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    • 3. 发明授权
    • Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification
    • 在具有综合征鉴定的记忆中建立自我诊断和修复的方法和装置
    • US07644323B2
    • 2010-01-05
    • US11742567
    • 2007-04-30
    • Cheng-Wen WuRei-Fu HuangChin-Lung SuWen-Ching WuKun-Lun Luo
    • Cheng-Wen WuRei-Fu HuangChin-Lung SuWen-Ching WuKun-Lun Luo
    • G11C29/00
    • G11C29/44G11C29/4401G11C29/72
    • Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.
    • 公开了一种在具有综合征识别的记忆中的内置自诊断和修复方法和装置。 它在存储器测试期间应用故障模式识别和综合征格式结构来识别存储器中的至少一种类型的故障综合征,然后产生并输出与相应的故障综合征相关的故障综合征信息。 根据故障综合信息,该方法应用冗余分析算法,分配备用存储器元件并修复存储器中的故障单元。 综合征格式结构分别针对不良故障综合征,如有缺陷的行段和单一故障字,分别应用单故障字综合征格式,故障行段综合征格式和故障列段综合征格式, 列段和单个故障单词,所有单个故障字,故障行段和故障列段等。
    • 4. 发明申请
    • Method And Apparatus Of Build-In Self-Diagnosis And Repair In A Memory With Syndrome Identification
    • 建立自诊断和修复记忆与综合征鉴定的方法和装置
    • US20070288807A1
    • 2007-12-13
    • US11742567
    • 2007-04-30
    • Cheng-Wen WuRei-Fu HuangChin-Lung SuWen-Ching WuKun-Lun Luo
    • Cheng-Wen WuRei-Fu HuangChin-Lung SuWen-Ching WuKun-Lun Luo
    • G11C29/12
    • G11C29/44G11C29/4401G11C29/72
    • Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.
    • 公开了一种在具有综合征识别的记忆中的内置自诊断和修复方法和装置。 它在存储器测试期间应用故障模式识别和综合征格式结构来识别存储器中的至少一种类型的故障综合征,然后产生并输出与相应的故障综合征相关的故障综合征信息。 根据故障综合信息,该方法应用冗余分析算法,分配备用存储器元件并修复存储器中的故障单元。 综合征格式结构分别针对不良故障综合征,如有缺陷的行段和单一故障字,分别应用单故障字综合征格式,故障行段综合征格式和故障列段综合征格式, 列段和单个故障单词,所有单个故障字,故障行段和故障列段等。
    • 7. 发明授权
    • eFuse macro
    • eFuse宏
    • US08143902B2
    • 2012-03-27
    • US12683101
    • 2010-01-06
    • Rei-Fu HuangJin-Bin Yang
    • Rei-Fu HuangJin-Bin Yang
    • G01R31/07
    • G11C17/18H01L23/5256H01L2924/0002H01L2924/00
    • An eFuse with at least one fuse unit is provided. The fuse unit includes a common node, a sensing unit with a first input terminal and a second input terminal, at least one fuse coupled between the common node and the first input terminal of the sensing unit with a resistance, and a switching unit coupled between the common node and the second input terminal of the sensing unit. A resistance of the switching unit is equivalent to a first resistance in a normal mode and equivalent to a second resistance in a test mode, and the second resistance is higher than the first resistance. The sensing unit generates an output signal indicating whether the fuse is blown or not according to the resistances of the fuse and the switching unit.
    • 提供至少一个保险丝单元的eFuse。 保险丝单元包括公共节点,具有第一输入端和第二输入端的感测单元,耦合在公共节点与感测单元的第一输入端之间的至少一个熔丝,以及耦合在 传感单元的公共节点和第二输入端。 开关单元的电阻等于在正常模式中的第一电阻并且等于测试模式中的第二电阻,并且第二电阻高于第一电阻。 感测单元根据保险丝和开关单元的电阻产生指示熔丝是否熔断的输出信号。
    • 9. 发明申请
    • Efuse Macro
    • Efuse宏
    • US20110163758A1
    • 2011-07-07
    • US12683101
    • 2010-01-06
    • Rei-Fu HuangJin-Bin Yang
    • Rei-Fu HuangJin-Bin Yang
    • G01R31/02
    • G11C17/18H01L23/5256H01L2924/0002H01L2924/00
    • An eFuse with at least one fuse unit is provided. The fuse unit includes a common node, a sensing unit with a first input terminal and a second input terminal, at least one fuse coupled between the common node and the first input terminal of the sensing unit with a resistance, and a switching unit coupled between the common node and the second input terminal of the sensing unit. A resistance of the switching unit is equivalent to a first resistance in a normal mode and equivalent to a second resistance in a test mode, and the second resistance is higher than the first resistance. The sensing unit generates an output signal indicating whether the fuse is blown or not according to the resistances of the fuse and the switching unit.
    • 提供至少一个保险丝单元的eFuse。 保险丝单元包括公共节点,具有第一输入端和第二输入端的感测单元,耦合在公共节点与感测单元的第一输入端之间的至少一个熔丝,以及耦合在 传感单元的公共节点和第二输入端。 开关单元的电阻等于在正常模式中的第一电阻并且等于测试模式中的第二电阻,并且第二电阻高于第一电阻。 感测单元根据保险丝和开关单元的电阻产生指示熔丝是否熔断的输出信号。