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    • 8. 发明授权
    • Projection exposure method and projection exposure system therefor
    • 投影曝光方法和投影曝光系统
    • US08248578B2
    • 2012-08-21
    • US12410640
    • 2009-03-25
    • Julian KallerToralf Gruner
    • Julian KallerToralf Gruner
    • G03B27/52
    • G03F7/70933G03F7/70191G03F7/70575G03F7/70941
    • In a projection exposure method, primary radiation having a center wavelength λ is generated and guided through an illumination system along an illumination path and through a projection system along a projection path. The center wavelength is varied within a wavelength variation range Δλ having a lower limit λMIN≦λ and an upper limit λMAX≧λ. A specific absorption coefficient k(λ) of at least one gaseous absorbent species selected from the group consisting of oxygen (O2), ozone (O3) and water vapor (H2O) present in at least one gas-filled space along at least one of the illumination path and the projection path varies between a minimum absorption coefficient kMIN and a maximum absorption coefficient kMAX within the wavelength variation range such that an absorption ratio (kMAX/kMIN) exceeds 10. A concentration of the absorbent species within the gas-filled space is controlled such that an overall absorption variation effected by the absorbent species for all rays running along differing ray paths towards the image field is maintained below a predetermined absorption variation threshold value.
    • 在投影曝光方法中,产生具有中心波长λ的一次辐射并沿着照明路径通过照明系统并沿着投影路径通过投影系统。 中心波长在具有下限λMIN≦̸λ和上限λMAX≥λ的波长变化范围&Dgr;λ内变化。 至少一种选自氧(O 2),臭氧(O 3)和水蒸汽(H 2 O)的气体吸收物质的比吸收系数k(λ)存在于至少一个气体填充空间中, 照射路径和投影路径在波长变化范围内的最小吸收系数kMIN和最大吸收系数kMAX之间变化,使得吸收比(kMAX / kMIN)超过10。气体填充空间内的吸收物质的浓度 被控制为使得沿着沿着不同光线路朝着图像场行进的所有射线的吸收物质的整体吸收变化保持在预定吸收变化阈值以下。
    • 9. 发明授权
    • Apparatus for scattered light inspection of optical elements
    • 用于光学元件的散射光检查的装置
    • US07443500B2
    • 2008-10-28
    • US10886717
    • 2004-07-09
    • Julian Kaller
    • Julian Kaller
    • G01N21/00
    • G01M11/025G01M11/0242
    • An apparatus for scattered light inspection of optical elements, having a light-generating unit (2) for generating light that is irradiated onto the optical element (9) respectively to be inspected, and a detector (4) for detecting scattered light (14) that is emitted by the optical element during irradiation. At least a portion of the components (2 to 8, 12) of the inspection apparatus are arranged on or in a housing/holding unit (1) that is dimensioned such that it can be held by a reticle holder of a lithography exposure machine, or all the components of the inspection apparatus are arranged on or in a common housing/holding unit that is portable and/or mobile. The apparatus may be used, e.g., for scattered light inspection of the surface of a lens, closest to the field, of a projection objective of a microlithography projection exposure machine.
    • 一种用于光学元件的散射光检查的装置,具有用于产生照射到要检查的光学元件(9)上的光的发光单元(2)和用于检测散射光的检测器(4) 在照射期间由光学元件发射。 检查装置的部件(2至8,12)的至少一部分布置在外壳/保持单元(1)上或外壳/保持单元(1)中,外壳/保持单元(1)的尺寸使得其可被光刻曝光机的掩模版保持器保持, 或者检查装置的所有部件被布置在便携式和/或移动式的公共外壳/保持单元上或其中。 该装置可以用于例如微光投影曝光机的投影物镜的最靠近场的透镜的表面的散射光检查。
    • 10. 发明申请
    • Apparatus for scattered light inspection of optical elements
    • 用于光学元件的散射光检查的装置
    • US20050046832A1
    • 2005-03-03
    • US10886717
    • 2004-07-09
    • Julian Kaller
    • Julian Kaller
    • G01M11/02G01N21/88
    • G01M11/025G01M11/0242
    • An apparatus for scattered light inspection of optical elements, having a light-generating unit (2) for generating light that is irradiated onto the optical element (9) respectively to be inspected, and a detector (4) for detecting scattered light (14) that is emitted by the optical element during irradiation. At least a portion of the components (2 to 8, 12) of the inspection apparatus are arranged on or in a housing/holding unit (1) that is dimensioned such that it can be held by a reticule holder of a lithography exposure machine, or all the components of the inspection apparatus are arranged on or in a common housing/holding unit that is portable and/or mobile. The apparatus may be used, e.g., for scattered light inspection of the surface of a lens, closest to the field, of a projection objective of a microlithography projection exposure machine.
    • 一种用于光学元件的散射光检查的装置,具有用于产生照射到要检查的光学元件(9)上的光的发光单元(2)和用于检测散射光的检测器(4) 在照射期间由光学元件发射。 检查装置的部件(2至8,12)的至少一部分布置在外壳/保持单元(1)上或外壳/保持单元(1)中,外壳/保持单元(1)的尺寸使得其可以由光刻曝光机的网状保持器保持, 或者检查装置的所有部件被布置在便携式和/或移动式的公共外壳/保持单元上或其中。 该装置可以用于例如微光投影曝光机的投影物镜的最靠近场的透镜的表面的散射光检查。