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    • 1. 发明申请
    • SUBSTRATE TREATMENT APPARATUS
    • 基板处理设备
    • US20080263793A1
    • 2008-10-30
    • US12109059
    • 2008-04-24
    • Akiyoshi NakanoKoichi MukaegakiYoshikazu KagoHiroyuki Ueno
    • Akiyoshi NakanoKoichi MukaegakiYoshikazu KagoHiroyuki Ueno
    • B08B1/04
    • B08B1/04H01L21/67046
    • The present invention provides a substrate treatment apparatus for performing a substrate periphery cleaning process. The substrate treatment apparatus includes substrate holding mechanism which holds a substrate, a brush having a cleaning surface inclined with respect to a longitudinal axis thereof extending perpendicularly to a front surface of the substrate held by the substrate holding mechanism, brush moving mechanism which moves the brush along the longitudinal axis and along a lateral axis orthogonal to the longitudinal axis, load detecting unit which detects a load applied along the longitudinal axis to the brush, and first judging unit which judges, based on an output of the load detecting unit, whether or not the brush is located at a reference position serving as a reference for guiding the brush to a treatment position at which the brush is located in the cleaning process.
    • 本发明提供一种用于进行基板周边清洁处理的基板处理装置。 基板处理装置包括:基板保持机构,其保持基板;刷子,其具有相对于其垂直于由基板保持机构保持的基板的前表面延伸的纵轴倾斜的清洁表面;刷移动机构,其使刷子移动 沿着纵轴线并且沿着与纵向轴线正交的横轴,负载检测单元检测沿着纵向轴线施加到电刷的负载;以及第一判断单元,其基于负载检测单元的输出来判断是否或 不是刷子位于用于将刷子引导到清洁过程中刷子所在的处理位置的基准位置。
    • 2. 发明授权
    • Substrate treatment apparatus
    • 基板处理装置
    • US08051522B2
    • 2011-11-08
    • US12109059
    • 2008-04-24
    • Akiyoshi NakanoKoichi MukaegakiYoshikazu KagoHiroyuki Ueno
    • Akiyoshi NakanoKoichi MukaegakiYoshikazu KagoHiroyuki Ueno
    • A47L15/39
    • B08B1/04H01L21/67046
    • The present invention provides a substrate treatment apparatus for performing a substrate periphery cleaning process. The substrate treatment apparatus includes substrate holding mechanism which holds a substrate, a brush having a cleaning surface inclined with respect to a longitudinal axis thereof extending perpendicularly to a front surface of the substrate held by the substrate holding mechanism, brush moving mechanism which moves the brush along the longitudinal axis and along a lateral axis orthogonal to the longitudinal axis, load detecting unit which detects a load applied along the longitudinal axis to the brush, and first judging unit which judges, based on an output of the load detecting unit, whether or not the brush is located at a reference position serving as a reference for guiding the brush to a treatment position at which the brush is located in the cleaning process.
    • 本发明提供一种用于进行基板周边清洁处理的基板处理装置。 基板处理装置包括:基板保持机构,其保持基板;刷子,其具有相对于其垂直于由基板保持机构保持的基板的前表面延伸的纵轴倾斜的清洁表面;刷移动机构,其使刷子移动 沿着纵轴线并且沿着与纵向轴线正交的横轴,负载检测单元检测沿着纵向轴线施加到电刷的负载;以及第一判断单元,其基于负载检测单元的输出来判断是否或 不是刷子位于用于将刷子引导到清洁过程中刷子所在的处理位置的基准位置。
    • 4. 发明申请
    • APPARATUS FOR AND METHOD OF CLEANING SUBSTRATE
    • 装置和清洁基板的方法
    • US20090199869A1
    • 2009-08-13
    • US12427606
    • 2009-04-21
    • Yoshikazu KagoMasaki IwamiMasahiro Nonomura
    • Yoshikazu KagoMasaki IwamiMasahiro Nonomura
    • B08B7/00
    • H01L21/67046B08B1/04
    • A substrate cleaning apparatus includes two cleaning brushes driven independently of each other. A first cleaning brush makes a cycling movement including an outward movement progressing in a horizontal direction from a position in contact with the center of the rotation of a substrate to the outside of an edge of the substrate, an upward movement progressing in a vertically upward direction from an end position of the outward movement, an inward movement progressing in a horizontal direction from an end position of the upward movement to a position immediately over the center of the rotation of the substrate, and a downward movement progressing in a vertically downward direction from an end position of the inward movement to a start position of the outward movement. A second cleaning brush makes a similar cycling movement. The first and second cleaning brushes are adapted so that the speed of the inward movement thereof is higher than that of the outward movement thereof and so that the speed of the upward movement is higher than that of the downward movement thereof.
    • 基板清洗装置包括彼此独立地驱动的两个清洁刷。 第一清洁刷进行循环运动,包括从与基板的旋转中心接触的位置到基板的边缘的外侧在水平方向上向外运动的向外运动,向上运动沿垂直向上的方向 从向外移动的结束位置向内移动,从向上移动的结束位置向垂直于基板的旋转中心的位置在水平方向上进行向内运动,并且沿垂直向下的方向从向下移动 向内移动的结束位置到向外移动的开始位置。 第二个清洁刷子进行类似的循环运动。 第一和第二清洁刷适于使其向内移动的速度高于其向外移动的速度,并且使得向上移动的速度高于向下移动的速度。
    • 5. 发明申请
    • Apparatus for and method of cleaning substrate
    • 清洗基板的方法及方法
    • US20050183754A1
    • 2005-08-25
    • US11057003
    • 2005-02-11
    • Yoshikazu KagoMasaki IwamiMasahiro Nonomura
    • Yoshikazu KagoMasaki IwamiMasahiro Nonomura
    • H01L21/304B08B1/04H01L21/00B08B3/00
    • H01L21/67046B08B1/04
    • A substrate cleaning apparatus includes two cleaning brushes driven independently of each other. A first cleaning brush makes a cycling movement including an outward movement progressing in a horizontal direction from a position in contact with the center of the rotation of a substrate to the outside of an edge of the substrate, an upward movement progressing in a vertically upward direction from an end position of the outward movement, an inward movement progressing in a horizontal direction from an end position of the upward movement to a position immediately over the center of the rotation of the substrate, and a downward movement progressing in a vertically downward direction from an end position of the inward movement to a start position of the outward movement. A second cleaning brush makes a similar cycling movement. The first and second cleaning brushes are adapted so that the speed of the inward movement thereof is higher than that of the outward movement thereof and so that the speed of the upward movement is higher than that of the downward movement thereof.
    • 基板清洗装置包括彼此独立地驱动的两个清洁刷。 第一清洁刷进行循环运动,包括从与基板的旋转中心接触的位置到基板的边缘的外侧在水平方向上向外运动的向外运动,向上运动沿垂直向上的方向 从向外移动的结束位置向内移动,从向上移动的结束位置向垂直于基板的旋转中心的位置在水平方向上进行向内运动,并且沿垂直向下的方向从向下移动 向内移动的结束位置到向外移动的开始位置。 第二个清洁刷子进行类似的循环运动。 第一和第二清洁刷适于使其向内移动的速度高于其向外移动的速度,并且使得向上移动的速度高于向下移动的速度。