会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明申请
    • TRANSMISSION LINE STRUCTURE WITH LOW CROSSTALK
    • 传动线结构与低CROSSTALK
    • US20130002375A1
    • 2013-01-03
    • US13175253
    • 2011-07-01
    • Ming-Tzong YangTung-Hsing LeeKuei-Ti Chan
    • Ming-Tzong YangTung-Hsing LeeKuei-Ti Chan
    • H01P3/08
    • H01L23/5225H01L23/5329H01L2924/0002H01L2924/00
    • A transmission line structure is disclosed. The structure includes at least one signal transmission line and a pair of ground transmission lines embedded in a first level of a dielectric layer on a substrate, wherein the pair of ground transmission lines are on both sides of the signal transmission line. A first ground layer is embedded in a second level lower than the first level of the dielectric layer and a second ground layer is embedded in a third level higher than the first level of the dielectric layer. First and second pairs of via connectors are embedded in the dielectric layer, wherein the first pair of via connectors electrically connects the pair of ground transmission lines to the first ground layer and the second pair of via connectors electrically connects the pair of ground transmission lines to the second ground layer.
    • 公开了传输线结构。 该结构包括至少一个信号传输线和嵌入在基板上的电介质层的第一层中的一对接地传输线,其中该对接地传输线位于信号传输线的两侧。 第一接地层嵌入在比电介质层的第一电平低的第二电平中,并且第二接地层嵌入在比电介质层的第一电平高的第三电平中。 第一对和第二对通孔连接器嵌入在电介质层中,其中第一对通孔连接器将一对接地传输线电连接到第一接地层,而第二对通孔连接器将一对接地传输线电连接到 第二层地层。
    • 3. 发明申请
    • SCHOTTKY DIODE STRUCTURE
    • 肖特基二极管结构
    • US20130001734A1
    • 2013-01-03
    • US13175230
    • 2011-07-01
    • Ming-Tzong YangTung-Hsing Lee
    • Ming-Tzong YangTung-Hsing Lee
    • H01L29/872
    • H01L29/872H01L29/0649H01L29/0692
    • A Schottky diode structure includes a semiconductor substrate having an anode region and a cathode region. A lightly doped region with a predetermined conductivity type is in the semiconductor substrate. A metal contact overlies the lightly doped region and corresponds to the cathode region to serve as a cathode. A metal silicide layer is beneath and electrically connected to the metal contact, wherein the metal silicide layer, directly under the metal contact, is in direct contact with the lightly doped region. A heavily doped region with the predetermined conductivity type is in the lightly doped region and corresponds to the anode region to serve as an anode.
    • 肖特基二极管结构包括具有阳极区域和阴极区域的半导体衬底。 具有预定导电类型的轻掺杂区域在半导体衬底中。 金属接触覆盖轻掺杂区域,并且对应于阴极区域以用作阴极。 金属硅化物层在金属接触下方并电连接,金属硅化物层直接在金属接触下方与轻掺杂区直接接触。 具有预定导电类型的重掺杂区域在轻掺杂区域中,并且对应于用作阳极的阳极区域。
    • 5. 发明授权
    • Semiconductor diode
    • 半导体二极管
    • US09373727B2
    • 2016-06-21
    • US13168311
    • 2011-06-24
    • Ming-Tzong YangTung-Hsing Lee
    • Ming-Tzong YangTung-Hsing Lee
    • H01L21/70H01L29/861H01L29/417H01L29/45
    • H01L29/861H01L29/417H01L29/45
    • A semiconductor diode includes a semiconductor substrate having a lightly doped region with a first conductivity type therein. A first heavily doped region with a second conductivity type opposite to the first conductivity type is in the lightly doped region. A second heavily doped region with the first conductivity type is in the lightly doped region and is in direct contact with the first heavily doped region. A first metal silicide layer is on the semiconductor substrate and is in direct contact with the first heavily doped region. A second metal silicide layer is on the semiconductor substrate and is in direct contact with the second heavily doped region. The second metal silicide layer is spaced apart from the first metal silicide layer.
    • 半导体二极管包括其中具有第一导电类型的轻掺杂区的半导体衬底。 具有与第一导电类型相反的第二导电类型的第一重掺杂区域在轻掺杂区域中。 具有第一导电类型的第二重掺杂区域在轻掺杂区域中并且与第一重掺杂区域直接接触。 第一金属硅化物层在半导体衬底上并且与第一重掺杂区域直接接触。 第二金属硅化物层在半导体衬底上并与第二重掺杂区域直接接触。 第二金属硅化物层与第一金属硅化物层间隔开。
    • 10. 发明申请
    • DUAL CONTACT ETCH STOP LAYER PROCESS
    • 双重接触蚀刻停止层工艺
    • US20090215277A1
    • 2009-08-27
    • US12037089
    • 2008-02-26
    • Tung-Hsing LeeMing-Tzong YangChing-Chung KoTien-Chang ChangYu-Tung Chang
    • Tung-Hsing LeeMing-Tzong YangChing-Chung KoTien-Chang ChangYu-Tung Chang
    • H01L21/31
    • H01L21/823807H01L21/823871H01L29/7843
    • A dual CESL process includes: (1) providing a substrate having thereon a first device region, a second device region and a shallow trench isolation (STI) region between the first and second device regions; (2) forming a first-stress imparting film with a first stress over the substrate, wherein the first-stress imparting film does not cover the second device region; and (3) forming a second-stress imparting film with a second stress over the substrate, wherein the second-stress imparting film does not cover the first device region, an overlapped boundary between the first- and second-stress imparting films is created directly above the STI region, and wherein the overlapped boundary is placed in close proximity to the second device region in order to induce the first stress to a channel region thereof in a transversal direction.
    • 双CESL工艺包括:(1)提供其上具有第一和第二器件区域之间的第一器件区域,第二器件区域和浅沟槽隔离(STI)区域的衬底; (2)在所述基板上形成具有第一应力的第一应力赋予膜,其中所述第一应力赋予膜不覆盖所述第二器件区域; 和(3)在基板上形成具有第二应力的第二应力赋予膜,其中第二应力赋予膜不覆盖第一器件区域,直接产生第一和第二施加应力膜之间的重叠边界 在STI区域之上,并且其中重叠的边界被放置成紧邻第二器件区域,以便在横向方向上引起其沟道区域的第一应力。