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    • 10. 发明授权
    • Measuring optical phase
    • 测量光学相位
    • US06765681B1
    • 2004-07-20
    • US10119501
    • 2002-04-10
    • John N. SweetserAnders Grunnet-Jepsen
    • John N. SweetserAnders Grunnet-Jepsen
    • G01B902
    • G01M11/0264G01M11/0271
    • The phase (and amplitude) of a wave front may be accurately measured using knowledge of the wave front of an optical field generated by an optical element, permitting the determination of the spatial transfer function of that optical element. As a device under test is scanned across an aperture plate having slits, variations in the relative amplitude and phase of light passing through the slits are affected by the optical properties of the device under test, in turn affecting the interference pattern at a detector. Changes in the amplitude and phase of the detected signal are directly and uniquely related to the transfer function of the device under test.
    • 可以使用光学元件产生的光场的波前的知识来精确地测量波前的相位(和幅度),从而允许确定该光学元件的空间传递函数。 由于被测设备被扫描穿过具有狭缝的光阑,因此通过狭缝的光的相对幅度和相位的变化受被测设备的光学特性的影响,进而影响检测器处的​​干涉图案。 检测到的信号的幅度和相位的变化与被测器件的传递函数直接且唯一相关。