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1. 发明申请

US20050271253A1 Target detection system using radar and image processing 有权
标题翻译：目标检测系统采用雷达和图像处理
公开(公告)号：US20050271253A1
公开(公告)日：2005-12-08
申请号：US11188160
申请日：2005-07-21
申请人： Akihiro Ohta , Kenji Oka
发明人： Akihiro Ohta , Kenji Oka
IPC分类号： G01C3/08 , G01C11/06 , G01S7/41 , G01S11/12 , G01S13/86 , G01S13/93 , G06K9/32 , G06T7/00 , G06K9/00
CPC分类号： G01C3/08 , G01C11/06 , G01S7/41 , G01S11/12 , G01S13/867 , G01S13/931 , G06K9/3233 , G06T7/97
摘要： A target detection system using an EHF radar and the image processing is disclosed, in which the processing time is shortened by mutually complementing the disadvantages of the EHF radar and the image processing thereby to improve the reliability. The system comprises a radar, an image acquisition unit and an image processing ECU. The microcomputer of the ECU specifies an image recognition area based on the power output from the radar, and carries out the image processing only within the specified recognition area for the image obtained from the image acquisition unit. By performing the image processing only for the area where a target is detected by the radar, the time required for image processing is shortened on the one hand and the erroneous detection of letters on the road surface or the like is eliminated.
摘要翻译：公开了使用EHF雷达和图像处理的目标检测系统，其中通过相互补充EHF雷达的缺点和图像处理来缩短处理时间，从而提高可靠性。该系统包括雷达，图像获取单元和图像处理ECU。 ECU的微型计算机基于从雷达输出的功率来指定图像识别区域，并且仅在从图像获取单元获得的图像的指定识别区域内执行图像处理。通过仅对由雷达检测到目标的区域进行图像处理，一方面缩短了图像处理所需的时间，并且消除了路面上的字母的错误检测等。

2. 发明授权

US07233279B2 Method and device for distance measurement by pulse radar 有权
标题翻译：脉冲雷达测距方法及装置
公开(公告)号：US07233279B2
公开(公告)日：2007-06-19
申请号：US11019378
申请日：2004-12-23
申请人： Masayoshi Moriya , Satoshi Ishii , Tetsuo Seki , Kazuaki Hamada , Kenji Oka , Akihiro Ohta
发明人： Masayoshi Moriya , Satoshi Ishii , Tetsuo Seki , Kazuaki Hamada , Kenji Oka , Akihiro Ohta
IPC分类号： G01S13/08 , G01S13/12
CPC分类号： G01S13/20 , G01S13/18 , G01S13/227 , G01S13/24
摘要： In order to provide the method and the device for distance measurement by pulse radar that securely eliminates the false echo from the distance over the detectable limit determined by the pulse generation cycle, the pulse radar comprises the pulse signal sending unit that generates the pulse signals with different cycles at OSC 9a˜9c, switches to the predetermined intervals by OSC switch 10, and sends the pulse signal to targets, the reflected signal receiving unit that receives the reflected signals and stores the data in the RAM 25, the reflected signal data acquisition unit that obtains the data of each reflected signal, and the reflected signal identification unit that compares the intensity of the reflected signals obtained at the same lag time point during a certain time period after sending the pulse signal for reference and identifies the reflected signals of the sent pulse signal for reference.
摘要翻译：为了提供通过脉冲雷达进行距离测量的方法和装置，从脉冲发生周期确定的可检测限度的距离安全地消除假回波，脉冲雷达包括产生脉冲信号的脉冲信号发送单元，在OSC 9 a〜9 c处的不同周期，由OSC开关10切换到预定间隔，并将脉冲信号发送到目标，反射信号接收单元接收反射信号并将数据存储在RAM 25中，反射信号数据获取单元，其获得每个反射信号的数据;以及反射信号识别单元，其在发送用于参考的脉冲信号之后的特定时间段内比较在相同滞后时间点获得的反射信号的强度，并且识别反射信号的发送脉冲信号供参考。

3. 发明申请

US20060055590A1 Method and device for distance measurement by pulse radar 有权
标题翻译：脉冲雷达测距方法及装置
公开(公告)号：US20060055590A1
公开(公告)日：2006-03-16
申请号：US11019378
申请日：2004-12-23
申请人： Masayoshi Moriya , Satoshi Ishii , Tetsuo Seki , Kazuaki Hamada , Kenji Oka , Akihiro Ohta
发明人： Masayoshi Moriya , Satoshi Ishii , Tetsuo Seki , Kazuaki Hamada , Kenji Oka , Akihiro Ohta
IPC分类号： G01S13/08
CPC分类号： G01S13/20 , G01S13/18 , G01S13/227 , G01S13/24
摘要： In order to provide the method and the device for distance measurement by pulse radar that securely eliminates the false echo from the distance over the detectable limit determined by the pulse generation cycle, the pulse radar comprises the pulse signal sending unit that generates the pulse signals with different cycles at OSC 9a˜9c, switches to the predetermined intervals by OSC switch 10, and sends the pulse signal to targets, the reflected signal receiving unit that receives the reflected signals and stores the data in the RAM 25, the reflected signal data acquisition unit that obtains the data of each reflected signal, and the reflected signal identification unit that compares the intensity of the reflected signals obtained at the same lag time point during a certain time period after sending the pulse signal for reference and identifies the reflected signals of the sent pulse signal for reference.
摘要翻译：为了提供通过脉冲雷达进行距离测量的方法和装置，从脉冲发生周期确定的可检测限度的距离安全地消除假回波，脉冲雷达包括产生脉冲信号的脉冲信号发送单元，在OSC 9 a〜9 c处的不同周期，由OSC开关10切换到预定间隔，并将脉冲信号发送到目标，反射信号接收单元接收反射信号并将数据存储在RAM 25中，反射信号数据获取单元，其获得每个反射信号的数据;以及反射信号识别单元，其在发送用于参考的脉冲信号之后的特定时间段内比较在相同滞后时间点获得的反射信号的强度，并且识别反射信号的发送脉冲信号供参考。

4. 发明授权

US07376247B2 Target detection system using radar and image processing 有权
标题翻译：目标检测系统采用雷达和图像处理
公开(公告)号：US07376247B2
公开(公告)日：2008-05-20
申请号：US11188160
申请日：2005-07-21
申请人： Akihiro Ohta , Kenji Oka
发明人： Akihiro Ohta , Kenji Oka
IPC分类号： G06K9/00
CPC分类号： G01C3/08 , G01C11/06 , G01S7/41 , G01S11/12 , G01S13/867 , G01S13/931 , G06K9/3233 , G06T7/97
摘要： A target detection system using an EHF radar and the image processing is disclosed, in which the processing time is shortened by mutually complementing the disadvantages of the EHF radar and the image processing thereby to improve the reliability. The system comprises a radar, an image acquisition unit and an image processing ECU. The microcomputer of the ECU specifies an image recognition area based on the power output from the radar, and carries out the image processing only within the specified recognition area for the image obtained from the image acquisition unit. By performing the image processing only for the area where a target is detected by the radar, the time required for image processing is shortened on the one hand and the erroneous detection of letters on the road surface or the like is eliminated.
摘要翻译：公开了使用EHF雷达和图像处理的目标检测系统，其中通过相互补充EHF雷达的缺点和图像处理来缩短处理时间，从而提高可靠性。该系统包括雷达，图像获取单元和图像处理ECU。 ECU的微型计算机基于从雷达输出的功率来指定图像识别区域，并且仅在从图像获取单元获得的图像的指定识别区域内执行图像处理。通过仅对由雷达检测到目标的区域进行图像处理，一方面缩短了图像处理所需的时间，并且消除了路面上的字母的错误检测等。

5. 发明授权

US08949043B2 Surface inspecting apparatus and method for calibrating same 有权
标题翻译：表面检查装置及其校准方法
公开(公告)号：US08949043B2
公开(公告)日：2015-02-03
申请号：US13202734
申请日：2010-02-02
申请人： Kenji Oka , Kenji Mitomo , Kenichiro Komeda
发明人： Kenji Oka , Kenji Mitomo , Kenichiro Komeda
IPC分类号： G01N21/94 , G01N21/93 , G01N21/95
CPC分类号： G01N21/9501 , G01N21/93 , G01N2201/103
摘要： While an illumination optical system is irradiating the surface of a contaminated standard wafer with illumination light, this illumination light is scanned over the surface of the contaminated standard wafer, then detectors of a detection optical system each detect the light scattered from the surface of the contaminated standard wafer, next a predefined reference value in addition to detection results on the scattered light is used to calculate a compensation parameter “Comp” for detection sensitivity correction of photomultiplier tubes of the detectors, and the compensation parameter “Comp” is separated into a time-varying deterioration parameter “P”, an optical characteristics parameter “Opt”, and a sensor characteristics parameter “Lr”, and correspondingly managed. This makes is easy to calibrate the detection sensitivity.
摘要翻译：当照明光学系统用照明光照射污染的标准晶片的表面时，该照明光被扫描在受污染的标准晶片的表面上，然后检测光学系统的检测器每个都检测从污染的表面散射的光标准晶片，接下来的预定参考值除了散射光上的检测结果之外，用于计算检测器的光电倍增管的检测灵敏度校正的补偿参数“Comp”，并将补偿参数“Comp”分为时间 - 变化劣化参数“P”，光学特性参数“Opt”和传感器特性参数“Lr”，并相应地管理。这使得检测灵敏度变得容易。

6. 发明授权

US08831899B2 Inspecting apparatus and an inspecting method 有权
标题翻译：检查仪器和检查方法
公开(公告)号：US08831899B2
公开(公告)日：2014-09-09
申请号：US13127051
申请日：2009-10-15
申请人： Kazunori Nemoto , Akira Hamamatsu , Hideo Ota , Kenji Oka , Takahiro Jingu
发明人： Kazunori Nemoto , Akira Hamamatsu , Hideo Ota , Kenji Oka , Takahiro Jingu
IPC分类号： G01C19/00 , G01N21/00 , B82Y35/00 , G01N21/93 , G01B11/30 , G01N21/95 , G01N21/88 , H01L21/66
CPC分类号： G01B11/303 , B82Y35/00 , G01N21/93 , G01N21/9501 , G01N2021/8822 , H01L22/12 , H01L2924/0002 , H01L2924/00
摘要： A system and method for determining measurement results of a dark-field inspection apparatus up to a microscopic area. A dark-field inspection apparatus is calibrated using a reference wafer having microroughness of an irregular asperity pattern accurately formed on a surface, and the microroughness of the surface having an ensured microroughness degree. This microroughness is measured by using an AFM, and an expected haze value is obtained based on the measured value. Then, haze of the surface of the reference wafer is measured by the dark-field inspection apparatus to be inspected to obtain an actually-measured haze value, and a difference between the expected haze value and the actually-measured haze value is obtained. Based on this difference, a haze measurement parameter of the dark-field inspection apparatus is adjusted so that the actually-measured haze value and the expected haze value match each other.
摘要翻译：用于确定暗视场检查装置的测量结果直到微观区域的系统和方法。使用具有精确形成在表面上的不规则凹凸图案的微粗糙度的参考晶片校准暗场检查装置，并且具有确保的微粗糙度的表面的微粗糙度。通过使用AFM测量该微粗糙度，并且基于测量值获得预期雾度值。然后，通过需要检查的暗视野检查装置测量参考晶片的表面的雾度，以获得实际测得的雾度值，并获得预期雾度值和实际测得的雾度值之间的差。基于该差异，调整暗场检查装置的雾度测量参数，使得实际测量的雾度值和预期雾度值彼此匹配。

7. 发明授权

US08804108B2 Inspection method and inspection apparatus 有权
标题翻译：检验方法和检验仪器
公开(公告)号：US08804108B2
公开(公告)日：2014-08-12
申请号：US13202727
申请日：2009-12-04
申请人： Kenji Mitomo , Kenji Oka
发明人： Kenji Mitomo , Kenji Oka
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/94 , G01N21/956 , G01N2021/4707 , G01N2021/8822
摘要： This application relates to an inspection apparatus including: a stage which holds a specimen; an illumination optical system which illuminates a surface of the specimen held on the stage, with illumination light; a dark-field optical system which detects scattered light generated by the illumination light with which the specimen is illuminated; a photoelectric converter which converts the scattered light detected by the dark-field optical system, into an electric signal; an A/D converter which converts the electric signal obtained by conversion by the photoelectric converter, into a digital signal; a judgement unit which determines the dimension of a foreign substance on the surface of the specimen on the basis of a magnitude of the scattered light from the foreign substance; and a signal processor which determines an inspection condition by use of information on the scattered light from the specimen surface.
摘要翻译：本申请涉及一种检查装置，包括：保持试样的台架; 照明光学系统，用照明光照亮保持在舞台上的标本的表面; 一个暗场光学系统，用于检测被照射的照明光产生的散射光; 将由暗视场光学系统检测出的散射光转换成电信号的光电转换器; 将通过光电转换器的转换获得的电信号转换为数字信号的A / D转换器; 判断单元，其基于来自异物的散射光的大小来确定样品表面上的异物的尺寸; 以及信号处理器，其通过使用关于来自样本表面的散射光的信息来确定检查条件。

8. 发明授权

US08552445B2 Semiconductor light emitting device and method for manufacturing the same 有权
标题翻译：半导体发光器件及其制造方法
公开(公告)号：US08552445B2
公开(公告)日：2013-10-08
申请号：US12808472
申请日：2008-12-26
申请人： Yohei Wakai , Hiroaki Matsumura , Kenji Oka
发明人： Yohei Wakai , Hiroaki Matsumura , Kenji Oka
IPC分类号： H01L33/00
CPC分类号： H01L33/005 , H01L33/007 , H01L33/0079 , H01L33/20 , H01L33/22 , H01L33/36 , H01L33/382 , H01L33/44 , H01L2933/0016 , H01L2933/0058
摘要： A semiconductor light emitting device having high reliability and excellent light distribution characteristics is provided. Specifically, a semiconductor light emitting device 1 is provided with an n-electrode 50, which is arranged on a light extraction surface on the side opposite to the surface whereupon a semiconductor stack 40 is mounted on a substrate 10. A plurality of convexes are arranged on a first convex region 80 and a second convex region 90 on the light extraction surface. The second convex region 90 adjoins to the interface between the n-electrode 50 and the semiconductor stack 40, between the first convex region 80 and the n-electrode 50. The base end of the first convex arranged in the first convex region 80 is positioned closer to alight emitting layer 42 than the interface between the n-electrode 50 and the semiconductor stack 40, and the base end of the second convex arranged in the second convex region 90 is positioned closer to the interface between the n-electrode 50 and the semiconductor stack 40 than the base end of the first convex.
摘要翻译：提供了具有高可靠性和优异的光分布特性的半导体发光器件。具体地，半导体发光器件1设置有n电极50，其被配置在与衬底10上安装有半导体堆叠40的表面相反侧的光提取表面上。多个凸起布置在光提取表面上的第一凸区80和第二凸区90上。第二凸区域90与第一凸区域80和n电极50之间的n电极50和半导体堆叠体40之间的界面相邻。布置在第一凸区域80中的第一凸部的基端位于比n电极50和半导体堆叠40之间的界面更靠近发光层42，并且布置在第二凸区域90中的第二凸起的基端位于更靠近n电极50和第二凸起区域90之间的界面处。半导体堆叠40比第一凸起的基端。

9. 发明申请

US20120076438A1 VISUAL LINE ESTIMATING APPARATUS 有权
标题翻译：可视线估计装置
公开(公告)号：US20120076438A1
公开(公告)日：2012-03-29
申请号：US13240200
申请日：2011-09-22
申请人： Kenji Oka , Sotaro Tsukizawa
发明人： Kenji Oka , Sotaro Tsukizawa
IPC分类号： G06K9/36
CPC分类号： G06K9/0061 , G06K9/00838
摘要： The visual line estimating apparatus 200 comprises: an image inputting section 201 operable to take an image of a human; a visual line measurement section 202 operable to measure a direction of a visual line on the basis of the taken image; a visual line measuring result storing section 211 operable to store therein visual line measuring results previously measured; a representative value extracting section 212 operable to extract a previous representative value; and a visual line determining section 213 operable to judge whether or not a difference between the representative value and the visual line measuring result is lower than a predetermined threshold to determine a visual line estimating result from the representative value and the visual line measuring result.
摘要翻译：视线估计装置200包括：图像输入部201，用于拍摄人的图像; 视线测量部分202，可操作以基于所拍摄的图像测量视线的方向; 可视线测量结果存储部分211，用于存储先前测量的可视线测量结果; 代表值提取部212，用于提取先前的代表值; 以及视线确定部分213，其可操作以判断代表值和视线测量结果之间的差是否低于预定阈值，以根据代表值和视线测量结果确定视线估计结果。

10. 发明申请

US20120050516A1 PUPIL DETECTION DEVICE AND PUPIL DETECTION METHOD 有权
标题翻译： PUPIL检测装置和检测方法
公开(公告)号：US20120050516A1
公开(公告)日：2012-03-01
申请号：US13318431
申请日：2011-01-24
申请人： Sotaru Tsukizawa , Kenji Oka
发明人： Sotaru Tsukizawa , Kenji Oka
IPC分类号： H04N7/18
CPC分类号： G06K9/00604
摘要： A pupil detection apparatus and pupil detection method are provided that enable a high-accuracy detection result to be selected and output even when a gray scale image using near-infrared light is used. In a pupil detection apparatus (100), based on a calculated value of red-eye occurrence intensity that is relative brightness of brightness within a first pupil image detected by a pupil detection section (103) with respect to brightness of a peripheral image outside the first pupil image, and a correlation characteristic of red-eye occurrence intensity and a pupil detection accuracy value, a switching determination section (105) selectively outputs a detection result of the first pupil image or a detection result of a second pupil image detected by a pupil detection section (104). The pupil detection apparatus (100) has a first imaging pair comprising an imaging section (111) and an illumination section (112) separated by separation distance d1, and a second imaging pair whose separation distance d2 is greater than that of the first imaging pair. One pupil detection section (103) uses an image captured by the first imaging pair, and the other pupil detection section (104) uses an image captured by the second imaging pair.
摘要翻译：提供了一种瞳孔检测装置和光瞳检测方法，即使当使用使用近红外光的灰度图像时，也能够选择和输出高精度检测结果。在瞳孔检测装置（100）中，基于由瞳孔检测部（103）检测出的第一瞳孔图像内的亮度相对亮度相对于外部图像外的周边图像的亮度的红眼发生强度的计算值第一光瞳图像以及红眼发生强度和瞳孔检测精度值的相关特性，切换判定部（105）选择性地输出第一瞳孔图像的检测结果或由第二瞳孔图像检测到的第二瞳孔图像的检测结果瞳孔检测部（104）。瞳孔检测装置（100）具有第一成像对，其包括成像部（111）和以分离距离d1分隔开的照明部（112），以及第二成像对，其间隔距离d2大于第一成像对。一个光瞳检测部（103）使用由第一成像对拍摄的图像，另一光瞳检测部（104）使用由第二成像对拍摄的图像。

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