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1. 发明申请

US20060132123A1 Eddy current array probes with enhanced drive fields 审中-公开
标题翻译：具有增强驱动器字段的涡流阵列探头
公开(公告)号：US20060132123A1
公开(公告)日：2006-06-22
申请号：US11023179
申请日：2004-12-22
申请人： Changting Wang , Yuri Plotnikov , William McKnight , Shridhar Nath , Gigi Gambrell , Mottito Togo , William Hennessy , John Ertel , Shyamsunder Mandayam
发明人： Changting Wang , Yuri Plotnikov , William McKnight , Shridhar Nath , Gigi Gambrell , Mottito Togo , William Hennessy , John Ertel , Shyamsunder Mandayam
IPC分类号： G01N27/72
CPC分类号： G01N27/902
摘要： Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
摘要翻译：描述了具有增强的驱动线圈配置的几个涡流阵列探针（ECAP）。在一种布置中，ECAP包括多个EC通道和多个驱动线圈。驱动线圈中的每一个为EC通道中的相应一个提供。驱动线圈相对于相邻的驱动线圈具有交替的极性。在另一种布置中，用于检测多个扫描和取向配置中的缺陷的ECAP包括至少一个基板，布置在基板上的多个感测线圈以及包围所有感测线圈的驱动线圈。在另一种布置中，ECAP包括布置成至少两行的衬底，感测线圈和至少一个驱动线。为每对行提供一条驱动线，并设置在行之间。

2. 发明申请

US20070222439A1 EDDY CURRENT ARRAY PROBES WITH ENHANCED DRIVE FIELDS 审中-公开
标题翻译： EDDY电流阵列探头与增强型驱动器
公开(公告)号：US20070222439A1
公开(公告)日：2007-09-27
申请号：US11759604
申请日：2007-06-07
申请人： Changting Wang , Yuri Plotnikov , William McKnight , Shridhar Nath , Gigi Gambrell , Mottito Togo , William Hennessy , John Ertel , Shyamsunder Mandayam
发明人： Changting Wang , Yuri Plotnikov , William McKnight , Shridhar Nath , Gigi Gambrell , Mottito Togo , William Hennessy , John Ertel , Shyamsunder Mandayam
IPC分类号： G01N27/90 , G01N27/72
CPC分类号： G01N27/902
摘要： Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP includes a number of EC channels and a number of drive coils. Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP for detecting flaws in a number of scanning and orientation configurations includes at least one substrate, a number of sense coils arranged on the substrate(s), and a drive coil encompassing all of the sense coils. In another arrangement, an ECAP includes substrate, sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.
摘要翻译：描述了具有增强的驱动线圈配置的几个涡流阵列探针（ECAP）。在一种布置中，ECAP包括多个EC通道和多个驱动线圈。驱动线圈中的每一个为EC通道中的相应一个提供。驱动线圈相对于相邻的驱动线圈具有交替的极性。在另一种布置中，用于检测多个扫描和取向配置中的缺陷的ECAP包括至少一个基板，布置在基板上的多个感测线圈以及包围所有感测线圈的驱动线圈。在另一种布置中，ECAP包括布置成至少两行的衬底，感测线圈和至少一个驱动线。为每对行提供一条驱动线，并设置在行之间。

3. 发明申请

US20050264284A1 Omnidirectional eddy current probe and inspection system 失效
标题翻译：全向涡流探头和检测系统
公开(公告)号：US20050264284A1
公开(公告)日：2005-12-01
申请号：US10856381
申请日：2004-05-27
申请人： Changting Wang , Yuri Plotnikov , Shridhar Nath , William McKnight , Gigi Gambrell
发明人： Changting Wang , Yuri Plotnikov , Shridhar Nath , William McKnight , Gigi Gambrell
IPC分类号： G01D5/20 , G01N27/90 , G01R33/02 , G01R33/12 , G01N27/82
CPC分类号： G01N27/902 , G01N27/9033 , G01N27/904
摘要： An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
摘要翻译：全向涡流（EC）探针包括至少一个具有第一和第二感测线圈的EC通道，该第一和第二感测线圈在第一（x）和第二（y）方向上偏移并且在至少一个方向（x， y）。至少一个驱动线圈被配置为在感测线圈附近产生用于EC通道的探测场。全方位的EC检测系统包括一个包括多个EC通道和驱动线圈的全向EC阵列探针（ECAP）。每个EC通道包括具有相反极性的第一和第二感测线圈。驱动线圈具有交替极性。电气连接对相应的EC通道执行差分感测。纠正驱动线圈设置在EC通道的相应末端并产生探测场。涡流仪器连接到全向ECAP，并从EC通道接收差分感测信号。

4. 发明申请

US20060109001A1 Methods and apparatus for testing a component 有权
标题翻译：用于测试组件的方法和设备
公开(公告)号：US20060109001A1
公开(公告)日：2006-05-25
申请号：US10993467
申请日：2004-11-19
申请人： Ui Suh , Gigi Gambrell , John Ertel , William McKnight
发明人： Ui Suh , Gigi Gambrell , John Ertel , William McKnight
IPC分类号： G01N27/72
CPC分类号： G01B7/28 , G01N27/902 , G01N27/9033
摘要： A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes positioning an eddy current probe proximate to a surface of the component to generate a first position indication, positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication, and interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.
摘要翻译：一种用于检查具有包括局部最小值和局部最大值的表面轮廓的部件的方法。该方法包括将涡流探针定位在部件的表面附近以产生第一位置指示，将涡流探针定位在部件的表面附近以产生与第一位置指示不同的第二位置指示，以及在第一和第二位置指示之间插值以确定部件表面的一部分的轮廓。

5. 发明申请

US20060023961A1 Methods and apparatus for testing a component 失效
标题翻译：用于测试组件的方法和设备
公开(公告)号：US20060023961A1
公开(公告)日：2006-02-02
申请号：US10909198
申请日：2004-07-30
申请人： Ui Suh , Gigi Gambrell , John Ertel , William McKnight
发明人： Ui Suh , Gigi Gambrell , John Ertel , William McKnight
IPC分类号： G06K9/46
CPC分类号： G01N27/9013 , G01N27/9046 , G01N27/9073
摘要： A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
摘要翻译：检查元件的方法。该方法包括产生要检查的部件的扫描方案，将侧安装探针耦合到涡流检查系统，将涡流引入到部件中，测量部件中的涡流以产生多个扫描数据，以及分析所述扫描数据以生成被检测部件的至少一个图像。

6. 发明申请

US20110004452A1 METHOD FOR COMPENSATION OF RESPONSES FROM EDDY CURRENT PROBES 审中-公开
标题翻译：用于补偿EDDY电流探测器的响应方法
公开(公告)号：US20110004452A1
公开(公告)日：2011-01-06
申请号：US12810734
申请日：2007-12-31
申请人： Sanghamithra Korukonda , Sandeep Dewangan , Preeti Pisupati , William Stewart McKnight , Gigi Gambrell , Ui Suh , Changting Wang
发明人： Sanghamithra Korukonda , Sandeep Dewangan , Preeti Pisupati , William Stewart McKnight , Gigi Gambrell , Ui Suh , Changting Wang
IPC分类号： G06F17/11 , G06F17/10
CPC分类号： G01N27/904 , G01N27/9046
摘要： A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.
摘要翻译：提供了使用涡流阵列探针（ECAP）检查部件的方法。该方法包括用ECAP扫描组件的表面，与ECAP收集多个部分缺陷响应，将多个部分缺陷响应传送到处理器，将多个部分缺陷响应建模为数学函数，基于 ECAP的元件的构造中的至少一个和元件的分辨率，以及从多个部分缺陷响应产生单个最大缺陷响应。

7. 发明申请

US20100312494A1 PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTIONAL EDDY CURRENT PROBE 审中-公开
标题翻译：使用OMNI-DIRECTIONAL EDDY CURRENT PROBE测试组件的过程和设备
公开(公告)号：US20100312494A1
公开(公告)日：2010-12-09
申请号：US12810597
申请日：2007-12-28
申请人： Sanghamithra Korukonda , Sandeep Dewangan , William Stewart McKnight , Gigi Gambrell , Changting Wang , Ui Suh
发明人： Sanghamithra Korukonda , Sandeep Dewangan , William Stewart McKnight , Gigi Gambrell , Changting Wang , Ui Suh
IPC分类号： G01N27/90 , G06F19/00 , G01R35/00
CPC分类号： G01N27/9046 , G01N27/904
摘要： A method for testing a component using an eddy current array probe is provided. The method includes calibrating the eddy current array probe, collecting data from the eddy current array probe for analysis, and processing the collected data to at least one of compensate for response variations due to a detected orientation of a detected imperfection and to facilitate minimizing noise.
摘要翻译：提供了使用涡流阵列探针测试部件的方法。该方法包括校准涡流阵列探头，从涡流阵列探头收集数据用于分析，并且将收集的数据处理至少一个，以补偿由于检测到的缺陷的检测到的取向引起的响应变化，并且有助于最小化噪声。

8. 发明申请

US20070140546A1 Methods and apparatus for testing a component 失效
标题翻译：用于测试组件的方法和设备
公开(公告)号：US20070140546A1
公开(公告)日：2007-06-21
申请号：US11314513
申请日：2005-12-21
申请人： Ui Suh , Gigi Gambrell , William McKnight , Preeti Pisupati
发明人： Ui Suh , Gigi Gambrell , William McKnight , Preeti Pisupati
IPC分类号： G06K9/00 , G01B5/28
CPC分类号： G01N27/9046
摘要： A method for inspecting a component having a surface profile that includes a local minima and a local maxima. The method includes generating a raw image of a component under test utilizing an eddy current inspection system, decomposing the raw image into a plurality of images wherein each image includes a different frequency component, and reconstructing at least one final image of the component that includes frequency components that are relevant to an eddy current flaw signal.
摘要翻译：一种用于检查具有包括局部最小值和局部最大值的表面轮廓的部件的方法。该方法包括使用涡流检测系统生成待测部件的原始图像，将原始图像分解成多个图像，其中每个图像包括不同的频率分量，以及重构包括频率的分量的至少一个最终图像与涡流缺陷信号相关的部件。

9. 发明申请

US20060229833A1 Eddy current inspection method and system 失效
标题翻译：涡流检测方法及系统
公开(公告)号：US20060229833A1
公开(公告)日：2006-10-12
申请号：US11100302
申请日：2005-04-06
申请人： Preeti Pisupati , Gigi Gambrell , MT Shyamsunder , Amitabha Dutta
发明人： Preeti Pisupati , Gigi Gambrell , MT Shyamsunder , Amitabha Dutta
IPC分类号： G06F19/00
CPC分类号： G01N27/9046
摘要： An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
摘要翻译：提供了一种用于检查部件的涡流检查系统和方法。该系统包括用于感测来自该组件的涡流的涡流探针和被配置用于将涡流转换成数字信号的模数转换器。该系统还包括处理器，该处理器被配置用于从数字信号产生涡流图像并预处理图像以增强图像的质量。处理器被配置为识别显示缺陷图案的区域并且计算所识别的区域的缺陷特性参数。

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