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    • 3. 发明授权
    • Integrated circuitry having electrical interconnects
    • 具有电互连的集成电路
    • US5650655A
    • 1997-07-22
    • US561105
    • 1995-11-21
    • Charles H. DennisonMonte Manning
    • Charles H. DennisonMonte Manning
    • H01L21/336H01L21/8244H01L27/11H01L29/786H01L29/76H01L29/94H01L31/062H01L31/113
    • H01L29/6675H01L27/11H01L27/1108H01L29/66757H01L29/78618H01L29/78624H01L29/78648H01L2924/0002Y10S257/903
    • The disclosure pertains to a bottom and top gated thin film transistor and other circuitry constructions. In the thin film transistor construction, the top gate electrode (preferably polysilicon) overlaps with the channel region, and the top gate electrode has an electrically conductive sidewall (preferably oxide). The bottom gate electrode (preferably polysilicon) has an outer surface area which includes a portion which extends outwardly beyond the top gate electrode sidewall. An electrically conductive sidewall link overlies the electrically insulated channel region sidewall and extends between the top gate sidewall and bottom gate outer surface portion to electrically interconnect the top and bottom gate electrodes. The insulated channel region sidewall is insulated by an insulating sidewall spacer. The insulating sidewall spacer partially overlaps the top gate electrode electrically conductive sidewall. More generally beyond thin film transistor constructions, two conductive layers are provided which are separated by an insulating material on a semiconductor wafer. Each has an outer sidewall. An electrically conductive sidewall link is positioned over and electrically interconnects the respective outer sidewalls of the two conductive layers. Further, a mid conductive layer is provided which is electrically isolated from and positioned between the inner and outer conductive layers. This layer has a sidewall also covered by an insulating material. The insulating material partially overlaps the outer conductive layer sidewall. The electrically conductive sidewall link is positioned over the insulating material.
    • 本公开涉及底部和顶部门控薄膜晶体管以及其它电路结构。 在薄膜晶体管结构中,顶栅电极(优选多晶硅)与沟道区重叠,顶栅电极具有导电侧壁(优选氧化物)。 底栅电极(优选多晶硅)具有包括向外延伸超过顶栅电极侧壁的部分的外表面区域。 导电侧壁连接部覆盖在电绝缘沟道区域侧壁上,并在顶部栅极侧壁和底部栅极外表面部分之间延伸,以电连接顶部和底部栅电极。 绝缘通道区域侧壁由绝缘侧壁隔离物绝缘。 绝缘侧壁间隔件部分地与顶部栅电极导电侧壁重叠。 更一般地,超过薄膜晶体管结构,提供了两个导电层,其由半导体晶片上的绝缘材料分隔开。 每个都有一个外侧壁。 导电侧壁连接件位于两个导电层的相应的外侧壁之间并电连接。 此外,提供了中间导电层,其与内导电层和外导电层电隔离并定位在其间。 该层具有也被绝缘材料覆盖的侧壁。 绝缘材料部分地与外导电层侧壁重叠。 导电侧壁连接件位于绝缘材料上方。
    • 4. 发明授权
    • Fully planarized thin film transistor (TFT) and process to fabricate same
    • 全平面化薄膜晶体管(TFT)及其制造方法
    • US5616934A
    • 1997-04-01
    • US621766
    • 1996-03-22
    • Charles H. DennisonMonte Manning
    • Charles H. DennisonMonte Manning
    • H01L21/336H01L21/8244H01L27/11H01L29/786H01L29/68H01L21/265
    • H01L29/66757H01L27/11H01L27/1108H01L29/6675H01L29/78618Y10S257/903Y10S438/964
    • The invention is directed to a thin film transistor (TFT) fabricated by using a planarized poly plug as the bottom gate for use in any integrated circuit and in particular an static random access memory (SRAM). The TFT is used in an SRAM device to form a planarized SRAM cell comprising: a pulldown transistor having a control gate and source/drain terminals; a planarized insulating layer having grooves therein, each groove providing access to an underlying conductive material; a planarized conductive plug residing inside each groove, whereby a first conductive plug forms a thin film transistor gate connecting to an to an adjacent inverter and a second conductive plug provides connection to the gate of the pulldown device; a gate dielectric overlying the first planarized conductive plug; and a patterned semiconductive layer doped such that a channel region aligns to each thin film transistor gate and a source/drain region aligns to each side of the channel region is formed.
    • 本发明涉及通过使用平面化多晶硅塞作为用于任何集成电路,特别是静态随机存取存储器(SRAM)的底栅制造的薄膜晶体管(TFT)。 TFT用于SRAM器件以形成平坦化SRAM单元,包括:具有控制栅极和源极/漏极端子的下拉晶体管; 平坦化绝缘层,其中具有凹槽,每个凹槽提供对下面的导电材料的接触; 位于每个凹槽内的平坦化导电插头,由此第一导电插塞形成连接到相邻逆变器的薄膜晶体管栅极,第二导电插头提供到下拉器件的栅极的连接; 覆盖所述第一平坦化导电插塞的栅极电介质; 以及被掺杂的图案化半导体层,使得沟道区域对齐于每个薄膜晶体管栅极,并且形成与沟道区域的每一侧对准的源极/漏极区域。