专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20090086216A1 Partially Coherent Illumination For Inverse Scattering Full-Field Interferometric Synthetic Aperture Microscopy 有权
标题翻译：部分相干照明用于反向散射全场干涉合成孔径显微镜
公开(公告)号：US20090086216A1
公开(公告)日：2009-04-02
申请号：US12131390
申请日：2008-06-02
申请人： Daniel L. Marks , Brynmor J. Davis , Stephen A. Boppart , Paul Scott Carney
发明人： Daniel L. Marks , Brynmor J. Davis , Stephen A. Boppart , Paul Scott Carney
IPC分类号： G01B11/02 , G02B21/00
CPC分类号： G02B21/0056 , G01N21/4795 , G02B21/0064 , G02B27/58
摘要： Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of light characterized by partial spatial coherence. The beam is focused onto a sample and scattered light from the sample is superposed with a reference beam derived from the source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measurement data to structure of an object to allow solutions of an inverse scattering problem, based upon the interference signal so that a three-dimensional structure of the same may be inferred. The partial spatial coherence of the source, which may be fixed or variable, may advantageously provide for rejection of multiple scattering artifacts and thus improve image quality.
摘要翻译：样品三维成像的方法和装置。提供了源于以部分空间相干为特征的光束的源。光束被聚焦到样本上，并且来自样本的散射光与从光源导出的参考光束叠加到焦平面检测器阵列上以提供干涉信号。导出将测量数据与对象的结构相关联的前向散射模型，以便基于干扰信号来反演散射问题的解，从而可以推断出该三维结构。可以是固定的或可变的源的部分空间相干性可以有利地提供多个散射假象的抑制，从而提高图像质量。

2. 发明授权

US07643155B2 Partially coherent illumination for inverse scattering full-field interferometric synthetic aperture microscopy 有权
标题翻译：反向散射全场干涉合成孔径显微镜的部分相干照明
公开(公告)号：US07643155B2
公开(公告)日：2010-01-05
申请号：US12131390
申请日：2008-06-02
申请人： Daniel L. Marks , Brynmor J. Davis , Stephen A. Boppart , Paul Scott Carney
发明人： Daniel L. Marks , Brynmor J. Davis , Stephen A. Boppart , Paul Scott Carney
IPC分类号： G01B11/02
CPC分类号： G02B21/0056 , G01N21/4795 , G02B21/0064 , G02B27/58
摘要： Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of light characterized by partial spatial coherence. The beam is focused onto a sample and scattered light from the sample is superposed with a reference beam derived from the source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measurement data to structure of an object to allow solutions of an inverse scattering problem, based upon the interference signal so that a three-dimensional structure of the same may be inferred. The partial spatial coherence of the source, which may be fixed or variable, may advantageously provide for rejection of multiple scattering artifacts and thus improve image quality.
摘要翻译：样品三维成像的方法和装置。提供了源于以部分空间相干为特征的光束的源。光束被聚焦到样本上，并且来自样本的散射光与从光源导出的参考光束叠加到焦平面检测器阵列上以提供干涉信号。导出将测量数据与对象的结构相关联的前向散射模型，以便基于干扰信号来反演散射问题的解，从而可以推断出该三维结构。可以是固定的或可变的源的部分空间相干性可以有利地提供多个散射假象的抑制，从而提高图像质量。

3. 发明授权

US07602501B2 Interferometric synthetic aperture microscopy 有权
标题翻译：干涉合成孔径显微镜
公开(公告)号：US07602501B2
公开(公告)日：2009-10-13
申请号：US11775572
申请日：2007-07-10
申请人： Tyler S. Ralston , Daniel L. Marks , Paul Scott Carney , Stephen A. Boppart
发明人： Tyler S. Ralston , Daniel L. Marks , Paul Scott Carney , Stephen A. Boppart
IPC分类号： G01B11/02
CPC分类号： G02B21/0056 , G01N21/4795 , G02B21/0064 , G02B27/58
摘要： Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of substantially collimated light characterized by a temporally dependent spectrum. The beam is focused in a plane characterized by a fixed displacement along the propagation axis of the beam, and scattered light from the sample is superposed with a reference beam derived from the substantially collimated source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measured data to structure of an object to allow solution of an inverse scattering problem based upon the interference signal so that a three-dimensional structure of the sample may be inferred in near real time.
摘要翻译：样品三维成像的方法和装置。提供源于由时间依赖光谱表征的基本上准直的光束的光束。光束聚焦在特征为沿着光束的传播轴的固定位移的平面中，并且来自样本的散射光与从基本上准直的光源导出的参考光束叠加到焦平面检测器阵列上以提供干涉信号。派生前向散射模型将测量数据与对象的结构相关联，以允许基于干扰信号解决反散射问题，从而可以近似实时推断样本的三维结构。

4. 发明申请

US20080140341A1 Interferometric Synthetic Aperture Microscopy 有权
标题翻译：干涉合成孔径显微镜
公开(公告)号：US20080140341A1
公开(公告)日：2008-06-12
申请号：US11775572
申请日：2007-07-10
申请人： Tyler S. Ralston , Daniel L. Marks , Paul Scott Carney , Stephen A. Boppart
发明人： Tyler S. Ralston , Daniel L. Marks , Paul Scott Carney , Stephen A. Boppart
IPC分类号： G01B11/24 , G06F15/00
CPC分类号： G02B21/0056 , G01N21/4795 , G02B21/0064 , G02B27/58
摘要： Methods and apparatus for three-dimensional imaging of a sample. A source is provided of a beam of substantially collimated light characterized by a temporally dependent spectrum. The beam is focused in a plane characterized by a fixed displacement along the propagation axis of the beam, and scattered light from the sample is superposed with a reference beam derived from the substantially collimated source onto a focal plane detector array to provide an interference signal. A forward scattering model is derived relating measured data to structure of an object to allow solution of an inverse scattering problem based upon the interference signal so that a three-dimensional structure of the sample may be inferred in near real time
摘要翻译：样品三维成像的方法和装置。提供源于由时间依赖光谱表征的基本上准直的光束的光束。光束聚焦在特征为沿着光束的传播轴的固定位移的平面中，并且来自样本的散射光与从基本上准直的光源导出的参考光束叠加到焦平面检测器阵列上以提供干涉信号。派生前向散射模型将测量数据与对象的结构相关联，以便基于干扰信号解决反散射问题，从而可以近似实时推断样本的三维结构

5. 发明申请

US20110267617A1 Second-Order Nonlinear Susceptibility of a Nanoparticle Using Coherent Confocal Microscopy 有权
标题翻译：使用相干共聚焦显微镜对纳米粒子的二阶非线性敏感性
公开(公告)号：US20110267617A1
公开(公告)日：2011-11-03
申请号：US13154014
申请日：2011-06-06
申请人： Paul Scott Carney , Kimani C. Toussaint , Brynmor J. Davis , Santosh Tripathi
发明人： Paul Scott Carney , Kimani C. Toussaint , Brynmor J. Davis , Santosh Tripathi
IPC分类号： G01N21/47 , G01J3/30
CPC分类号： G01N21/636 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.
摘要翻译：一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。

6. 发明申请

US20120116739A1 Infrared Microspectroscopy for Intact Fibers 审中-公开
标题翻译：完整纤维的红外显微光谱
公开(公告)号：US20120116739A1
公开(公告)日：2012-05-10
申请号：US12941159
申请日：2010-11-08
申请人： Brynmor J. Davis , Paul Scott Carney , Rohit Bhargava
发明人： Brynmor J. Davis , Paul Scott Carney , Rohit Bhargava
IPC分类号： G06G7/48 , G01J3/28 , G06F19/00
CPC分类号： G01J3/0218 , G01J3/0275
摘要： Methods and a non-transient computer medium embodying computer readable code for extracting bulk spectroscopic properties of a particle. A forward model is built of an optical field focused on, and interacting with, the particle, where the forward model parameterized in terms of at least one geometrical characteristic of the particle. The particle, which may be a filamentary material, is illuminated with an incident optical field having a spectral range. Either a transmitted or scattered optical field is detected in a far-field zone as a function of wavenumber to obtain a measured spectrum. The measured spectrum is inverted to recover the imaginary part of the complex refractive index of the particle.
摘要翻译：方法和体现计算机可读代码的非瞬态计算机介质，用于提取粒子的体光谱性质。正向模型由聚焦在粒子上的光场构成，其中前向模型根据粒子的至少一个几何特征参数化。可以是具有光谱范围的入射光场照射可以是丝状材料的颗粒。在远场区域中检测到发射或散射的光场作为波数的函数，以获得测量的光谱。测量的光谱被反转以恢复颗粒的复折射率的虚部。

7. 发明申请

US20100067005A1 Robust Determination of the Anisotropic Polarizability of Nanoparticles Using Coherent Confocal Microscopy 有权
标题翻译：使用相干共焦显微镜强化确定纳米颗粒的各向异性极化率
公开(公告)号：US20100067005A1
公开(公告)日：2010-03-18
申请号：US12405711
申请日：2009-03-17
申请人： Brynmor J. Davis , Paul Scott Carney
发明人： Brynmor J. Davis , Paul Scott Carney
IPC分类号： G01N21/00 , G06F19/00
CPC分类号： G01N21/21 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope for fully characterizing the elastic scattering properties of a nanoparticle as a function of wavelength. Using a high numerical aperture lens, two-dimensional scanning and a simple vector beam shaper, the rank-2 polarizability tensor is estimated from a single confocal image. A computationally efficient data processing method is described and numerical simulations show that this algorithm is robust to noise and uncertainty in the focal plane position. The measurement of the polarizability removes the need for a priori assumptions regarding the nanoparticle shape.
摘要翻译：一种用于完全表征纳米颗粒的弹性散射性质作为波长的函数的相干共聚焦显微镜。使用高数值孔径透镜，二维扫描和简单的矢量光束整形器，从单个共焦图像估计二阶极化率张量。描述了计算有效的数据处理方法，数值模拟表明，该算法对焦平面位置的噪声和不确定性是鲁棒的。极化率的测量消除了关于纳米颗粒形状的先验假设的需要。

8. 发明授权

US08334976B2 Second-order nonlinear susceptibility of a nanoparticle using coherent confocal microscopy 有权
标题翻译：使用相干共焦显微镜的纳米颗粒的二阶非线性敏感性
公开(公告)号：US08334976B2
公开(公告)日：2012-12-18
申请号：US13154014
申请日：2011-06-06
申请人： Paul Scott Carney , Kimani C. Toussaint , Brynmor J. Davis , Santosh Tripathi
发明人： Paul Scott Carney , Kimani C. Toussaint , Brynmor J. Davis , Santosh Tripathi
IPC分类号： G01N21/00
CPC分类号： G01N21/636 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.
摘要翻译：一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。

9. 发明授权

US08045161B2 Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy 有权
标题翻译：使用相干共聚焦显微镜稳定确定纳米粒子的各向异性极化率
公开(公告)号：US08045161B2
公开(公告)日：2011-10-25
申请号：US12405711
申请日：2009-03-17
申请人： Brynmor J. Davis , Paul Scott Carney
发明人： Brynmor J. Davis , Paul Scott Carney
IPC分类号： G01N21/00
CPC分类号： G01N21/21 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope for fully characterizing the elastic scattering properties of a nanoparticle as a function of wavelength. Using a high numerical aperture lens, two-dimensional scanning and a simple vector beam shaper, the rank-2 polarizability tensor is estimated from a single confocal image. A computationally efficient data processing method is described and numerical simulations show that this algorithm is robust to noise and uncertainty in the focal plane position. The measurement of the polarizability removes the need for a priori assumptions regarding the nanoparticle shape.
摘要翻译：一种用于完全表征纳米颗粒的弹性散射性质作为波长的函数的相干共聚焦显微镜。使用高数值孔径透镜，二维扫描和简单的矢量光束整形器，从单个共焦图像估计二阶极化率张量。描述了计算有效的数据处理方法，数值模拟表明，该算法对焦平面位置的噪声和不确定性是鲁棒的。极化率的测量消除了关于纳米颗粒形状的先验假设的需要。

10. 发明申请

US20090296094A1 Spectral Near-Field Optical Tomography 有权
标题翻译：光谱近场光学层析成像
公开(公告)号：US20090296094A1
公开(公告)日：2009-12-03
申请号：US12402177
申请日：2009-03-11
申请人： Brynmor J. Davis , Jin Sun , John C. Schotland , Paul Scott Carney
发明人： Brynmor J. Davis , Jin Sun , John C. Schotland , Paul Scott Carney
IPC分类号： G06F15/00 , G01N21/55
CPC分类号： G01N21/47 , G01N2021/4709 , G01N2021/4711
摘要： A method and computer program product for imaging an object are disclosed. The object is illuminated with an electromagnetic wave, characterized by a spectrum of illuminating wavevectors. Electromagnetic waves scattered by the object are detected, and are characterized by a spectrum of detected wavevectors. An aperture equal to or smaller than an instantaneous characterizing wavelength of the illuminating electromagnetic wave is disposed between the source and the detector. At least one of the illuminating and detected wavevectors is varied in magnitude to provide information regarding a scattering characteristic of the object. By applying a forward model of the aperture to derive a three-dimensional scattering model, a three-dimensional reconstruction of the object may be obtained by inverting a detected data function in terms of the forward model.
摘要翻译：公开了一种用于对物体成像的方法和计算机程序产品。该物体用电磁波照射，其特征在于一系列照明波形矢量。检测到被物体散射的电磁波，其特征在于检测波形的频谱。等于或小于照明电磁波的瞬时特征波长的孔布置在源和检测器之间。照明和检测的波形矢量中的至少一个在幅度上变化以提供关于物体的散射特性的信息。通过应用孔径的前向模型来导出三维散射模型，可以通过在正向模型方面反转检测到的数据函数来获得对象的三维重建。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式