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    • 1. 发明授权
    • Depletion mode thin film semiconductor photodetectors
    • 耗尽模式薄膜半导体光电探测器
    • US4598305A
    • 1986-07-01
    • US621340
    • 1984-06-18
    • Anne ChiangNoble M. Johnson
    • Anne ChiangNoble M. Johnson
    • H01L27/146H01L31/10H01L31/113H01L29/78H01L27/12
    • H01L31/1136
    • A depletion mode thin film semiconductor photodetector comprises a crystalline silicon thin film on an insulating substrate with a source region, a drain region and a thin film light sensing channel region formed therebetween. A gate oxide formed over the channel region and a gate electrode formed on the gate oxide. A p-n junction located parallel to the surface of the substrate and within the thin film functioning as a space charge separation region in the channel. The lower portion of the channel region is a p region extending to the substrate and the upper portion of the channel region is a n region extending to the gate oxide. The channel region functions as a fully depleted channel when the photodetector is operated in its OFF state providing for high dynamic range and large photocurrent operation. The depletion mode thin film semiconductor photodetector with n.sup.+ source and drain regions function as an ohmic contacts to the channel n region forming a thin film transistor. The thin film transistor photodetector has high photoconductive gain at low light intensities when the n channel region is fully pinched off by an applied gate voltage to the gate electrode which is sufficiently negative as compared to the threshold voltage of the photodetector. When the drain region is replaced by a p.sup.+ region functioning as an ohmic contact to the channel p region, a depletion mode gated diode is formed. When the channel region is extended to include a plurality of linearly spaced gate electrodes formed on the gate oxide region with an input diode formed adjacent to the first of such gate electrodes and an output diode formed adjacent to the last of such gate electrodes, the photodetector functions as a charge coupled device.
    • 耗尽型薄膜半导体光电检测器包括在绝缘基板上的晶体硅薄膜,源极区,漏区和在其间形成的薄膜光感应沟道区。 形成在沟道区上的栅极氧化物和形成在栅极氧化物上的栅电极。 p-n结,其平行于衬底的表面并且在薄膜内,用作通道中的空间电荷分离区域。 沟道区的下部是延伸到衬底的p区,沟道区的上部是延伸到栅极氧化物的n区。 当光电检测器工作在其关闭状态时,通道区域用作完全耗尽的通道,提供高动态范围和大的光电流操作。 具有n +源极和漏极区域的耗尽型薄膜半导体光电探测器用作形成薄膜晶体管的沟道n区的欧姆接触。 薄膜晶体管光电检测器在低光强度下具有高的光电导增益,当n沟道区被栅极施加的栅极电压完全夹到栅电极时,与光电检测器的阈值电压相比是足够的。 当漏极区被由作为与沟道p区的欧姆接触起作用的p +区代替时,形成耗尽型门控二极管。 当沟道区域被扩展以包括形成在栅极氧化物区域上的多个线性间隔开的栅极时,其中形成在与这些栅电极中的第一个栅极电极相邻的输入二极管上,以及与最后一个这样的栅电极相邻形成的输出二极管, 用作电荷耦合器件。
    • 5. 发明授权
    • Controlling transfer of objects affecting optical characteristics
    • 控制影响光学特性的物体的传递
    • US08320983B2
    • 2012-11-27
    • US11957610
    • 2007-12-17
    • Joerg MartiniJeffrey RoePeter KieselMichael BasslerAlan BellRichard H. BruceNoble M. Johnson
    • Joerg MartiniJeffrey RoePeter KieselMichael BasslerAlan BellRichard H. BruceNoble M. Johnson
    • A61B5/1455
    • A61B5/1459A61B5/14532G01N21/03G01N21/39G01N21/8507
    • An implantable product such as an article, device, or system can include analyte and non-analyte containers in parts that can be operated as optical cavities. The product can also include fluidic components such as filter assemblies that control transfer of objects that affect or shift spectrum features or characteristics such as by shifting transmission mode peaks or reflection mode valleys, shifting phase, reducing maxima or contrast, or increasing intermediate intensity width such as full width half maximum (FWHM). Analyte, e.g. glucose molecules, can be predominantly included in a set of objects that transfer more rapidly into the analyte container than other objects, and can have a negligible or zero rate of transfer into the non-analyte container; objects that transfer more rapidly into the non-analyte container can include objects smaller than the analyte or molecules of a set of selected types, including, e.g., sodium chloride. Output light from the containers accordingly includes information about analyte.
    • 诸如制品,装置或系统的可植入产品可以包括可以作为光腔操作的部件中的分析物和非分析物容器。 该产品还可以包括流体组件,例如过滤器组件,其控制影响或移动光谱特征或特性的物体的转移,例如通过移动透射模式峰值或反射模式谷,移动相位,减小最大值或对比度,或增加中等强度宽度, 作为全宽半最大值(FWHM)。 分析物,例如 葡萄糖分子可以主要包括在一组物体中,其比其它物体更快地转移到分析物容器中,并且可以具有可忽略或零速率的转移到非分析物容器中; 将更快速地转移到非分析物容器中的物体可以包括比分析物小的物体或一组选定类型的分子,包括例如氯化钠。 因此,来自容器的输出光包括关于分析物的信息。
    • 7. 发明申请
    • Causing Relative Motion
    • 导致相对运动
    • US20100157291A1
    • 2010-06-24
    • US12337796
    • 2008-12-18
    • Peter KieselMarkus BeckMichael BasslerNoble M. Johnson
    • Peter KieselMarkus BeckMichael BasslerNoble M. Johnson
    • G01N21/01
    • G01N15/1429G01N15/1459G01N21/532G01N21/645G01N21/65G01N2015/1075
    • Sensors can be used to obtain encoded sensing results from objects that have nonuniform relative motion. A photosensor or impedance-based sensor, for example, can obtain sensing results from objects that have relative motion within a sensing region relative to the sensor, with the relative motion being, for example, periodically varying, randomly varying, chirp-varying, or modulated relative motion that completes at least one modulation cycle within the sensing region. Relative motion can be caused by varying objects' speed and/or direction or by controlling flow of fluid carrying objects, movement of a channel, movement of a support structure, movement of a sensor, and/or pattern movement. A fluidic implementation can include shaped channel wall parts and/or a displacement component causing time-varying lateral displacement. A support structure implementation can include a scanner device and a rotary device that respectively control scanning and rotating movement of a movable support structure or of a sensor.
    • 传感器可用于从具有不均匀相对运动的物体获得编码的感测结果。 例如,光传感器或基于阻抗的传感器可以从相对于传感器的感测区域内具有相对运动的物体获得感测结果,相对运动例如是周期性变化的,随机变化的线性调频脉冲变化或 调制的相对运动,其在感测区域内完成至少一个调制周期。 可以通过改变物体的速度和/或方向或通过控制流体携带物体的流动,通道的移动,支撑结构的运动,传感器的运动和/或图案运动来引起相对运动。 流体实现可以包括形成通道壁部分和/或引起时变横向位移的位移部件。 支撑结构实现可以包括分别控制可移动支撑结构或传感器的扫描和旋转运动的扫描器装置和旋转装置。