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1. 发明授权

US4185814A Pick up and placement head for green sheet and spacer 失效
标题翻译：拾取和放置头为绿色和间隔
公开(公告)号：US4185814A
公开(公告)日：1980-01-29
申请号：US859778
申请日：1977-12-12
申请人： Albert H. Buchmann , Thomas J. Cochran , Walter W. Ficker , Alfred A. Stricker , Walter von Kaenel
发明人： Albert H. Buchmann , Thomas J. Cochran , Walter W. Ficker , Alfred A. Stricker , Walter von Kaenel
IPC分类号： B65H5/14 , B25J15/06 , B65G47/91 , B65H3/08 , H01L21/683 , B65H7/02
CPC分类号： H01L21/6838 , B25J15/0076 , B25J15/0246 , B65G47/91 , B65H3/0883
摘要： A vacuum pick up and transfer head adapted for handling flimsy sheets of material such as spacer sheet and uncured ceramic sheet commonly referred to as green sheet. The vacuum transfer head is of generally rectangular configuration having a sheet contacting lip having vacuum slots formed through the periphery thereof to hold the sheets in place by vacuum pressure. The center of the sheet contacting face is recessed whereby, with a sheet in place and acting as a diaphragm, a central vacuum chamber is also defined. A series of check valves are provided to control application of vacuum and positive pressure to the green sheet for picking the sheet up, retaining it and stripping it. A plurality of probes are provided in the handling head, adapted to selectively project through the sheet contacting surface for detecting green sheet and/or spacer sheet utilized inbetween layers of green sheet. These probes also can act as positive strippers when the head enters a green sheet spacer tray in the process of removing a sheet of spacer or green sheet.
摘要翻译：真空拾取和转印头，适用于处理通常称为生片的隔离片和未固化的陶瓷片等薄片材料。真空转印头通常为矩形，其具有通过其周边形成有真空槽的片接触唇缘，以通过真空压力将片保持在适当位置。片接触面的中心是凹陷的，由此，当片材在适当位置并且用作隔膜时，还限定了中央真空室。提供一系列止回阀，以控制对生片的真空和正压施加，以拾取纸张，保持并剥离纸张。多个探针设置在处理头中，适于选择性地突出通过片接触表面，用于检测在生片之间使用的生片和/或间隔片。在去除间隔物或生片的过程中，当头部进入绿色片间隔托盘时，这些探针也可以作为正剥离器。

2. 发明授权

US4816754A Contactor and probe assembly for electrical test apparatus 失效
标题翻译：电气测试仪器的接触器和探头组件
公开(公告)号：US4816754A
公开(公告)日：1989-03-28
申请号：US857696
申请日：1986-04-29
申请人： Alvin W. Buechele , Thomas J. Cochran , Philo B. Hodge
发明人： Alvin W. Buechele , Thomas J. Cochran , Philo B. Hodge
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07357
摘要： Substrates are tested by conductive, individually plug replaceable, buckling beam probes in a probe pattern to engage the circuitry on the substrate. When probes engage the substrate, they buckle as a given engaging force is exceeded. Each probe socket is adapted to releasably retain a probe inserted in its socket. The probes and the probe sockets are axially mounted in a probe housing. A probe in a socket has a first end oriented to engage the circuitry and a second end is releasably engaged in a sleeve in its socket. the probe pattern is displayed radially. Guides have guide pins mounted in the probe housing. The pins cooperate with companion guide ways with contours such as slots. The guide ways in the substrate engaging member, and an actuator move the substrate engaging member relative to the guide pins along the contours of the guide ways. Cams are affixed to the probe housing approximately 180 degrees from one another, with a cam follower movably mounted relative to the cams so the cam follower engages the cams, and the follower is driven relative to the cams. The substrate engaging member either shrouds the first ends of the probes, or exposes the first ends of the probes to engage the circuitry.
摘要翻译：基板通过导电的单独插头可更换的弯曲光束探头以探针图案进行测试，以接合基板上的电路。当探头接合基板时，由于超过了给定的接合力，它们会弯曲。每个探针插座适于可释放地保持插入其插座中的探针。探头和探头插座轴向安装在探头外壳中。插座中的探针具有定向成接合电路的第一端，并且第二端可释放地接合在其插座中的套筒中。探头图案是径向显示的。导轨具有安装在探头外壳中的导销。这些针与伴随的导向方式配合，例如插槽等等。衬底接合构件中的引导方式和致动器沿着引导路线的轮廓相对于引导销移动衬底接合构件。凸轮被固定到探针壳体上，彼此大约180度，凸轮从动件相对于凸轮可移动地安装，使得凸轮从动件与凸轮接合，并且从动件相对于凸轮被驱动。衬底接合构件覆盖探针的第一端，或暴露探针的第一端以接合电路。

3. 发明授权

US4518910A Buckling beam twist probe contactor assembly with spring biased stripper plate 失效
标题翻译：带有弹簧偏置剥离板的弯曲梁扭转探头接触器组件
公开(公告)号：US4518910A
公开(公告)日：1985-05-21
申请号：US509519
申请日：1983-06-30
申请人： Hans G. Hottenrott , Philo B. Hodge , Thomas J. Cochran
发明人： Hans G. Hottenrott , Philo B. Hodge , Thomas J. Cochran
IPC分类号： G01R1/06 , G01R1/073 , G01R31/28 , H01L21/66 , G01R31/02
CPC分类号： G01R1/07357 , G01R1/07314
摘要： The buckling beam probe contactor assembly utilizing buckling beams in the form of continuous wires from the probe tips to remote source connectors includes at least one post terminating in a spring biased plunger assembly fixed to an underlying stripper plate provided with holes through which the beams project and protects them from damage. The stripper plate acts to accurately position the probe tips. The buckling beams intermediate their ends are potted in a slidable assembly axially movable on the post and shifted by an adjusting nut to preposition the probe tips relative to the stripper plate. The stripper plate first contacts the product during upward movement of the product, and the stripper plate is forced upwardly against spring bias relative to the post, then the beams contact the product test points and deflect a predetermined amount to maintain biased low ohmage circuit completions with the product.
摘要翻译：屈曲梁探针接触器组件利用从探针尖端到远程源连接器的连续导线形式的弯曲梁，包括至少一个柱，其终止于弹簧偏置的柱塞组件，弹簧偏置的柱塞组件固定到下面的剥离板上，保护他们免受损害。剥离板用于精确定位探针尖端。在其端部之间的弯曲梁被封装在可在柱上轴向移动的可滑动组件中，并且通过调节螺母移位，以相对于剥离板介导探针尖端。剥离板首先在产品的向上运动期间接触产品，并且剥离板相对于柱子抵抗弹簧偏压而被迫向上，然后梁接触产品测试点并偏转预定量以保持偏置的低欧姆电路完成与该产品。

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