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1. 发明申请

US20130126727A1 Time-of-Flight Electron Energy Analyzer 审中-公开
标题翻译：飞行时间电子能量分析仪
公开(公告)号：US20130126727A1
公开(公告)日：2013-05-23
申请号：US13389784
申请日：2010-06-29
申请人： Christopher Jozwiak , Zahid Hussain , Alessandra Lanzara , Gennadi V. Lebedev , Andreas K. Schmid , Nord C. Andresen , Jeff Graf
发明人： Christopher Jozwiak , Zahid Hussain , Alessandra Lanzara , Gennadi V. Lebedev , Andreas K. Schmid , Nord C. Andresen , Jeff Graf
IPC分类号： H01J49/44
CPC分类号： H01J49/446 , G01N23/227
摘要： A time-of-flight (TOF) photoemission electron energy analyzer includes a TOF spectrometer for measuring an energy spectrum of a beam of electrons photoemitted from a sample and a 90 degree bend bandpass filter for spatially dispersing and filtering electrons according to energy. An exchange scattering electron spin polarimeter for detecting the spin of electrons includes an entrance aperture for admitting an electron beam, a magnetizable target positionable for receiving the electron beam at an angle relative to a target surface normal vector, a pair of Helmholtz coils positioned about the target for magnetizing the target in a selected direction, and a high-speed multi-channel plate (MCP) detector facing toward the target for receiving electrons reflected from the target surface, the MCP outputting a signal corresponding to the spin dependent intensity and time of electrons' arrivals.
摘要翻译：飞行时间（TOF）光电子能量分析仪包括用于测量从样品发射的电子束的能谱的TOF光谱仪和用于根据能量空间分散和过滤电子的90度弯曲带通滤光器。用于检测电子自旋的交换散射电子自旋旋光仪包括用于允许电子束的入射孔，可定位成可相对于目标表面法线向量以一定角度接收电子束的可磁化靶;围绕目标，用于沿所选方向磁化目标;以及面向目标的高速多通道板（MCP）检测器，用于接收从目标表面反射的电子，MCP输出对应于自旋相关强度和时间的信号电子到达

2. 发明授权

US5384662A Precision optical slit for high heat load or ultra high vacuum 失效
标题翻译：精密光学狭缝，用于高热负荷或超高真空
公开(公告)号：US5384662A
公开(公告)日：1995-01-24
申请号：US90585
申请日：1993-07-12
申请人： Nord C. Andresen , Richard S. DiGennaro , Thomas L. Swain
发明人： Nord C. Andresen , Richard S. DiGennaro , Thomas L. Swain
IPC分类号： G01J3/04
CPC分类号： G01J3/04
摘要： This invention relates generally to slits used in optics that must be precisely aligned and adjusted. The optical slits of the present invention are useful in x-ray optics, x-ray beam lines, optical systems in which the entrance slit is critical for high wavelength resolution. The invention is particularly useful in ultra high vacuum systems where lubricants are difficult to use and designs which avoid the movement of metal parts against one another are important, such as monochrometers for high wavelength resolution with ultra high vacuum systems. The invention further relates to optical systems in which temperature characteristics of the slit materials is important. The present invention yet additionally relates to precision slits wherein the opposing edges of the slit must be precisely moved relative to a center line between the edges with each edge retaining its parallel orientation with respect to the other edge and/or the center line.
摘要翻译：本发明一般涉及在光学中使用的狭缝，其必须精确对准和调节。本发明的光学狭缝可用于x射线光学器件，x射线束线，其中入射狭缝对于高波长分辨率至关重要的光学系统。本发明特别适用于其中难以使用润滑剂的超高真空系统，并且避免金属部件彼此移动的设计是重要的，例如用于具有超高真空系统的高波长分辨率的单色仪。本发明还涉及其中缝隙材料的温度特性是重要的光学系统。本发明另外涉及精密狭缝，其中狭缝的相对边缘必须相对于边缘之间的中心线精确地移动，每个边缘相对于另一边缘和/或中心线保持其平行取向。

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