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1. 发明授权

US5221895A Probe with microstrip transmission lines 失效
标题翻译：探头带微带传输线
公开(公告)号：US5221895A
公开(公告)日：1993-06-22
申请号：US811855
申请日：1991-12-23
申请人： Bozidar Janko , Valdis E. Garuts , J. Lynn Saunders
发明人： Bozidar Janko , Valdis E. Garuts , J. Lynn Saunders
IPC分类号： G01R1/073
CPC分类号： G01R1/07357
摘要： A probe for testing integrated circuits includes a stiff elastic substrate including a conductive plane, the substrate having a major portion with fingers projecting therefrom in cantilever fashion. A layer of dielectric material is adhered to the substrate and has a main surface remote from the substrate. A plurality of conductor runs are adhered to the layer of dielectric material at the main surface thereof. The conductor runs extend over at least some of the fingers and are configured to form transmission lines when the conductive plane is connected to a reference potential level.
摘要翻译：用于测试集成电路的探针包括刚性弹性衬底，其包括导电平面，该衬底具有主要部分，其中手指以悬臂方式突出。一层电介质材料粘附在基片上并具有远离基底的主表面。多个导电体在其主表面附着在电介质材料层上。导体延伸超过至少一些指状物，并且被配置为当导电平面连接到参考电位电平时形成传输线。

2. 发明授权

US06437821B1 Harmonic measurement of blockiness in video signals 失效
标题翻译：视频信号中块状度的谐波测量
公开(公告)号：US06437821B1
公开(公告)日：2002-08-20
申请号：US09469927
申请日：1999-12-22
申请人： Bozidar Janko , John Raitz
发明人： Bozidar Janko , John Raitz
IPC分类号： H04N1700
CPC分类号： H04N19/527 , H04N19/86
摘要： A method of measuring blockiness in a video signal generates a power spectrum for a video field of the video signal. The largest peaks of the power spectrum at the higher frequency end of the power spectrum are initially selected and a common frequency interval between peaks is determined. The contribution to the amplitude of peaks at the common frequency interval by peaks at other than the common frequency interval are subtracted from the amplitude of the peaks at the common frequency interval. The average of the corrected amplitudes of the peaks at the common frequency interval is obtained and normalized as a blockiness metric for the video signal.
摘要翻译：测量视频信号中的块状度的方法产生视频信号的视频场的功率谱。最初选择在功率谱的较高频率端的功率谱的最大峰，并确定峰之间的公共频率间隔。通过在公共频率间隔以外的峰值对共同频率间隔处的峰值的幅度的贡献从公共频率间隔的峰值的幅度中减去。获得在公共频率间隔处的峰值的校正幅度的平均值，并将其归一化为视频信号的块性度量。

3. 发明授权

US5202622A Adapter and test fixture for an integrated circuit device package 失效
标题翻译：用于集成电路器件封装的适配器和测试夹具
公开(公告)号：US5202622A
公开(公告)日：1993-04-13
申请号：US720072
申请日：1991-06-24
申请人： Paul A. Cole , Bozidar Janko , Richard G. Chambers , Wolfgang H. Herr , Douglas W. Trobough , Peter M. Compton
发明人： Paul A. Cole , Bozidar Janko , Richard G. Chambers , Wolfgang H. Herr , Douglas W. Trobough , Peter M. Compton
IPC分类号： G01R1/04 , H05K1/00 , H05K1/14
CPC分类号： G01R1/0433 , H05K1/0393 , H05K1/141
摘要： A test fixture for a high pin count surface mounted IC device has a test head assembly connected to an adapter having electrically conductive elements that couple the output of the IC device to test points on the test head assembly. The test points are coupled to conductive pads on the test head assembly via conductive runs. The test head assembly conductive pads mate with conductive pad formed in the electrically conductive elements of the adapter. The conductive elements engage leads on the IC device providing conductive paths between the IC leads an the test points on the test head assembly. The test fixture is secured to the IC device by friction forces between the periphery of the IC device and the inner surface of the adapter. The test fixture or the adapter is usable as a low profile chip carrier by inverting the fixture or adapter and as a circuit board interconnect.
摘要翻译：用于高引脚数表面安装IC器件的测试夹具具有连接到具有将IC器件的输出耦合到测试头组件上的测试点的导电元件的适配器的测试头组件。测试点通过导电连接耦合到测试头组件上的导电焊盘。测试头组件导电焊盘与形成在适配器的导电元件中的导电焊盘配合。导电元件接合IC器件上的引线，在IC引线之间提供测试头组件上的测试点之间的导电路径。测试夹具通过IC器件的周边和适配器的内表面之间的摩擦力固定到IC器件。测试夹具或适配器可用作通过倒置夹具或适配器以及作为电路板互连的低调芯片载体。

4. 发明授权

US4963821A Probe and method for testing a populated circuit board 失效
标题翻译：用于测试电路板的探头和方法
公开(公告)号：US4963821A
公开(公告)日：1990-10-16
申请号：US338786
申请日：1989-04-14
申请人： Bozidar Janko , Zoran O. Sekulic , Mark F. Bitetto
发明人： Bozidar Janko , Zoran O. Sekulic , Mark F. Bitetto
IPC分类号： G01R1/073
CPC分类号： G01R1/07307
摘要： A probe includes a flexible sheet of dielectric material having an opening therein sized and shaped to receive an electronic component mounted on a support member at a major surface thereof, a contact pad exposed at a first main face of the sheet and adjacent the opening therein, and a conductor connecting the contact pad to a terminal of the probe. The probe is positioned with its first main face in confronting relationship with the major surface of the support member and with the opening in the sheet in registration with the electronic component, and pressure is applied to the flexible sheet to bring the contact pad into contact with the test point.
摘要翻译：探针包括具有开口的柔性片材，其中具有开口，其尺寸和形状适于容纳安装在其主表面上的支撑构件上的电子部件，在片材的第一主面处暴露并邻近其中的开口的接触焊盘，以及将接触垫连接到探针的端子的导体。探针被定位成使其第一主面与支撑构件的主表面面对关系，并且片材中的开口与电子部件对准，并且将压力施加到柔性片以使接触垫与测试点。

5. 发明授权

US4207492A Slow-wave high frequency deflection structure 失效
标题翻译：慢波高频偏转结构
公开(公告)号：US4207492A
公开(公告)日：1980-06-10
申请号：US931656
申请日：1978-08-07
申请人： William H. Tomison , Bozidar Janko , Myron A. Bostwick, Jr. , Aris Silzars
发明人： William H. Tomison , Bozidar Janko , Myron A. Bostwick, Jr. , Aris Silzars
IPC分类号： H01J23/24 , H01J29/70 , H01J23/16 , H01J29/96
CPC分类号： H01J29/708 , H01J23/24
摘要： An electron beam deflection structure for a high frequency cathode-ray tube incorporates a meanderline slow wave circuit that is supported directly by the same glass rods used to support other portions of the CRT's beam forming and deflection system. To accomplish this, elongate loops that serially interconnect a plurality of deflection plate segments are bent away from the plane of the segments (and the beam axis) and joined by integral support strips to the rods. The elimination of a separate support structure for the deflectors greatly reduces manufacturing costs.
摘要翻译：用于高频阴极射线管的电子束偏转结构包括曲折线慢波电路，其直接由用于支撑CRT波束形成和偏转系统的其它部分的相同玻璃棒支撑。为了实现这一点，将多个偏转板段串联连接的细长的环路弯曲远离区段的平面（和梁的轴线），并通过一体的支撑条连接到杆上。消除偏转器的单独的支撑结构大大降低了制造成本。

6. 发明授权

US07061920B2 Streaming media quality analyzer system 有权
公开(公告)号：US07061920B2
公开(公告)日：2006-06-13
申请号：US09836969
申请日：2001-04-17
申请人： Bozidar Janko , Kevin M. Ferguson , Gale L. Straney , George M. Williams
发明人： Bozidar Janko , Kevin M. Ferguson , Gale L. Straney , George M. Williams
IPC分类号： H04L12/28
CPC分类号： H04L65/4092 , H04L29/06 , H04L29/06027 , H04L43/50 , H04L65/80 , H04L67/00 , H04L69/329 , H04L69/40 , H04N17/004 , H04N21/2407 , H04N21/44209 , H04N21/6377 , H04N21/658
摘要： A streaming media quality analyzer system compares original streaming media from a source, or original packetized streaming media from the source, with a reconstructed packetized streaming media representing the packetized streaming media as received over a network in a connectionless manner at a remote site. At the remote site the received packetized streaming media is analyzed to determine time of arrival of the packets including identification of missing packets. The analysis results are transmitted over the network to a measurement site and used to reconstruct the received packetized streaming media from the original packetized streaming media. The reconstructed packetized streaming media is then analyzed to determine the quality of the packetized streaming media received at the remote site.

7. 发明授权

US4950981A Apparatus for testing a circuit board 失效
标题翻译：电路板测试装置
公开(公告)号：US4950981A
公开(公告)日：1990-08-21
申请号：US338787
申请日：1989-04-14
申请人： Bozidar Janko
发明人： Bozidar Janko
IPC分类号： G01R1/073
CPC分类号： G01R1/07307
摘要： A probe for testing a circuit board having a plurality of test points distributed in a predetermined pattern over a main surface of the board comprises a locating member having a plurality of passages therein, the passages being distributed in a pattern corresponding substantially to the predetermined pattern. Probe elements extend in the passages respectively, the probe elements being movable independently of one another in the respective passages. Flexible conductors are connected to the probe elements. When the locating member is in confronting relationship with the main surface of the circuit board and the passages are in register with the test points and pressure is applied to the probe elements, the probe elements are brought into pressure contact with the test points.
摘要翻译：用于测试具有在板的主表面上以预定图案分布的多个测试点的电路板的探针包括其中具有多个通道的定位构件，所述通道以基本上对应于预定图案的图案分布。探针元件分别在通道中延伸，探针元件可在相应通道中彼此独立地移动。柔性导体连接到探头元件。当定位构件与电路板的主表面面对关系时，通道与测试点对准，并且对探针元件施加压力，探针元件与测试点压力接触。

8. 发明授权

US4188563A Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens 失效
标题翻译：具有电子透镜系统的阴极射线管，该电子透镜系统包括无网格扫描扩张柱偏转加速透镜
公开(公告)号：US4188563A
公开(公告)日：1980-02-12
申请号：US938607
申请日：1978-08-31
申请人： Bozidar Janko
发明人： Bozidar Janko
IPC分类号： H01J29/62 , H01J29/74 , H01J29/80 , H01J31/18 , H01J29/56
CPC分类号： H01J31/18 , H01J29/62 , H01J29/803
摘要： A cathode ray tube includes first and second electrostatic quadrupole lens between the electron gun and the vertical deflection plates to properly focus the electron beam before it enters the vertical deflection plates. A third electrostatic quadrupole lens is located between the vertical deflection plates and the horizontal deflection plates to enhance the angle of deflection as well as to properly focus the electron beam as it moves from the vertical deflection plates into the horizontal deflection plates. A meshless scan expansion lens follows the horizontal deflection plates and is formed of aligned tubular members having interdigitated sections thereby forming a fourth quadrupole lens which accelerates the electron beam and expands it prior to being impinged onto the fluorescent screen.
摘要翻译：阴极射线管包括电子枪和垂直偏转板之间的第一和第二静电四极透镜，以便在电子束进入垂直偏转板之前使其适当地聚焦。第三静电四极透镜位于垂直偏转板和水平偏转板之间，以增强偏转角度，以及当电子束从垂直偏转板移动到水平偏转板中时，适当地聚焦电子束。无网格扫描扩展透镜遵循水平偏转板，并且由具有交叉部分的对准管状部件形成，从而形成第四四极透镜，其加速电子束并且在撞击到荧光屏上之前将其扩展。

9. 发明授权

US4137479A Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens 失效
标题翻译：具有电子透镜系统的阴极射线管，该电子透镜系统包括无网格扫描扩张柱偏转加速透镜
公开(公告)号：US4137479A
公开(公告)日：1979-01-30
申请号：US757425
申请日：1977-01-06
申请人： Bozidar Janko
发明人： Bozidar Janko
IPC分类号： H01J29/62 , H01J29/74 , H01J29/80 , H01J31/18 , H01J29/70
CPC分类号： H01J31/18 , H01J29/62 , H01J29/803
摘要： A cathode ray tube includes first and second electrostatic quadrupole lens between the electron gun and the vertical deflection plates to properly focus the electron beam before it enters the vertical deflection plates. A third electrostatic quadrupole lens is located between the vertical deflection plates and the horizontal deflection plates to enhance the angle of deflection as well as to properly focus the electron beam as it moves from the vertical deflection plates into the horizontal deflection plates. A meshless scan expansion lens follows the horizontal deflection plates and is formed of aligned tubular members having interdigitated sections thereby forming a fourth quadrupole lens which accelerates the electron beam and expands it prior to being impinged onto the fluorescent screen.
摘要翻译：阴极射线管包括电子枪和垂直偏转板之间的第一和第二静电四极透镜，以便在电子束进入垂直偏转板之前使其适当地聚焦。第三静电四极透镜位于垂直偏转板和水平偏转板之间，以增强偏转角度，以及当电子束从垂直偏转板移动到水平偏转板中时，适当地聚焦电子束。无网格扫描扩展透镜遵循水平偏转板，并且由具有交叉部分的对准管状部件形成，从而形成第四四极透镜，其加速电子束并且在撞击到荧光屏上之前将其扩展。

10. 发明授权

US06690840B1 Image alignment with global translation and linear stretch 失效
标题翻译：图像对齐与全局翻译和线性拉伸
公开(公告)号：US06690840B1
公开(公告)日：2004-02-10
申请号：US09499886
申请日：2000-02-08
申请人： Bozidar Janko , Shane Ching-Feng Hu
发明人： Bozidar Janko , Shane Ching-Feng Hu
IPC分类号： G06K932
CPC分类号： G06T3/00 , G06T7/32
摘要： A technique for image alignment with global translation and linear stretch determines translation parameters for three corresponding linearly displaced blocks in a reference image and a corresponding distorted test image. From the differences between the translation parameters for the three blocks the presence of stretch is detected and, if detected, a stretch factor is estimated. The estimated stretch factor is used as a starting point to stretch the reference image to overlap the distorted test image as a refinement process. The resulting refined stretch factor is then used in a reverse stretch process to shrink the distorted test image, and the distorted test image is then aligned with the reference image to obtain picture quality metrics.
摘要翻译：用于具有全局平移和线性拉伸的图像对准的技术确定参考图像中的三个对应的线性位移块的平移参数和相应的失真测试图像。根据三个块的平移参数之间的差异，检测到拉伸的存在，并且如果检测到的话，估计拉伸因子。使用估计的拉伸因子作为起始点来拉伸参考图像以与失真的测试图像重叠，作为细化过程。然后将所得到的精细拉伸因子用于反向拉伸过程以收缩失真的测试图像，然后将失真的测试图像与参考图像对准以获得图像质量度量。

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