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    • 2. 发明授权
    • X-ray fluorescence imaging of elements
    • 元素的X射线荧光成像
    • US4987582A
    • 1991-01-22
    • US423831
    • 1989-10-19
    • Jackie R. WebsterKeith V. PearsonDavid B. ChangNorton L. MoiseVictor Vali
    • Jackie R. WebsterKeith V. PearsonDavid B. ChangNorton L. MoiseVictor Vali
    • G01N23/207G01N23/223G01N33/00
    • G01N23/2076G01N23/223G01N2033/0081G01N2223/076
    • A system for detecting the presence of known materials in a body or container. The system incorporates a gamma or X-ray source for irradiating the body with gamma rays to produce X-ray fluorescence of materials contained therein. A directionally discriminate X-ray detector is positioned to intercept X-rays emitted from the body and is adapted to pass only those X-rays having a predetermined wavelength and incident from a specific direction that are characteristic of a material of interest contained in the body. The detector includes a dislocation free single crystal having substantially parallel input and output surfaces. A second crystal aligned parallel to the first crystal may be disposed at a position offset from the first crystal to receive the X-rays transmitted by the first crystal in order to discriminate between materials fluorescing within the body. In a specific embodiment of the invention, the first detector comprises an elongated crystal which pass X-rays in accordance with the Borrmann effect. A plurality of the crystals are arranged in a linear array and the container is either scanned with the array or the container passed linearly past the array. The detected X-rays are measured in intensity and the data is processed by suitable data processor to generate a video image indicative of the presence and shape of the specific materials for which the system is adapted. In yet another specific embodiment of the invention, a plurality of such arrays can be arranged with the input surfaces of the crystals disposed at different Bragg angles to simultaneously detect the presence of a selected group of materials.
    • 4. 发明授权
    • Apparatus and method for focusing hard X-rays
    • 用于聚焦硬X射线的装置和方法
    • US5210779A
    • 1993-05-11
    • US736153
    • 1991-07-26
    • Victor ValiDavid B. ChangAlbert F. Lawrence
    • Victor ValiDavid B. ChangAlbert F. Lawrence
    • G03F7/20G21K1/06H01L21/027
    • G21K1/06G03F7/70158G03F7/70316G21K2201/062
    • A dislocation-free, composite-substance crystal having a lattice constant which decreases over the length of the crystal (38) convergently focuses beams of hard X-rays or gamma rays (11). A single-substance, dislocation-free crystal (34) collimates diffuse beams of hard X-rays or gamma rays and projects the collimated radiation (11') to the focusing crystal (38). A mask (36) is interposed between the collimating crystal (34) and the focusing crystal (38) causing the collimated radiation (11'') to carry an image of the mask (36). The focusing crystal (38) produces a convergent hard X-ray beam or gamma ray beam (11''') to focus a reduced image of the mask (36) upon the photosensitive layer (41) of a wafer (39). An example of a dislocation-free crystal having a lattice constant which decreases over its length (38) is a dislocation-free silicon-germanium crystal (20) wherein the proportion of germanium to silicon varies over the length of the crystal.
    • 具有在晶体(38)的长度上减小的晶格常数的无位错复合材料晶体会聚地聚焦硬X射线或γ射线(11)的光束。 单体无位错晶体(34)准直了硬X射线或伽马射线的漫射束,并将准直辐射(11')投影到聚焦晶体(38)。 在准直晶体(34)和聚焦晶体(38)之间插入有使准直辐射(11“)携带掩模(36)的图像的掩模(36)。 聚焦晶体(38)产生会聚的硬X射线束或伽马射线束(11“),以将掩模(36)的还原图像聚焦在晶片(39)的感光层(41)上。 具有在其长度上减小的晶格常数(38)的无位错晶体的实例是无位错硅 - 锗晶体(20),其中锗与硅的比例在晶体长度上变化。
    • 7. 发明授权
    • Optical waveguide image transmission system and method
    • 光波导图像传输系统及方法
    • US5469519A
    • 1995-11-21
    • US13288
    • 1993-02-04
    • David B. ChangVictor ValiI-Fu Shih
    • David B. ChangVictor ValiI-Fu Shih
    • G02B6/06G02B27/46G02B6/32
    • G02B27/46G02B6/06
    • An improved image transmission system which includes an elongate optical waveguide 15 having an input aperture 17 and an output aperture 19. Optical apparatus 11, 13 is provided for injecting a transform of an image into the waveguide. In a specific implementation, the Fourier transform of the image is injected at the input aperture 17. The output image is transformed as well to provide the desired image. When the Fourier components of the image are transmitted, each component propagates at a different velocity. However, the magnitude of the components are preserved and used to reconstruct the image at the output of the waveguide. This allows for the transmission of optical images without digitization with a single, inexpensive waveguide.
    • 一种改进的图像传输系统,其包括具有输入孔17和输出孔19的细长光波导15.光学装置11,13被设置用于将图像的变换注入到波导中。 在具体实现中,图像的傅里叶变换在输入孔17处被注入。输出图像也被变换以提供期望的图像。 当传输图像的傅立叶分量时,每个分量以不同的速度传播。 然而,分量的大小被保留并用于在波导的输出处重建图像。 这允许用单个廉价的波导传输光学图像而不进行数字化。
    • 8. 发明授权
    • Noncontact, on-line determination of phosphate layer thickness and
composition of a phosphate coated surface
    • 非接触式,在线测定磷酸盐层厚度和磷酸盐涂层表面的组成
    • US5289266A
    • 1994-02-22
    • US885066
    • 1992-05-14
    • I-Fu ShihDavid B. ChangVictor Vali
    • I-Fu ShihDavid B. ChangVictor Vali
    • G01B11/06G01N21/31G01N21/55G01N21/84G01B11/02
    • G01N21/8422G01B11/0616G01N2021/8427G01N21/314G01N21/55
    • A nondestructive method and apparatus is disclosed for determining the thickness and composition of a zinc phosphate layer applied to a metal surface, such as sheet metal on an automotive assembly line. The phosphate layer is irradiated with infrared light which is at least partially transmitted through the phosphate layer. Reflections from the upper and lower surfaces of the phosphate layer return a total reflected intensity which is a function of the optical parameters of the phosphate components and the ratio of the components corresponding to the optical parameters. In the event, for example, that a phosphate layer includes two zinc phosphate components, the measure of reflected intensity at two separate wavelengths will be different inasmuch as the optical properties of the zinc phosphate components is also a function of frequency. The measured reflected intensity and its functional dependence upon the ratio of the components within the phosphate layer can be taken together with the known values of the optical parameters of each component to compute the fraction of each component within the phosphate layer.
    • 公开了用于确定施加到金属表面的磷酸锌层(例如汽车装配线上的金属板)的厚度和组成的非破坏性方法和装置。 用至少部分透过磷酸盐层的红外光照射磷酸盐层。 从磷酸盐层的上表面和下表面的反射返回总反射强度,其是磷酸盐组分的光学参数和对应于光学参数的组分的比率的函数。 在例如磷酸盐层包含两种磷酸锌成分的情况下,由于磷酸锌成分的光学特性也是频率的函数,所以在两个分开的波长处的反射强度的测量将是不同的。 测量的反射强度及其对磷酸盐层中组分比例的功能依赖性可以与每个组分的光学参数的已知值一起计算,以计算磷酸盐层内每个组分的分数。