专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08354855B2 Carbon nanotube columns and methods of making and using carbon nanotube columns as probes 有权
标题翻译：碳纳米管柱及其制备和使用碳纳米管柱作为探针的方法
公开(公告)号：US08354855B2
公开(公告)日：2013-01-15
申请号：US12632428
申请日：2009-12-07
申请人： Benjamin N. Eldridge , Treliant Fang , Gaetan L. Mathieu , Onnik Yaglioglu
发明人： Benjamin N. Eldridge , Treliant Fang , Gaetan L. Mathieu , Onnik Yaglioglu
IPC分类号： G01R31/00 , G01R31/20 , G01R1/067
CPC分类号： B82Y40/00 , B82Y10/00 , B82Y30/00 , C01B32/16 , C01B2202/08 , G01R1/06755 , G01R3/00 , Y10T29/49117
摘要： Carbon nanotube columns each comprising carbon nanotubes can be utilized as electrically conductive contact probes. The columns can be grown, and parameters of a process for growing the columns can be varied while the columns grow to vary mechanical characteristics of the columns along the growth length of the columns. Metal can then be deposited inside and/or on the outside of the columns, which can enhance the electrical conductivity of the columns. The metalized columns can be coupled to terminals of a wiring substrate. Contact tips can be formed at or attached to ends of the columns. The wiring substrate can be combined with other electronic components to form an electrical apparatus in which the carbon nanotube columns can function as contact probes.
摘要翻译：每个包含碳纳米管的碳纳米管柱可用作导电接触探针。柱可以生长，并且用于生长柱的方法的参数可以变化，同时柱生长以改变柱沿着生长长度的机械特性。然后可以将金属沉积在柱的内部和/或外部，这可以增强柱的导电性。金属化柱可以连接到布线基板的端子。接触尖端可以形成在柱或端附近。布线基板可以与其他电子部件组合以形成其中碳纳米管柱可用作接触探针的电气设备。

2. 发明申请

US20100083489A1 CARBON NANOTUBE COLUMNS AND METHODS OF MAKING AND USING CARBON NANOTUBE COLUMNS AS PROBES 有权
标题翻译：碳纳米管柱和制备和使用碳纳米管柱作为探针的方法
公开(公告)号：US20100083489A1
公开(公告)日：2010-04-08
申请号：US12632428
申请日：2009-12-07
申请人： Benjamin N. Eldridge , Treliant Fang , Gaetan L. Mathieu , Onnik Yaglioglu
发明人： Benjamin N. Eldridge , Treliant Fang , Gaetan L. Mathieu , Onnik Yaglioglu
IPC分类号： H01R43/00 , B05D5/12 , C23C14/34 , G01R31/02
CPC分类号： B82Y40/00 , B82Y10/00 , B82Y30/00 , C01B32/16 , C01B2202/08 , G01R1/06755 , G01R3/00 , Y10T29/49117
摘要： Carbon nanotube columns each comprising carbon nanotubes can be utilized as electrically conductive contact probes. The columns can be grown, and parameters of a process for growing the columns can be varied while the columns grow to vary mechanical characteristics of the columns along the growth length of the columns. Metal can then be deposited inside and/or on the outside of the columns, which can enhance the electrical conductivity of the columns. The metalized columns can be coupled to terminals of a wiring substrate. Contact tips can be formed at or attached to ends of the columns. The wiring substrate can be combined with other electronic components to form an electrical apparatus in which the carbon nanotube columns can function as contact probes.
摘要翻译：每个包含碳纳米管的碳纳米管柱可用作导电接触探针。柱可以生长，并且用于生长柱的方法的参数可以变化，同时柱生长以改变柱沿着生长长度的机械特性。然后可以将金属沉积在柱的内部和/或外部，这可以增强柱的导电性。金属化柱可以连接到布线基板的端子。接触尖端可以形成在柱或端附近。布线基板可以与其他电子部件组合以形成其中碳纳米管柱可用作接触探针的电气设备。

3. 发明授权

US06840374B2 Apparatus and method for cleaning test probes 失效
标题翻译：测试探针清洗装置及方法
公开(公告)号：US06840374B2
公开(公告)日：2005-01-11
申请号：US10050908
申请日：2002-01-18
申请人： Igor Y. Khandros , Benjamin N. Eldridge , Treliant Fang , Gaetan L. Mathieu , Gary W. Grube , Michael A. Drush , Christopher C. Buckholtz
发明人： Igor Y. Khandros , Benjamin N. Eldridge , Treliant Fang , Gaetan L. Mathieu , Gary W. Grube , Michael A. Drush , Christopher C. Buckholtz
IPC分类号： A47L25/00 , B08B1/00 , B08B7/00 , C08L83/05 , C08L83/07 , C08L83/08 , G01R1/067 , G01R3/00 , H01L21/304 , H01L21/66 , B65D69/00 , B32B5/00 , B32B9/04
CPC分类号： C08G77/48 , B08B1/00 , B08B7/0028 , G01R1/06711 , G01R3/00 , Y10T428/24388 , Y10T428/31663
摘要： A probe cleaning apparatus for cleaning a probe tip use to test semiconductors dies having an abrasive substrate layer an a tacky gel layer on top of the abrasive surface of the abrasive substrate layer. The probe tip is cleaned by passing it through the tacky gel layer so that it comes in contact with the abrasive surface of the abrasive substrate, moving the probe tip across the abrasive surface of the substrate layer, and then removing the probe tip from the successive layers of the cleaning apparatus. The probe tip emerges from the cleaning apparatus free from debris associated with testing the semiconductor dies.
摘要翻译：用于清洁探针头的探针清洁装置用于测试在磨料基底层的研磨表面的顶部上具有磨料基底层和粘性凝胶层的半导体模具。通过将探针尖端通过粘性凝胶层进行清洁，使其与磨料基材的研磨表面接触，使探针尖端跨过基底层的研磨表面，然后从连续的层的清洁装置。探针尖端从清洁设备中出来，没有与测试半导体管芯相关的碎片。

4. 发明授权

US08130007B2 Probe card assembly with carbon nanotube probes having a spring mechanism therein 有权
标题翻译：具有碳纳米管探针的探针卡组件，其中具有弹簧机构
公开(公告)号：US08130007B2
公开(公告)日：2012-03-06
申请号：US11872008
申请日：2007-10-13
申请人： Benjamin N. Eldridge , John K. Gritters , Rodney I. Martens , Alexander H. Slocum , Onnik Yaglioglu
发明人： Benjamin N. Eldridge , John K. Gritters , Rodney I. Martens , Alexander H. Slocum , Onnik Yaglioglu
IPC分类号： G01R31/26
CPC分类号： G01R1/06716 , G01R1/06744 , G01R1/0675 , G01R1/06755 , G01R3/00 , H01L2924/0002 , Y10T29/49004 , Y10T29/49147 , Y10T29/49204 , H01L2924/00
摘要： Columns comprising a plurality of vertically aligned carbon nanotubes can be configured as electromechanical contact structures or probes. The columns can be grown on a sacrificial substrate and transferred to a product substrate, or the columns can be grown on the product substrate. The columns can be treated to enhance mechanical properties such as stiffness, electrical properties such as electrical conductivity, and/or physical contact characteristics. The columns can be mechanically tuned to have predetermined spring properties. The columns can be used as electromechanical probes, for example, to contact and test electronic devices such as semiconductor dies, and the columns can make unique marks on terminals of the electronic devices.
摘要翻译：包括多个垂直排列的碳纳米管的柱可以被配置为机电接触结构或探针。柱可以在牺牲衬底上生长并转移到产物基底，或者可以在产物基底上生长柱。可以处理柱以增强诸如刚度，电性能如导电性和/或物理接触特性的机械性能。柱可以被机械调节以具有预定的弹簧性质。这些列可以用作机电探针，例如用于接触和测试诸如半导体管芯的电子器件，并且这些列可以在电子器件的端子上形成独特的标记。

5. 发明授权

US08697301B2 Fuel cell using carbon nanotubes 有权
标题翻译：使用碳纳米管的燃料电池
公开(公告)号：US08697301B2
公开(公告)日：2014-04-15
申请号：US13015848
申请日：2011-01-28
申请人： Benjamin N. Eldridge , John K. Gritters , Onnik Yaglioglu
发明人： Benjamin N. Eldridge , John K. Gritters , Onnik Yaglioglu
IPC分类号： H01M8/06
CPC分类号： H01M4/88 , B82Y30/00 , B82Y40/00 , H01M8/00 , H01M8/06 , H01M8/10 , Y02P70/56
摘要： A fuel cell comprises an anode, a cathode, and a proton exchange membrane. The anode and cathode can include a catalyst layer which includes a plurality of generally aligned carbon nanotubes. Methods of making a fuel cell are also disclosed.
摘要翻译：燃料电池包括阳极，阴极和质子交换膜。阳极和阴极可以包括包括多个大致排列的碳纳米管的催化剂层。还公开了制造燃料电池的方法。

6. 发明申请

US20110189564A1 FUEL CELL USING CARBON NANOTUBES 有权
标题翻译：燃料电池使用碳纳米管
公开(公告)号：US20110189564A1
公开(公告)日：2011-08-04
申请号：US13015848
申请日：2011-01-28
申请人： Benjamin N. Eldridge , John K. Gritters , Onnik Yaglioglu
发明人： Benjamin N. Eldridge , John K. Gritters , Onnik Yaglioglu
IPC分类号： H01M8/06 , H01M8/10 , H01M4/88 , H01M8/00 , B82Y30/00 , B82Y40/00
CPC分类号： H01M4/88 , B82Y30/00 , B82Y40/00 , H01M8/00 , H01M8/06 , H01M8/10 , Y02P70/56
摘要： A fuel cell comprises an anode, a cathode, and a proton exchange membrane. The anode and cathode can include a catalyst layer which includes a plurality of generally aligned carbon nanotubes. Methods of making a fuel cell are also disclosed.
摘要翻译：燃料电池包括阳极，阴极和质子交换膜。阳极和阴极可以包括包括多个大致排列的碳纳米管的催化剂层。还公开了制造燃料电池的方法。

7. 发明申请

US20090066352A1 Making And Using Carbon Nanotube Probes 有权
标题翻译：制作和使用碳纳米管探头
公开(公告)号：US20090066352A1
公开(公告)日：2009-03-12
申请号：US11872008
申请日：2007-10-13
申请人： John K. Gritters , Rodney Ivan Martens , Onnik Yaglioglu , Benjamin N. Eldridge , Alexander H. Slocum
发明人： John K. Gritters , Rodney Ivan Martens , Onnik Yaglioglu , Benjamin N. Eldridge , Alexander H. Slocum
IPC分类号： G01R31/26 , H01R4/48 , H01R9/00 , H01L23/58 , H01R43/16 , H01R12/00
CPC分类号： G01R1/06716 , G01R1/06744 , G01R1/0675 , G01R1/06755 , G01R3/00 , H01L2924/0002 , Y10T29/49004 , Y10T29/49147 , Y10T29/49204 , H01L2924/00
摘要： Columns comprising a plurality of vertically aligned carbon nanotubes can be configured as electromechanical contact structures or probes. The columns can be grown on a sacrificial substrate and transferred to a product substrate, or the columns can be grown on the product substrate. The columns can be treated to enhance mechanical properties such as stiffness, electrical properties such as electrical conductivity, and/or physical contact characteristics. The columns can be mechanically tuned to have predetermined spring properties. The columns can be used as electromechanical probes, for example, to contact and test electronic devices such as semiconductor dies, and the columns can make unique marks on terminals of the electronic devices.
摘要翻译：包括多个垂直排列的碳纳米管的柱可以被配置为机电接触结构或探针。柱可以在牺牲衬底上生长并转移到产物基底，或者可以在产物基底上生长柱。可以处理柱以增强诸如刚度，电性能如导电性和/或物理接触特性的机械性能。柱可以被机械调节以具有预定的弹簧性质。这些列可以用作机电探针，例如用于接触和测试诸如半导体管芯的电子器件，并且这些列可以在电子器件的端子上形成独特的标记。

8. 发明授权

US08513942B1 Method of forming a probe substrate by layering probe row structures and probe substrates formed thereby 有权
标题翻译：通过层叠由此形成的探针行结构和探针基底来形成探针基底的方法
公开(公告)号：US08513942B1
公开(公告)日：2013-08-20
申请号：US12974152
申请日：2010-12-21
申请人： Benjamin N. Eldridge , Gaetan L. Mathieu
发明人： Benjamin N. Eldridge , Gaetan L. Mathieu
IPC分类号： G01R1/06 , G01R31/20
CPC分类号： G01R3/00 , G01R1/07307
摘要： A probe head can comprise a substrate and electrically conductive structures extending from opposite surfaces of the substrate. The probe head can be made by forming frame structures each comprising a frame to which a row of the conductive structures is coupled. The frame structures can be placed in a stack. A compressible shim or a curable adhesive can be provided between adjacent frames in the stack to control a distance between the contact ends of the conductive structures in adjacent rows of the conductive structures. The frames can include cavities that form a mold while the frames are in the stack, and the substrate can be formed by introducing a moldable material into the mold. After the moldable material hardens, the frame can be removed, leaving the conductive structures embedded in the substrate.
摘要翻译：探头可以包括衬底和从衬底的相对表面延伸的导电结构。探针头可以通过形成每个包括一排导电结构的框架的框架结构来制造。框架结构可以放置在堆叠中。可以在堆叠中的相邻框架之间设置可压缩垫片或可固化粘合剂，以控制导电结构的相邻行中的导电结构的接触端之间的距离。框架可以包括在框架在堆叠中时形成模具的空腔，并且可以通过将可模制材料引入模具中来形成基板。在可模塑材料变硬之后，可以移除框架，使导电结构嵌入衬底中。

9. 发明授权

US08485418B2 Method of wirebonding that utilizes a gas flow within a capillary from which a wire is played out 失效
标题翻译：引线接合方法，其利用毛线管内的气流从其播出线
公开(公告)号：US08485418B2
公开(公告)日：2013-07-16
申请号：US12942709
申请日：2010-11-09
申请人： Benjamin N. Eldridge , Gary W. Grube , Igor Y. Khandros , Gaetan L. Mathieu
发明人： Benjamin N. Eldridge , Gary W. Grube , Igor Y. Khandros , Gaetan L. Mathieu
IPC分类号： B23K31/02
CPC分类号： B23K20/004 , B23K2101/40 , H01L23/13 , H01L23/49811 , H01L23/50 , H01L24/45 , H01L24/48 , H01L24/78 , H01L24/85 , H01L2224/45015 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/48091 , H01L2224/48227 , H01L2224/78301 , H01L2224/85043 , H01L2224/85045 , H01L2224/85099 , H01L2224/85203 , H01L2224/85205 , H01L2224/85207 , H01L2924/01005 , H01L2924/01006 , H01L2924/01011 , H01L2924/01012 , H01L2924/01014 , H01L2924/01015 , H01L2924/01018 , H01L2924/01019 , H01L2924/01023 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/0103 , H01L2924/01033 , H01L2924/01042 , H01L2924/01044 , H01L2924/01045 , H01L2924/01046 , H01L2924/01047 , H01L2924/01049 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01075 , H01L2924/01076 , H01L2924/01077 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/014 , H01L2924/07802 , H01L2924/10253 , H01L2924/10329 , H01L2924/12041 , H01L2924/12044 , H01L2924/14 , H01L2924/181 , H01L2924/19041 , H01L2924/19043 , H01L2924/30105 , H01L2924/30107 , H01L2924/3011 , H01L2924/3025 , H01L2924/00014 , H01L2924/00 , H01L2924/20752 , H01L2924/20753 , H01L2924/20755 , H01L2924/00015 , H01L2924/2075 , H01L2924/20754 , H01L2924/013 , H01L2924/00013
摘要： Contact structures exhibiting resilience or compliance for a variety of electronic components are formed. A variety of materials for the wire stem (which serves as a falsework) and for the overcoat (which serves as a superstructure over the falsework) are disclosed. Various techniques are described for mounting the contact structures to a variety of electronic components (e.g., semiconductor wafers and dies, semiconductor packages, interposers, interconnect substrates, etc.), and various process sequences are described. The resilient contact structures described herein are ideal for making a “temporary” (probe) connections to an electronic component such as a semiconductor die, for burn-in and functional testing.
摘要翻译：形成表现出各种电子部件的弹性或顺应性的接触结构。公开了用于线杆（用作脚手架）和外套（用作脚手架上的上部结构）的各种材料。描述了用于将接触结构安装到各种电子部件（例如，半导体晶片和管芯，半导体封装，插入件，互连衬底等）的各种技术，并且描述了各种工艺顺序。本文所述的弹性接触结构对于进行诸如半导体管芯的电子部件的“临时”（探针）连接是理想的，用于老化和功能测试。

10. 发明授权

US08383958B2 Method to build robust mechanical structures on substrate surfaces 失效
标题翻译：在衬底表面上构建坚固的机械结构的方法
公开(公告)号：US08383958B2
公开(公告)日：2013-02-26
申请号：US12783967
申请日：2010-05-20
申请人： Gary W. Grube , Gaetan L. Mathieu , Benjamin N. Eldridge , Chadwick D. Sofield
发明人： Gary W. Grube , Gaetan L. Mathieu , Benjamin N. Eldridge , Chadwick D. Sofield
IPC分类号： H01R12/04 , H05K1/11 , H05K1/16
CPC分类号： G01R3/00 , G01R1/06716 , G01R1/06744 , H01L24/80 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01023 , H01L2924/01029 , H01L2924/01033 , H01L2924/01046 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/14 , H01L2924/1461 , Y10T29/49117 , Y10T29/49147 , Y10T156/10 , Y10T428/12347 , Y10T428/12375 , Y10T428/12535 , Y10T428/12542 , Y10T428/12556 , Y10T428/12569 , Y10T428/31681 , H01L2924/00
摘要： A robust mechanical structure is provided to prevent small foundation structures formed on a substrate from detaching from the substrate surface. The strengthened structure is formed by plating a foundation metal layer on a seed layer and then embedding the plated foundation structure in an adhesive polymer material, such as epoxy. Components, such as spring probes, can then be constructed on the plated foundation. The adhesive polymer material better assures the adhesion of the metal foundation structure to the substrate surface by counteracting forces applied to an element, such as a spring probe, attached to the plated foundation.
摘要翻译：提供坚固的机械结构以防止形成在基板上的小基础结构从基板表面分离。强化结构通过在种子层上电镀基础金属层，然后将镀覆的基础结构嵌入诸如环氧树脂的粘合剂聚合物材料中而形成。然后可以在镀覆的基础上构造诸如弹簧探针的组件。粘合剂聚合物材料通过抵抗附着在镀覆基底上的诸如弹簧探针的元件的抵抗力，更好地保证金属基础结构与基底表面的粘附。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式