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1. 发明申请

US20110242723A1 RELAY DRIVER CIRCUIT 审中-公开
标题翻译：继电器驱动电路
公开(公告)号：US20110242723A1
公开(公告)日：2011-10-06
申请号：US13050081
申请日：2011-03-17
申请人： Daisuke Akita , Yuuichi Kumazawa
发明人： Daisuke Akita , Yuuichi Kumazawa
IPC分类号： H01H47/18 , H01H47/22
CPC分类号： H01H47/325 , H01H47/32
摘要： Power that is supplied to a primary coil of a transformer from a DC power supply that is connected to the primary coil is modulated based on continuous pulses supplied from a microcontroller, and power that is induced between terminals of a secondary coil of the transformer is supplied to a relay. A large driving current can be supplied to the relay thereby, thus making it possible to reduce the ripple component, and, as a result, to achieve stabilized operation.
摘要翻译：从连接到初级线圈的直流电源提供给变压器的初级线圈的功率基于从微控制器提供的连续脉冲进行调制，并且在变压器的次级线圈的端子之间感应的功率被提供到继电器可以向继电器提供大的驱动电流，从而可以减小纹波分量，结果是实现稳定的操作。

2. 发明申请

US20110241692A1 RELAY END-OF-SERVICE-LIFE FORECASTING DEVICE 审中-公开
标题翻译：继电器终止服务寿命预测设备
公开(公告)号：US20110241692A1
公开(公告)日：2011-10-06
申请号：US13047977
申请日：2011-03-15
申请人： Daisuke Akita , Yuuichi Kumazawa
发明人： Daisuke Akita , Yuuichi Kumazawa
IPC分类号： G01R31/327
CPC分类号： H01H47/002 , G01R31/3278 , H01H3/001 , H01H11/0062 , H01H2071/044
摘要： Forecasting the end of the service life of a relay more accurately due to the effects of the load conditions and the environmental conditions can occur through diagnosing the end of service life of the relay based on the time, until the point in time that the actual opening or closing of the relay is detected, from the point in time of the application of the power to the relay or the point in time of the end of application of power to the relay coil by the controlling portion. Forecasting the end of the service life of the relay based on time, increases accuracy because time is a value that is not affected by the external environment. Additionally, because the end of the service life is forecasted based on the actual opening/closing of the relay, not only is it possible to detect immediately a fault in the relay, but it is also possible to eliminate the effects due to individual differences.
摘要翻译：由于负载条件和环境条件的影响，更准确地预测继电器使用寿命的终点，可以通过根据时间来诊断继电器的使用寿命，直到实际开启的时间点从施加电力到继电器的时间点或通过控制部分向继电器线圈施加电力结束的时间点检测到继电器的闭合。基于时间预测继电器的使用寿命，提高精度，因为时间是不受外部环境影响的值。另外，由于基于继电器的实际开/关来预测使用寿命的结束，不仅可以立即检测继电器中的故障，还可以消除由于个体差异引起的影响。

3. 发明申请

US20070087475A1 Method and apparatus for peeling surface protective film 失效
标题翻译：剥离表面保护膜的方法和装置
公开(公告)号：US20070087475A1
公开(公告)日：2007-04-19
申请号：US11544189
申请日：2006-10-05
申请人： Masaki Kanazawa , Minoru Ametani , Daisuke Akita , Motoi Nezu
发明人： Masaki Kanazawa , Minoru Ametani , Daisuke Akita , Motoi Nezu
IPC分类号： H01L21/00
CPC分类号： H01L21/6835 , B29C63/0013 , H01L21/67103 , H01L21/67132 , H01L21/6836 , H01L2221/68318 , H01L2221/68327 , H01L2221/6834 , H01L2221/6839 , H01L2221/68395 , Y10S438/976 , Y10S438/977
摘要： A method and an apparatus for peeling a surface protective film attached on the surface of a semiconductor wafer are provided. A heating block is set in proximity to the whole surface of the semiconductor wafer, and the whole surface protective film is heated by the heating block. Thus, the air bubbles existing between the semiconductor wafer and the surface protective film are expanded or swelled, and the adhesion between the semiconductor wafer and the surface protective film is weakened. After that, the surface protective film is peeled from the semiconductor wafer. As a result, a peel starting point can be appropriately formed and damage to the wafer can be prevented.
摘要翻译：提供了一种用于剥离附着在半导体晶片的表面上的表面保护膜的方法和装置。加热块设置在半导体晶片的整个表面附近，并且整个表面保护膜被加热块加热。因此，存在于半导体晶片和表面保护膜之间的气泡膨胀或膨胀，并且半导体晶片和表面保护膜之间的粘附力减弱。之后，从半导体晶片剥离表面保护膜。结果，可以适当地形成剥离起始点，并且可以防止对晶片的损坏。

4. 发明申请

US20110056307A1 ELECTROMAGNETIC FLOWMETER 有权
标题翻译：电磁流量计
公开(公告)号：US20110056307A1
公开(公告)日：2011-03-10
申请号：US12877266
申请日：2010-09-08
申请人： Tomoshige YAMAMOTO , Daisuke Akita , Yoshio Yamazaki , Kenji Yao
发明人： Tomoshige YAMAMOTO , Daisuke Akita , Yoshio Yamazaki , Kenji Yao
IPC分类号： G01F1/58
CPC分类号： G01F1/588 , G01F1/58 , G01F1/60
摘要： An electromagnetic flowmeter includes a measuring tube, electrodes, an exciting coil for applying, to a fluid, a time-changing magnetic field asymmetrical with respect to a plane PLN, a signal conversion unit which extracts a ∂A/∂t component, irrelevant to a fluid flow velocity, from a resultant electromotive force of an electromotive force based on the ∂A/∂t component and an electromotive force based on a v×B component originating from the flow velocity of the fluid, a flow rate output unit which removes a variation factor for a span as a coefficient applied to a magnitude V of a flow velocity of the v×B component in the resultant electromotive force, based on the extracted ∂A/∂t component, and calculates a flow rate of the fluid from a result obtained by removing the variation factor, and signal lines inclined with respect to a direction of the magnetic field in parallel with the plane PLN.
摘要翻译：电磁流量计包括测量管，电极，用于向流体施加相对于平面PLN不对称的时变磁场的激励线圈，提取与ΛA/∂t分量不相关的∂A/∂t分量的信号转换单元来自基于∂A/∂t分量的电动势的合成电动势的流体流动速度和源自流体的流速的基于av×B分量的电动势，流量输出单元，其移除基于所提取的∂A/∂t分量，跨度的变化系数作为施加到所得到的电动势中的v×B分量的流速的幅度V的系数，并且计算来自通过去除变化因子获得的结果，以及相对于与平面PLN平行的磁场方向倾斜的信号线。

5. 发明授权

US08136412B2 Electromagnetic flowmeter 有权
标题翻译：电磁流量计
公开(公告)号：US08136412B2
公开(公告)日：2012-03-20
申请号：US12877266
申请日：2010-09-08
申请人： Tomoshige Yamamoto , Daisuke Akita , Yoshio Yamazaki , Kenji Yao
发明人： Tomoshige Yamamoto , Daisuke Akita , Yoshio Yamazaki , Kenji Yao
IPC分类号： G01F1/58
CPC分类号： G01F1/588 , G01F1/58 , G01F1/60
摘要： An electromagnetic flowmeter includes a measuring tube, electrodes, an exciting coil for applying, to a fluid, a time-changing magnetic field asymmetrical with respect to a plane PLN, a signal conversion unit which extracts a ∂A/∂t component, irrelevant to a fluid flow velocity, from a resultant electromotive force of an electromotive force based on the ∂A/∂t component and an electromotive force based on a v×B component originating from the flow velocity of the fluid, a flow rate output unit which removes a variation factor for a span as a coefficient applied to a magnitude V of a flow velocity of the v×B component in the resultant electromotive force, based on the extracted ∂A/∂t component, and calculates a flow rate of the fluid from a result obtained by removing the variation factor, and signal lines inclined with respect to a direction of the magnetic field in parallel with the plane PLN.
摘要翻译：电磁流量计包括测量管，电极，用于向流体施加相对于平面PLN不对称的时变磁场的激励线圈，提取与ΛA/∂t分量不相关的∂A/∂t分量的信号转换单元来自基于∂A/∂t分量的电动势的合成电动势的流体流动速度和源自流体的流速的基于av×B分量的电动势，流量输出单元，其移除基于所提取的∂A/∂t分量，跨度的变化系数作为施加到所得到的电动势中的v×B分量的流速的幅度V的系数，并且计算来自通过去除变化因子获得的结果，以及相对于与平面PLN平行的磁场方向倾斜的信号线。

6. 发明授权

US07521384B2 Method and apparatus for peeling surface protective film 失效
标题翻译：剥离表面保护膜的方法和装置
公开(公告)号：US07521384B2
公开(公告)日：2009-04-21
申请号：US11544189
申请日：2006-10-05
申请人： Masaki Kanazawa , Minoru Ametani , Daisuke Akita , Motoi Nezu
发明人： Masaki Kanazawa , Minoru Ametani , Daisuke Akita , Motoi Nezu
IPC分类号： H01L21/46 , H01L21/30 , H01L21/78 , H01L21/00
CPC分类号： H01L21/6835 , B29C63/0013 , H01L21/67103 , H01L21/67132 , H01L21/6836 , H01L2221/68318 , H01L2221/68327 , H01L2221/6834 , H01L2221/6839 , H01L2221/68395 , Y10S438/976 , Y10S438/977
摘要： A method and an apparatus for peeling a surface protective film attached on the surface of a semiconductor wafer are provided. A heating block is set in proximity to the whole surface of the semiconductor wafer, and the whole surface protective film is heated by the heating block. Thus, the air bubbles existing between the semiconductor wafer and the surface protective film are expanded or swelled, and the adhesion between the semiconductor wafer and the surface protective film is weakened. After that, the surface protective film is peeled from the semiconductor wafer. As a result, a peel starting point can be appropriately formed and damage to the wafer can be prevented.
摘要翻译：提供了一种用于剥离附着在半导体晶片的表面上的表面保护膜的方法和装置。加热块设置在半导体晶片的整个表面附近，并且整个表面保护膜被加热块加热。因此，存在于半导体晶片和表面保护膜之间的气泡膨胀或膨胀，并且半导体晶片和表面保护膜之间的粘附力减弱。之后，从半导体晶片剥离表面保护膜。结果，可以适当地形成剥离起始点，并且可以防止对晶片的损坏。

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