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    • 1. 发明授权
    • Method and apparatus for replacing defective rows in a semiconductor memory array
    • 用于替换半导体存储器阵列中的有缺陷的行的方法和装置
    • US06888731B2
    • 2005-05-03
    • US10306734
    • 2002-11-29
    • Alan RothDouglas PerryRichard Foss
    • Alan RothDouglas PerryRichard Foss
    • G11C15/00G11C29/00G11C15/02
    • G11C29/848G11C15/00
    • A method for replacing a defective row in a CAM array, the array having a plurality of normal rows of cells and at least one spare row of cells, each the row being enabled by a corresponding word line signal, and having corresponding match line outputs switched to corresponding ones of a plurality of match line inputs in a match line decoder, the method comprising the steps of: (a) generating a signal indicative of the location of a defective row in the array; (b) generating a set of word line select signals for selecting ones of the plurality of normal rows; (d) using the defective row signal to switch a word line select signal of the defective row to a row adjacent the defective row and switching the adjacent row word line select signals to subsequent rows upto the at least one spare row, and (e) using the defective row signal to switch the match line input of the row adjacent the defective row to the matchline input of the defective row and switching the subsequent row match line input to the adjacent row match line input, repeating the switching for subsequent matchlines upto the matchline of the at least one spare row.
    • 一种用于替换CAM阵列中的有缺陷的行的方法,所述阵列具有多个正常的单元行和至少一个备用的单元行,每一行由相应的字线信号使能,并且具有对应的匹配线输出 到匹配行解码器中的多个匹配线输入中的对应的一个,该方法包括以下步骤:(a)产生指示阵列中缺陷行的位置的信号; (b)产生用于选择多个正常行中的一个的一组字线选择信号; (d)使用缺陷行信号将缺陷行的字线选择信号切换到与缺陷行相邻的行,并将相邻行字线选择信号切换到至少一个备用行的后续行,以及(e) 使用有缺陷的行信号将与缺陷行相邻的行的匹配线输入切换到缺陷行的匹配线输入,并将随后的行匹配线输入切换到相邻行匹配线输入,重复对后续匹配线的切换直到 至少一个备用行的匹配线。
    • 2. 发明授权
    • Method and circuit for error correction in CAM cells
    • CAM单元纠错方法与电路
    • US07350137B2
    • 2008-03-25
    • US11313661
    • 2005-12-22
    • Richard FossAlan Roth
    • Richard FossAlan Roth
    • G11C29/00
    • G06F11/1064G11C15/00
    • A method and circuit is provided for detecting and correcting errors in an array of content addressable memory (CAM) cells. The array includes wordlines, searchlines, bitlines, and matchlines for reading from, writing to, and searching CAM cells in the array. The method includes the following steps: a row parity bit corresponding to a parity of a first plurality of bits stored along a row of CAM cells is stored; a column parity bit corresponding to the parity of a second plurality of bits stored along a column of CAM cells is stored; a parity of the first plurality of bits is read and generated and the generated parity is compared to the stored row parity bit, if the generated and stored parity bits do not match, columns of the array are cycled through; a parity of the second plurality of bits is read and generated and the generated parity is compared to the stored column parity bit until a mismatch is indicated; and, a bit located at an intersection of the mismatched row and column is inverted if the mismatch is indicated.
    • 提供了一种用于检测和校正内容可寻址存储器(CAM)单元阵列中的错误的方法和电路。 阵列包括用于从阵列中读取,写入和搜索CAM单元的字线,搜索线,位线和匹配线。 该方法包括以下步骤:存储对应于沿着一组CAM单元存储的第一多个比特的奇偶校验位的行奇偶校验位; 存储与沿着CAM单元的列存储的第二多个比特的奇偶校验相对应的列奇偶校验位; 读出并产生第一多个比特的奇偶校验,并且如果生成和存储的奇偶校验位不匹配,则将生成的奇偶校验与存储的行奇偶校验位进行比较,则阵列的列循环; 读取并生成第二多个比特的奇偶校验,并将生成的奇偶校验与存储的列奇偶校验位进行比较,直到指示不匹配为止; 并且如果指示不匹配,位于错配的行和列的交点处的位被反转。
    • 3. 发明授权
    • Method and circuit for error correction in CAM cells
    • CAM单元纠错方法与电路
    • US07010741B2
    • 2006-03-07
    • US10306732
    • 2002-11-29
    • Richard FossAlan Roth
    • Richard FossAlan Roth
    • G11C29/00
    • G06F11/1064G11C15/00
    • A method and circuit is provided for detecting and correcting errors in an array of content addressable memory (CAM) cells. The array includes wordlines, searchlines, bitlines, and matchlines for reading from, writing to, and searching CAM cells in the array. The method includes the following steps: a row parity bit corresponding to a parity of a first plurality of bits stored along a row of CAM cells is stored; a column parity bit corresponding to the parity of a second plurality of bits stored along a column of CAM cells is stored; a parity of the first plurality of bits is read and generated and the generated parity is compared to the stored row parity bit; if the generated and stored parity bits do not match, columns of the array are cycled through; a parity of the second plurality of bits is read and generated and the generated parity is compared to the stored column parity bit until a mismatch is indicated; and, a bit located at an intersection of the mismatched row and column is inverted if the mismatch is indicated.
    • 提供了一种用于检测和校正内容可寻址存储器(CAM)单元阵列中的错误的方法和电路。 阵列包括用于从阵列中读取,写入和搜索CAM单元的字线,搜索线,位线和匹配线。 该方法包括以下步骤:存储对应于沿着一组CAM单元存储的第一多个比特的奇偶校验位的行奇偶校验位; 存储与沿着CAM单元的列存储的第二多个比特的奇偶校验相对应的列奇偶校验位; 读取并生成第一多个比特的奇偶校验,并将所生成的奇偶校验与存储的行奇偶校验位进行比较; 如果生成和存储的奇偶校验位不匹配,则阵列的列循环; 读取并生成第二多个比特的奇偶校验,并将生成的奇偶校验与存储的列奇偶校验位进行比较,直到指示不匹配为止; 并且如果指示不匹配,位于错配的行和列的交点处的位被反转。
    • 4. 发明申请
    • Method and circuit for error correction in CAM cells
    • CAM单元纠错方法与电路
    • US20060123327A1
    • 2006-06-08
    • US11313661
    • 2005-12-22
    • Richard FossAlan Roth
    • Richard FossAlan Roth
    • G06F11/00H03M13/00
    • G06F11/1064G11C15/00
    • A method and circuit is provided for detecting and correcting errors in an array of content addressable memory (CAM) cells. The array includes wordlines, searchlines, bitlines, and matchlines for reading from, writing to, and searching CAM cells in the array. The method includes the following steps: a row parity bit corresponding to a parity of a first plurality of bits stored along a row of CAM cells is stored; a column parity bit corresponding to the parity of a second plurality of bits stored along a column of CAM cells is stored; a parity of the first plurality of bits is read and generated and the generated parity is compared to the stored row parity bit, if the generated and stored parity bits do not match, columns of the array are cycled through; a parity of the second plurality of bits is read and generated and the generated parity is compared to the stored column parity bit until a mismatch is indicated; and, a bit located at an intersection of the mismatched row and column is inverted if the mismatch is indicated.
    • 提供了一种用于检测和校正内容可寻址存储器(CAM)单元阵列中的错误的方法和电路。 阵列包括用于从阵列中读取,写入和搜索CAM单元的字线,搜索线,位线和匹配线。 该方法包括以下步骤:存储对应于沿着一组CAM单元存储的第一多个比特的奇偶校验位的行奇偶校验位; 存储与沿着CAM单元的列存储的第二多个比特的奇偶校验相对应的列奇偶校验位; 读出并产生第一多个比特的奇偶校验,并且如果生成和存储的奇偶校验位不匹配,则将生成的奇偶校验与存储的行奇偶校验位进行比较,则阵列的列循环; 读取并生成第二多个比特的奇偶校验,并将生成的奇偶校验与存储的列奇偶校验位进行比较,直到指示不匹配为止; 并且如果指示不匹配,位于错配的行和列的交点处的位被反转。
    • 7. 发明申请
    • Class D Amplifier Control Circuit and Method
    • D类放大器控制电路及方法
    • US20110006844A1
    • 2011-01-13
    • US12858310
    • 2010-08-17
    • Eric SoenenAlan RothJustin ShiMartin Kinyua
    • Eric SoenenAlan RothJustin ShiMartin Kinyua
    • H03F3/217
    • H03F3/2173
    • Circuit and method for a Class D amplifier. In one exemplary embodiment, an audio amplifier is disclosed. A closed loop configuration for driving high and low side driver transistors is provided, each circuit is compatible with advanced sub micron semiconductor processes. The analog time varying input is coupled to one input of a sigma delta analog to digital converter. A feedback signal from the output is also input to the analog to digital converter. A bit stream is output by the analog to digital converter. A decimator receives this bit stream and downconverts the samples to digital values at a lower frequency. A digital filter with adaptable coefficients is used to filter that signal and a digital pulse width modulator then develops an analog differential PWM signal. A predriver inputs the PWM signal and derives the output gating signals to control the high and low side drivers of a Class D amplifier.
    • D类放大器的电路和方法。 在一个示例性实施例中,公开了一种音频放大器。 提供用于驱动高侧和低侧驱动晶体管的闭环配置,每个电路与先进的亚微米半导体工艺兼容。 模拟时变输入耦合到Σ-Δ模数转换器的一个输入端。 来自输出的反馈信号也被输入到模数转换器。 位流由模数转换器输出。 抽取器接收该位流,并以较低的频率将样本下变频为数字值。 使用具有适应系数的数字滤波器来对该信号进行滤波,并且数字脉宽调制器然后开发模拟差分PWM信号。 预驱动器输入PWM信号并导出输出门控信号以控制D类放大器的高侧和低侧驱动器。
    • 9. 发明申请
    • CLASS D AMPLIFIER CONTROL CIRCUIT AND METHOD
    • 等级放大器控制电路和方法
    • US20100045376A1
    • 2010-02-25
    • US12197967
    • 2008-08-25
    • Eric SoenenAlan RothJustin Shi
    • Eric SoenenAlan RothJustin Shi
    • H03F3/217
    • H03F3/2173
    • Circuit and method for a Class D amplifier. In one exemplary embodiment, an audio amplifier is disclosed. A closed loop configuration for driving high and low side driver transistors is provided, each circuit is compatible with advanced sub micron semiconductor processes. The analog time varying input is coupled to one input of a sigma delta analog to digital converter. A feedback signal from the output is also input to the analog to digital converter. A bit stream is output by the analog to digital converter. A decimator receives this bit stream and downconverts the samples to digital values at a lower frequency. A digital filter with adaptable coefficients is used to filter that signal and a digital pulse width modulator then develops an analog differential PWM signal. A predriver inputs the PWM signal and derives the output gating signals to control the high and low side drivers of a Class D amplifier.
    • D类放大器的电路和方法。 在一个示例性实施例中,公开了一种音频放大器。 提供用于驱动高侧和低侧驱动晶体管的闭环配置,每个电路与先进的亚微米半导体工艺兼容。 模拟时变输入耦合到Σ-Δ模数转换器的一个输入端。 来自输出的反馈信号也被输入到模数转换器。 位流由模数转换器输出。 抽取器接收该位流,并以较低的频率将样本下变频为数字值。 使用具有适应系数的数字滤波器来对该信号进行滤波,并且数字脉宽调制器然后开发模拟差分PWM信号。 预驱动器输入PWM信号并导出输出门控信号以控制D类放大器的高侧和低侧驱动器。