B24B19/26 , B24B37/00 , G11B5/10 , G11B5/187 , G11B5/31 , G11B5/39 , G11B5/40 , G11B5/60 , G11B5/127
CPC分类号： B82Y25/00 , B24B19/26 , B24B37/00 , B24B37/048 , B82Y10/00 , G11B5/10 , G11B5/1871 , G11B5/3106 , G11B5/3163 , G11B5/3903 , G11B5/6005 , G11B2005/3996 , G11B5/3967 , G11B5/40 , Y10T29/49041 , Y10T29/49046 , Y10T29/49048
摘要： A method of lapping the air bearing surface of a magnetoresistive head which minimizes the likelihood of interelement shorts at the air bearing surface is described. In a final, linear lapping phase, the air bearing surface is lapped back and forth parallel to the longitudinal axis of the head elements in an oscillatory path across a stationary lapping surface. Any scratches or smears of the elements will be along the length of the elements rather than transverse to the elements. Any transverse scratches or smears occurring in earlier lapping phases will be removed during the linear lapping phase.
摘要翻译：描述了一种研磨磁阻头的空气轴承表面的方法，其使在空气轴承表面处的内部短路的可能性最小化。在最终的线性研磨阶段中，空气轴承表面在穿过固定研磨表面的振荡路径中平行于头部元件的纵向轴线平行地前后折叠。元素的任何划痕或污迹将沿着元素的长度而不是横向于元素。在线性研磨阶段期间，在早期研磨阶段发生的任何横向划痕或涂片将被去除。

9. 发明申请

US20130163121A1 MAGNETIC SENSOR HAVING HARD BIAS STRUCTURE FOR OPTIMIZED HARD BIAS FIELD AND HARD BIAS COERCIVITY 有权
标题翻译：具有优化硬度偏差的硬偏置结构的磁传感器和硬偏置系数
公开(公告)号：US20130163121A1
公开(公告)日：2013-06-27
申请号：US13335589
申请日：2011-12-22
申请人： Quang Le , David J. Seagle , Guangli Liu , Yongchul Ahn , Simon H. Liao
发明人： Quang Le , David J. Seagle , Guangli Liu , Yongchul Ahn , Simon H. Liao
IPC分类号： G11B5/60 , G11B5/127
CPC分类号： G11B5/3909 , B82Y10/00 , G11B5/3932 , G11B2005/3996
摘要： A magnetic read sensor having a hard bias structure that extends beyond the back edge of the sensor stack by a controlled, distance that is chosen to maximize both hard bias field and hard bias magnetic coercivity and anisotropy. The hard bias structure has a back edge that is well defined and that has a square corner at its innermost end adjacent to the sensor stack. The magnetic sensor can be constructed by a process that includes a separate making an milling process that is dedicated to defining the back edge of the hard bias structure.
摘要翻译：具有硬偏压结构的磁读取传感器，其通过受控的距离延伸超过传感器堆叠的后边缘，该距离被选择为最大化硬偏置磁场和硬偏磁磁矫顽力和各向异性。硬偏置结构具有良好限定的后边缘，并且在与传感器堆叠相邻的最内端具有正方形角。磁传感器可以通过包括单独制造专用于限定硬偏压结构的后边缘的铣削过程的工艺来构造。

10. 发明授权

US08335053B2 Integrated touch-down pad and touch-down sensor 有权
标题翻译：集成的触摸板和触摸屏传感器
公开(公告)号：US08335053B2
公开(公告)日：2012-12-18
申请号：US12914883
申请日：2010-10-28
申请人： Yingjian Chen , David J. Seagle , Samuel W. Yuan
发明人： Yingjian Chen , David J. Seagle , Samuel W. Yuan
IPC分类号： G11B21/02
CPC分类号： G11B5/607 , G11B5/6076
摘要： In one general embodiment, a magnetic head includes a touch-down pad, comprising at least one shielding element positioned between a leading edge of a main magnetic pole and a trailing edge of a lower return pole; an embedded contact sensor (ECS) in an electrically isolating layer, the ECS positioned near an ABS side of the magnetic head and between the leading edge of the main magnetic pole and the trailing edge of the lower return pole; and a first thermal fly-height control (TFC) element positioned away from the ABS side of the magnetic head. Additional systems and methods are also presented.
摘要翻译：在一个一般实施例中，磁头包括一个触控板，包括位于主磁极的前缘和下回极的后缘之间的至少一个屏蔽元件; 位于电绝缘层中的嵌入式接触传感器（ECS），ECS位于磁头的ABS侧附近，并且位于主磁极的前缘和下返回极的后缘之间; 以及远离磁头的ABS侧定位的第一热飞跃高度控制（TFC）元件。还介绍了其他系统和方法。

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