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1. 发明授权

US5410186A Programmable digital to analog converter 失效
标题翻译：可编程数模转换器
公开(公告)号：US5410186A
公开(公告)日：1995-04-25
申请号：US206689
申请日：1994-03-04
申请人： Anthony R. Bonaccio , John E. Gersbach , Christian J. Goetschel , Sharon L. Von Bruns
发明人： Anthony R. Bonaccio , John E. Gersbach , Christian J. Goetschel , Sharon L. Von Bruns
IPC分类号： H03M1/74 , H01H37/76
CPC分类号： H03M1/742 , Y10T307/352 , Y10T307/391 , Y10T307/76 , Y10T307/826
摘要： By providing data to a selection switch via a multiplexor so it can be programmed to supply either a current programmably controlled by a shift register or a current fixed by a fused resistor. Selected signals coupled to the multiplexor control the selection of either the resistor or the shift register thus, providing an improved current selection device which is capable of automatically selecting and programming the current supplied to circuits such as digital to analog converters.
摘要翻译：通过经由多路复用器向选择开关提供数据，因此可将其编程为提供由移位寄存器编程的电流或由熔断电阻固定的电流。所选择的耦合到多路复用器的信号控制电阻器或移位寄存器的选择，从而提供改进的电流选择装置，其能够自动选择和编程提供给诸如数模转换器之类的电路的电流。

2. 发明申请

US20130055178A1 THERMAL COUPLING DETERMINATION AND REPRESENTATION 失效
标题翻译：热耦合测定与表示
公开(公告)号：US20130055178A1
公开(公告)日：2013-02-28
申请号：US13215868
申请日：2011-08-23
申请人： Ramana M. Malladi , Sharon L. Von Bruns
发明人： Ramana M. Malladi , Sharon L. Von Bruns
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G06F2217/80
摘要： Thermal coupling effects are represented as current into a thermal node of an initial design structure. The current is determined using a thermal coupling coefficient, and thermal resistance and thermal capacitance of a self-heating network of the initial design structure. By using another design structure with devices substantially identical to those of the initial design structure at known locations, operating a device as a heater while operating another device as a heat sensor, and measuring thermal response of the heater and the heat sensor, a thermal coupling coefficient may be determined.
摘要翻译：热耦合效应被表示为初始设计结构的热节点中的电流。使用热耦合系数，初始设计结构的自热网络的热电阻和热电容来确定电流。通过使用具有与已知位置处的初始设计结构基本相同的装置的另一设计结构，在将另一装置用作热传感器的同时操作装置作为加热器，并测量加热器和热传感器的热响应，可以确定系数。

3. 发明授权

US06603416B2 Method and circuit for dynamic calibration of flash analog to digital converters 有权
标题翻译：闪光模数转换器的动态校准方法和电路
公开(公告)号：US06603416B2
公开(公告)日：2003-08-05
申请号：US09968218
申请日：2001-10-01
申请人： Charles J. Masenas , Chad E. Mitchell , Steven J. Tanghe , Sharon L. Von Bruns
发明人： Charles J. Masenas , Chad E. Mitchell , Steven J. Tanghe , Sharon L. Von Bruns
IPC分类号： H03M112
CPC分类号： H03M1/1033 , H03M1/36
摘要： A method and structure for calibrating an analog to digital converter comprises an input signal; a driver receiving the input signal, wherein the driver outputs a driver output signal; a flash circuit receiving the driver output signal, wherein the flash circuit outputs a comparison result equaling 2n−1 digital outputs; an encoding logic unit encoding the comparison result into n digital bits as an output signal; a calibration engine outputting a calibration input adjust signal, a reference adjust signal, a driver gain adjust signal, a driver offset adjust signal; and a calibration input circuit receiving the calibration input adjust signal, wherein the driver receives the driver gain adjust signal and the driver offset adjust signal, wherein the flash circuit receives the reference adjust signal, wherein the calibration engine receives n digital bits, and controls an operation of the driver or flash circuit based on the output signal.
摘要翻译：用于校准模数转换器的方法和结构包括输入信号; 接收所述输入信号的驱动器，其中所述驱动器输出驱动器输出信号; 接收驱动器输出信号的闪光电路，其中闪光电路输出等于2n-1个数字输出的比较结果; 编码逻辑单元，将比较结果编码为n个数字位作为输出信号; 输出校准输入调整信号的校准引擎，基准调整信号，驾驶员增益调整信号，驾驶员偏移调整信号; 以及校准输入电路，其接收所述校准输入调整信号，其中所述驾驶员接收所述驾驶员增益调整信号和所述驾驶员偏移调整信号，其中所述闪光电路接收所述参考调整信号，其中所述校准引擎接收n个数字位，基于输出信号对驱动器或闪存电路进行操作。

4. 发明授权

US08549462B2 Thermal coupling determination and representation 失效
标题翻译：热耦合测定和表示
公开(公告)号：US08549462B2
公开(公告)日：2013-10-01
申请号：US13215868
申请日：2011-08-23
申请人： Ramana M. Malladi , Sharon L. Von Bruns
发明人： Ramana M. Malladi , Sharon L. Von Bruns
IPC分类号： G06F17/50
CPC分类号： G06F17/5036 , G06F2217/80
摘要： Thermal coupling effects are represented as current into a thermal node of an initial design structure. The current is determined using a thermal coupling coefficient, and thermal resistance and thermal capacitance of a self-heating network of the initial design structure. By using another design structure with devices substantially identical to those of the initial design structure at known locations, operating a device as a heater while operating another device as a heat sensor, and measuring thermal response of the heater and the heat sensor, a thermal coupling coefficient may be determined.
摘要翻译：热耦合效应被表示为初始设计结构的热节点中的电流。使用热耦合系数，初始设计结构的自热网络的热电阻和热电容来确定电流。通过使用具有与已知位置处的初始设计结构基本相同的装置的另一设计结构，在将另一装置用作热传感器的同时操作装置作为加热器，并测量加热器和热传感器的热响应，可以确定系数。

5. 发明授权

US07590507B2 Structure and method for monitoring variation within an active region of a semiconductor device using scaling 失效
标题翻译：用于使用缩放来监测半导体器件的有源区域内的变化的结构和方法
公开(公告)号：US07590507B2
公开(公告)日：2009-09-15
申请号：US11749801
申请日：2007-05-17
申请人： William Y. Chang , Sharon L. Von Bruns
发明人： William Y. Chang , Sharon L. Von Bruns
IPC分类号： G06F17/18
CPC分类号： H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor wafer is provided with one or more parameter scaling metric (PSM) groupings. Each PSM grouping includes a first device having a known active region geometry and further includes a set of one or more devices having active region geometry dimensions in a known relationship with the active region geometry of the first device. One or more parameter scaling metrics are calculated using measured values of one or more active region parameters of interest. The parameter scaling metric(s) can be used to quantify the stability and uniformity of a fabrication process used to make the semiconductor wafer.
摘要翻译：半导体晶片被提供有一个或多个参数缩放度量（PSM）分组。每个PSM分组包括具有已知有源区几何形状的第一装置，并且还包括具有与第一装置的有源区几何形状已知关系的有源区几何尺寸的一个或多个装置的集合。使用感兴趣的一个或多个活动区域参数的测量值来计算一个或多个参数缩放度量。参数缩放度量可用于量化用于制造半导体晶片的制造工艺的稳定性和均匀性。

6. 发明申请

US20080288188A1 Structure and Method for Monitoring Variation Within an Active Region of a Semiconductor Device Using Scaling 失效
标题翻译：用于使用缩放来监测半导体器件的有源区域内的变化的结构和方法
公开(公告)号：US20080288188A1
公开(公告)日：2008-11-20
申请号：US11749801
申请日：2007-05-17
申请人： William Y. Chang , Sharon L. Von Bruns
发明人： William Y. Chang , Sharon L. Von Bruns
IPC分类号： G01R15/00 , G06F19/00
CPC分类号： H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor wafer is provided with one or more parameter scaling metric (PSM) groupings. Each PSM grouping includes a first device having a known active region geometry and further includes a set of one or more devices having active region geometry dimensions in a known relationship with the active region geometry of the first device. One or more parameter scaling metrics are calculated using measured values of one or more active region parameters of interest. The parameter scaling metric(s) can be used to quantify the stability and uniformity of a fabrication process used to make the semiconductor wafer.
摘要翻译：半导体晶片被提供有一个或多个参数缩放度量（PSM）分组。每个PSM分组包括具有已知有源区几何形状的第一装置，并且还包括具有与第一装置的有源区几何形状已知关系的有源区几何尺寸的一个或多个装置的集合。使用感兴趣的一个或多个活动区域参数的测量值来计算一个或多个参数缩放度量。参数缩放度量可用于量化用于制造半导体晶片的制造工艺的稳定性和均匀性。

7. 发明授权

US06798185B2 Method and apparatus for testing analog to digital converters 有权
标题翻译：用于测试模数转换器的方法和装置
公开(公告)号：US06798185B2
公开(公告)日：2004-09-28
申请号：US10185811
申请日：2002-06-28
申请人： Steven J. Tanghe , Sharon L. Von Bruns
发明人： Steven J. Tanghe , Sharon L. Von Bruns
IPC分类号： G01R1314
CPC分类号： H03M1/109 , H03M1/12
摘要： A method and apparatus for testing ADC circuitry. The method and apparatus detects infrequently occurring errors by providing a series of waveforms to the ADC that have different amplitude, frequency, or voltage offset from one another. The outputs of the ADC for the waveforms are then analyzed for timing related errors.
摘要翻译：用于测试ADC电路的方法和装置。该方法和装置通过向ADC提供彼此具有不同幅度，频率或电压偏移的一系列波形来检测不常发生的错误。然后分析用于波形的ADC的输出与时序相关的误差。

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