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    • 1. 发明授权
    • Integrated circuit with a reprogrammable nonvolatile switch for selectively connecting a source for a signal to a circuit
    • 具有可再编程非易失性开关的集成电路,用于选择性地将信号源连接到电路
    • US06756632B1
    • 2004-06-29
    • US10641609
    • 2003-08-15
    • Bomy ChenDouglas LeeJack Edward FrayerKai Man Yue
    • Bomy ChenDouglas LeeJack Edward FrayerKai Man Yue
    • H01L29788
    • H03K19/17748G11C16/0425H01L27/115H01L29/7885H03K19/1778
    • A nonvolatile reprogrammable switch for use in a PLD or FPGA has a nonvolatile memory cell connected to the gate of an MOS transistor with the terminals of the MOS transistor connected to the source of the signal and to the circuit. The nonvolatile memory cell is of a split gate type having a floating gate positioned over a first portion of the channel and a control gate positioned over a second portion of the channel with electrons being injected onto the floating gate by hot electron injection mechanism. The nonvolatile memory cell is erased by the action of the electrons from the floating gate being tunneled through Fowler-Nordheim tunneling onto the control gate, which is adjacent to the second region. As a result, no high voltage is ever applied to the second region during program or erase. Thus, the nonvolatile memory cell with the second region can be connected directly to the gate of the MOS transistor, which together therewith forms a nonvolatile reprogrammable switch.
    • 用于PLD或FPGA的非易失性可重新编程开关具有连接到MOS晶体管的栅极的非易失性存储单元,MOS晶体管的端子连接到信号源和电路。 非易失性存储单元是具有位于通道的第一部分上方的浮动栅极的分离栅极型,以及位于通道的第二部分上方的控制栅极,其中电子通过热电子注入机制注入浮置栅极。 非易失性存储单元被来自浮动栅极的电子的作用擦除,通过Fowler-Nordheim隧穿隧道穿过与第二区域相邻的控制栅极。 因此,在编程或擦除期间,不会对第二区域施加高电压。 因此,具有第二区域的非易失性存储单元可以直接连接到MOS晶体管的栅极,其一起形成非易失性可编程开关。
    • 2. 发明授权
    • Word line voltage boosting circuit and a memory array incorporating same
    • US07403418B2
    • 2008-07-22
    • US11241582
    • 2005-09-30
    • Ya-Fen LinElbert LinHieu Van TranJack Edward FrayerBomy Chen
    • Ya-Fen LinElbert LinHieu Van TranJack Edward FrayerBomy Chen
    • G11C11/34
    • G11C8/08G11C16/08
    • A first embodiment of a word line voltage boosting circuit for use with an array of non-volatile memory cells has a capacitor, having two ends, connected to the word line. One end of the capacitor is electrically connected to the word line. The other end of the capacitor is electrically connected to a first voltage source. The word line is also connected through a switch to a second source voltage source. A sequencing circuit activates the switch such that the word line is connected to the second voltage source, and the other end of the capacitor is not connected to the first voltage source. Then the sequencing circuit causes the switch to disconnect the word line from the second voltage source, and connect the second end of the capacitor to the first voltage source. The alternate switching of the connection boosts the voltage on the word line. In a second embodiment, a first word line is electrically connected to a first switch to a first voltage source. An adjacent word line, capacitively coupled to the first word line, is electrically connected to a second switch to a second voltage source. A sequencing circuit activates the first switch and the second switch such that the first word line is connected to the first voltage source, and the second word line is disconnected from the second voltage source. Then the sequencing circuit causes the first switch to disconnect the first word line from the first voltage source, and causes the second word line to be electrically connected to the second voltage source. The alternate switching of the connection boosts the voltage on the first word line, caused by its capacitive coupling to the second word line. A boosted voltage on the word line may be used to improve cycling and yield, where the memory cells of the array are of the floating gate type and erase through the mechanism of Fowler-Nordheim tunneling from the floating gate to a control gate which is connected to the word line.
    • 6. 发明授权
    • Data encoder and decoder using memory-specific parity-check matrix
    • 数据编码器和解码器使用特定于存储器的奇偶校验矩阵
    • US08954822B2
    • 2015-02-10
    • US13679970
    • 2012-11-16
    • Jack Edward FrayerAaron K. Olbrich
    • Jack Edward FrayerAaron K. Olbrich
    • G11C29/00H03M13/13G06F11/10
    • H03M13/13G06F11/1012H03M13/1102H03M13/152H03M13/2906H03M13/2948H03M13/356
    • An error control system uses an error control code that corresponds to an error density location profile of a storage medium. The system includes an encoder configured to produce one or more codewords from data using an error control code generator matrix corresponding to the error density location profile of the storage medium. The system also includes a decoder configured to produce decoded data from one or more codewords using an error control code parity-check matrix corresponding to the error density location profile of the storage medium, where columns of the parity-check matrix are associated with corresponding data bits of the storage medium, rows of the parity-check matrix are associated with check bits, and each matrix element of the parity-check matrix having a predefined value indicates a connection between a particular data bit and a particular check bit.
    • 错误控制系统使用对应于存储介质的错误密度位置简档的错误控制代码。 该系统包括编码器,其被配置为使用与存储介质的误差密度位置分布相对应的误差控制码发生器矩阵从数据产生一个或多个码字。 该系统还包括解码器,其被配置为使用对应于存储介质的误差密度位置简档的误差控制码奇偶校验矩阵从一个或多个码字产生解码数据,其中奇偶校验矩阵的列与相应的数据相关联 存储介质的位,奇偶校验矩阵的行与校验位相关联,并且具有预定义值的奇偶校验矩阵的每个矩阵元素指示特定数据位和特定校验位之间的连接。