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    • 1. 发明申请
    • Probe Card Assembly With An Interchangeable Probe Insert
    • 探头卡组件与可互换探头插入
    • US20070007977A1
    • 2007-01-11
    • US11306270
    • 2005-12-21
    • Benjamin EldridgeCarl ReynoldsNobuhiro KawamataTakao Saeki
    • Benjamin EldridgeCarl ReynoldsNobuhiro KawamataTakao Saeki
    • G01R31/02
    • G01R31/2889G01R31/31905
    • A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The insert holder can be detached from the probe card assembly. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.
    • 探针卡组件可以包括构造成保持探针插入件的插入物保持器,其可以包括设置在特定构造中的探针,用于探测要测试的装置。 探针卡组件可以向测试器提供电接口,该接口可以控制设备的测试,并且在附接到探针卡组件时,插入物保持器可以保持探针插入件,使得探针插件电连接到内部的电路径 探针卡组件是测试仪接口的一部分。 插入架可以从探针卡组件拆下。 探针卡组件的探针插入可以通过拆卸插入物夹持器,用新的探针插入物代替探针插入物,然后将插入物夹持器重新连接到探针卡组件来代替。 探针插入物和保持器可以一体地形成并且包括可以从探针卡组件分离并且用不同的探针插入物和保持器代替的单个结构。
    • 3. 发明授权
    • Probe card assembly with an interchangeable probe insert
    • 探针卡组件与可互换的探针插入
    • US07898242B2
    • 2011-03-01
    • US12396661
    • 2009-03-03
    • Benjamin N. EldridgeCarl V. ReynoldsNobuhiro KawamataTakao Saeki
    • Benjamin N. EldridgeCarl V. ReynoldsNobuhiro KawamataTakao Saeki
    • G01R31/28
    • G01R31/2889G01R31/31905
    • A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The insert holder can be detached from the probe card assembly. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.
    • 探针卡组件可以包括构造成保持探针插入件的插入物保持器,其可以包括设置在特定构造中的探针,用于探测要测试的装置。 探针卡组件可以向测试器提供电接口,该接口可以控制设备的测试,并且在附接到探针卡组件时,插入物保持器可以保持探针插入件,使得探针插件电连接到内部的电路径 探针卡组件是测试仪接口的一部分。 插入架可以从探针卡组件拆下。 探针卡组件的探针插入可以通过拆卸插入物夹持器,用新的探针插入物代替探针插入物,然后将插入物夹持器重新连接到探针卡组件来代替。 探针插入物和保持器可以一体地形成并且包括可以从探针卡组件分离并且用不同的探针插入物和保持器代替的单个结构。
    • 4. 发明申请
    • PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT
    • 探针卡组装与可交换的探头插入
    • US20090160432A1
    • 2009-06-25
    • US12396661
    • 2009-03-03
    • Benjamin N. EldridgeCarl V. ReynoldsNobuhiro KawamataTakao Saeki
    • Benjamin N. EldridgeCarl V. ReynoldsNobuhiro KawamataTakao Saeki
    • G01R31/02
    • G01R31/2889G01R31/31905
    • A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The insert holder can be detached from the probe card assembly. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.
    • 探针卡组件可以包括构造成保持探针插入件的插入物保持器,其可以包括设置在特定构造中的探针,用于探测要测试的装置。 探针卡组件可以向测试器提供电接口,该接口可以控制设备的测试,并且在附接到探针卡组件时,插入物保持器可以保持探针插入件,使得探针插件电连接到内部的电路径 探针卡组件是测试仪接口的一部分。 插入架可以从探针卡组件拆下。 探针卡组件的探针插入可以通过拆卸插入物夹持器,用新的探针插入物代替探针插入物,然后将插入物夹持器重新连接到探针卡组件来代替。 探针插入物和保持器可以一体地形成并且包括可以从探针卡组件分离并且用不同的探针插入物和保持器代替的单个结构。
    • 5. 发明授权
    • Probe card assembly with an interchangeable probe insert
    • 探针卡组件与可互换的探针插入
    • US07498825B2
    • 2009-03-03
    • US11306270
    • 2005-12-21
    • Benjamin N. EldridgeCarl V. ReynoldsNobuhiro KawamataTakao Saeki
    • Benjamin N. EldridgeCarl V. ReynoldsNobuhiro KawamataTakao Saeki
    • G01R31/02
    • G01R31/2889G01R31/31905
    • A probe card assembly can include an insert holder configured to hold a probe insert, which can include probes disposed in a particular configuration for probing a device to be tested. The probe card assembly can provide an electrical interface to a tester that can control testing of the device, and while attached to the probe card assembly, the insert holder can hold the probe insert such that the probe insert is electrically connected to electrical paths within the probe card assembly that are part of the interface to the tester. The insert holder can be detached from the probe card assembly. The probe insert of the probe card assembly can be replaced by detaching the insert holder, replacing the probe insert with a new probe insert, and then reattaching the insert holder to the probe card assembly. The probe insert and holder can be integrally formed and comprise a single structure that can be detached from a probe card assembly and replaced with a different probe insert and holder.
    • 探针卡组件可以包括构造成保持探针插入件的插入物保持器,其可以包括设置在特定构造中的探针,用于探测要测试的装置。 探针卡组件可以向测试器提供电接口,该接口可以控制设备的测试,并且在附接到探针卡组件时,插入物保持器可以保持探针插入件,使得探针插件电连接到内部的电路径 探针卡组件是测试仪接口的一部分。 插入架可以从探针卡组件拆下。 探针卡组件的探针插入可以通过拆卸插入物夹持器,用新的探针插入物代替探针插入物,然后将插入物夹持器重新连接到探针卡组件来代替。 探针插入物和保持器可以一体地形成并且包括可以从探针卡组件分离并且用不同的探针插入物和保持器代替的单个结构。