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1. 发明申请

US20150204911A1 TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM 审中-公开
标题翻译：具有探测器和指示机构的测试系统
公开(公告)号：US20150204911A1
公开(公告)日：2015-07-23
申请号：US14672830
申请日：2015-03-30
申请人： CELADON SYSTEMS, INC.
发明人： William A. FUNK , John L. DUNKLEE , Bryan J. ROOT
IPC分类号： G01R1/073 , G01R31/26
CPC分类号： G01R1/07364 , G01R1/0466 , G01R1/073 , G01R31/26 , G01R31/2889
摘要： A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.
摘要翻译：探针装置具有在一侧具有接触图案的探针线。接触图案用于接触另一测试设备或组件（例如电路板）上的相应接触图案。探针线具有探测需要测试的设备的尖端。信号通过探针线从探针卡传输，例如通过电路板传输到其他诊断设备。探针卡与电路板的接触允许通过探针线将信号传输到另一个诊断设备。在探针卡的另一侧是连接器结构。连接器结构包括保持器，其可以允许探针卡从测试系统更换，例如允许探针卡与支架连接和断开。

2. 发明申请

US20220163562A1 PORTABLE PROBE CARD ASSEMBLY 有权
公开(公告)号：US20220163562A1
公开(公告)日：2022-05-26
申请号：US17441173
申请日：2020-03-20
申请人： CELADON SYSTEMS, INC.
发明人： William A. FUNK , Garrett TRANQUILLO , Riley KAISER
IPC分类号： G01R1/04 , G01R1/073
摘要： This disclosure relates generally to test equipment, apparatuses, and systems for a device under test, such as, but not limited to, a semiconductor device. More specifically, this disclosure relates to test equipment, apparatuses, and systems that are portable for use in atypical testing environments.

3. 发明申请

US20170285069A1 PROBE CARD WITH STRESS RELIEVING FEATURE 审中-公开
公开(公告)号：US20170285069A1
公开(公告)日：2017-10-05
申请号：US15512249
申请日：2015-09-18
申请人： CELADON SYSTEMS, INC.
发明人： John L. DUNKLEE , William A. FUNK
IPC分类号： G01R1/073 , G01R1/067 , G01R31/28 , G01R1/04
CPC分类号： G01R1/07342 , G01R1/0491 , G01R1/06705 , G01R1/07307 , G01R1/07314 , G01R31/2863
摘要： A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.

4. 发明申请

US20190011498A1 MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR DEVICES UNDER TEST 审中-公开
公开(公告)号：US20190011498A1
公开(公告)日：2019-01-10
申请号：US16066990
申请日：2016-12-28
申请人： CELADON SYSTEMS, INC.
发明人： John L. DUNKLEE , William A. FUNK , Bryan J. ROOT
IPC分类号： G01R31/28
摘要： The systems, apparatuses, and methods herein can provide a multi-site positioning mechanism suitable for long-term testing of a device(s) under test (DUT) (e.g. semiconductor wafers) across a range of temperatures with or without a controlled environment. The systems, apparatuses, and methods herein include mounting components, mechanisms, and structures that can provide excellent mechanical stability, permit relatively close working distance optics with high resolution, enable fine positioning at elevated temperature in a controlled environment with minimal thermal perturbation. The systems, apparatuses, and methods herein can be provided with modularity, for example as modular with rails and test sites that can be easily added or removed, and that can permit access to probe modules in a densely packed array.

5. 发明申请

US20190235018A1 MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR DEVICES UNDER TEST 审中-公开
公开(公告)号：US20190235018A1
公开(公告)日：2019-08-01
申请号：US16383257
申请日：2019-04-12
申请人： CELADON SYSTEMS, INC.
发明人： John L. DUNKLEE , William A. FUNK , Bryan J. ROOT
IPC分类号： G01R31/28 , B23Q1/00
CPC分类号： G01R31/2891 , B23Q1/00 , G01R31/2874 , G01R31/2875 , G01R31/2887
摘要： The systems, apparatuses, and methods herein can provide a multi-site positioning mechanism suitable for long-term testing of a device(s) under test (DUT) (e.g. semiconductor wafers) across a range of temperatures with or without a controlled environment. The systems, apparatuses, and methods herein include mounting components, mechanisms, and structures that can provide excellent mechanical stability, permit relatively close working distance optics with high resolution, enable fine positioning at elevated temperature in a controlled environment with minimal thermal perturbation. The systems, apparatuses, and methods herein can be provided with modularity, for example as modular with rails and test sites that can be easily added or removed, and that can permit access to probe modules in a densely packed array.

6. 发明申请

US20190033344A1 MAGNET EXTENSION 审中-公开
公开(公告)号：US20190033344A1
公开(公告)日：2019-01-31
申请号：US16047091
申请日：2018-07-27
申请人： CELADON SYSTEMS, INC.
发明人： William A. FUNK , Bryan J. ROOT
IPC分类号： G01R1/07 , G01R1/073 , G01R31/28
摘要： A magnet extension, magnetic test assembly, and probe card assembly are disclosed. The magnet extension includes a magnet having a first end and a second end, the first end of the magnet being geometrically configured to provide a selected magnetic field. A resilient member is disposed around the magnet between the first end and the second end. A retaining member is disposed between the first end and the second end. The retaining member surrounds at least a portion of the resilient member.

7. 发明申请

US20200341055A1 MODULAR RAIL SYSTEMS, RAIL SYSTEMS, MECHANISMS, AND EQUIPMENT FOR DEVICES UNDER TEST 审中-公开
公开(公告)号：US20200341055A1
公开(公告)日：2020-10-29
申请号：US16847111
申请日：2020-04-13
申请人： CELADON SYSTEMS, INC.
发明人： John L. DUNKLEE , William A. FUNK , Bryan J. ROOT
IPC分类号： G01R31/28 , B23Q1/00
摘要： The systems, apparatuses, and methods herein can provide a multi-site positioning mechanism suitable for long-term testing of a device(s) under test (DUT) (e.g. semiconductor wafers) across a range of temperatures with or without a controlled environment. The systems, apparatuses, and methods herein include mounting components, mechanisms, and structures that can provide excellent mechanical stability, permit relatively close working distance optics with high resolution, enable fine positioning at elevated temperature in a controlled environment with minimal thermal perturbation. The systems, apparatuses, and methods herein can be provided with modularity, for example as modular with rails and test sites that can be easily added or removed, and that can permit access to probe modules in a densely packed array.

8. 发明申请

US20180024165A1 TEST SYSTEMS WITH A PROBE APPARATUS AND INDEX MECHANISM 审中-公开
公开(公告)号：US20180024165A1
公开(公告)日：2018-01-25
申请号：US15670722
申请日：2017-08-07
申请人： CELADON SYSTEMS, INC.
发明人： William A. FUNK , John L. DUNKLEE , Bryan J. ROOT
IPC分类号： G01R1/073 , G01R1/04 , G01R31/26 , G01R31/28
CPC分类号： G01R1/07364 , G01R1/0466 , G01R1/073 , G01R31/26 , G01R31/2889
摘要： A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through the probe wires from the probe card, for example, through a circuit board to other diagnostic equipment. The contact of the probe card with the circuit board allows signals to be transferred through the probe wires to the other diagnostic equipment. On another side of the probe card is a connector structure. The connector structure includes a retainer that can allow the probe card to be replaced from a test system, such as allowing it to be connected and disconnected from a holder.

9. 发明申请

US20160320428A1 TEST APPARATUS HAVING A PROBE CORE WITH A LATCH MECHANISM 审中-公开
标题翻译：具有拉锁机构的探头芯的测试装置
公开(公告)号：US20160320428A1
公开(公告)日：2016-11-03
申请号：US15108237
申请日：2014-12-31
申请人： CELADON SYSTEMS, INC.
发明人： John L. DUNKLEE , William A. FUNK , Bryan J. ROOT
IPC分类号： G01R1/067 , G01R31/28
CPC分类号： G01R1/06705 , G01R31/2863
摘要： A latch assembly that can lock and unlock a probe core with respect to a circuit board is provided. The latch assembly can engage with the probe core to align the probe core with respect to a circuit board, and press down the probe core against the circuit board by rotating to lock the probe core with the circuit board. An installation tool is provided to grip or release the probe core to/from a latch assembly or a probe core carrier. The installation tool can align with the probe core and/or the latch assembly to lock and unlock the probe core with respect to a circuit board.
摘要翻译：提供了能够相对于电路板锁定和解锁探针芯的闩锁组件。闩锁组件可以与探针芯接合，以使探针芯相对于电路板对准，并且通过旋转将探针芯压靠在电路板上，以将探针芯与电路板锁定。提供安装工具以将探针芯夹持到/从闩锁组件或探针芯托架上释放。安装工具可以与探针芯和/或闩锁组件对准，以相对于电路板锁定和解锁探针芯。

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