专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20060106555A1 Method for using an alternate performance test to reduce test time and improve manufacturing yield 审中-公开
标题翻译：使用替代性能测试来减少测试时间并提高制造产量的方法
公开(公告)号：US20060106555A1
公开(公告)日：2006-05-18
申请号：US11303406
申请日：2005-12-16
申请人： Ram Voorakaranam , Abhijit Chatterjee , Sasikumar Cherubal , David Majernik
发明人： Ram Voorakaranam , Abhijit Chatterjee , Sasikumar Cherubal , David Majernik
IPC分类号： G06F19/00
CPC分类号： G01R31/2831
摘要： A method for using an alternate performance test to reduce test time and improve manufacturing yield. The method comprises establishing a specification test limit within which a product would be accepted under specification test criteria and inner and outer alternate test error bounds relative to the specification test limit; initially testing the product with the alternate test; accepting the product if the alternate test result is within the inner alternate test error bound; rejecting the product if the alternate test result is outside the outer alternate test error bound; and retesting the product using the specification test if the alternate test result is on or between the alternate error bounds. On retesting, the product is ordinarily rejected if the specification test result is outside the specification test limits. The method may further comprise modifying a production test to produce a specification test whose guardband is narrower than the production test. The alternate test may provide a reduction of test time from that required by the specification test, and may be a signature test. The method can be used where the acceptability parameter value distribution for the product is peaked, and the specification test has upper and lower test limits.
摘要翻译：一种使用替代性能测试来减少测试时间并提高制造产量的方法。该方法包括建立规范测试极限，在规范测试标准范围内接受产品，在相对于规范测试极限的情况下，内外替代测试误差范围; 首先用替代测试测试产品; 如果替代测试结果在内部替代测试误差范围内，则接受产品; 如果替代测试结果在外部替代测试误差界限之外，则拒绝产品; 并且如果备用测试结果在备用误差范围之间或之间，则使用规范测试重新测试产品。在重新测试时，如果规格测试结果超出规格测试限制，则产品通常被拒绝。该方法还可以包括修改生产测试以产生其保护带窄于生产测试的规格测试。替代测试可以提供从规范测试所要求的测试时间的减少，并且可以是签名测试。该方法可用于产品可接受参数值分布达到峰值，规格试验具有上限和下限。

2. 发明授权

US06964004B2 Method and apparatus for testing a system-on-a-chip 失效
标题翻译：用于测试片上系统的方法和装置
公开(公告)号：US06964004B2
公开(公告)日：2005-11-08
申请号：US10280543
申请日：2002-10-24
申请人： Abhijit Chatterjee , Dave Majernik , Sasikumar Cherubal , Sudip Chakrabarti , Ramakrishna Voorakaranam , Jacob A. Abraham , Douglas Goodman
发明人： Abhijit Chatterjee , Dave Majernik , Sasikumar Cherubal , Sudip Chakrabarti , Ramakrishna Voorakaranam , Jacob A. Abraham , Douglas Goodman
IPC分类号： G01R31/3167 , G01R31/3185 , G01R31/28
CPC分类号： G01R31/318505 , G01R31/3167
摘要： A method for testing a system on a chip or a system on a package (““SOPC”) having a plurality of internal modules that are tested to determine whether predetermined performance specifications are satisfied. A first module of the SOPC is selected for testing. A determination is made as to whether the first module is directly accessible or not. If the first module is directly accessible, the module may be tested with automated test equipment external to the SOPC. If the first module is not directly accessible, the module may be tested with a second and third module of the SOPC.
摘要翻译：一种用于测试芯片上的系统或者具有多个内部模块的封装上的系统（“SOPC”）的方法，所述多个内部模块被测试以确定是否满足预定的性能规范。选择SOPC的第一模块进行测试。确定第一模块是否可直接访问，如果第一模块可直接访问，则可以使用SOPC外部的自动测试设备对模块进行测试，如果第一模块不可直接访问，则模块可以用SOPC的第二和第三个模块进行测试。

3. 发明授权

US07006939B2 Method and apparatus for low cost signature testing for analog and RF circuits 失效
公开(公告)号：US07006939B2
公开(公告)日：2006-02-28
申请号：US09837887
申请日：2001-04-18
申请人： Ram Voorakaranam , Abhijit Chatterjee , Pramodchandran N. Variyam , Sasikumar Cherubal , Alfred V. Gomes
发明人： Ram Voorakaranam , Abhijit Chatterjee , Pramodchandran N. Variyam , Sasikumar Cherubal , Alfred V. Gomes
IPC分类号： G06F11/263
CPC分类号： G01R31/2837
摘要： A low cost signature test for RF and analog circuits. A model is provided to predict one or more performance parameters characterizing a first electronic circuit produced by a manufacturing process subject to process variation from the output of one or more second electronic circuits produced by the same process in response to a selected test stimulus, and iteratively varying the test stimulus to minimize the error between the predicted performance parameters and corresponding measured values for the performance parameters, for determining an optimized test stimulus. A non-linear model is preferably constructed for relating signature test results employing the optimized test stimulus in manufacturing testing to circuit performance parameters.

4. 发明授权

US06625785B2 Method for diagnosing process parameter variations from measurements in analog circuits 失效
公开(公告)号：US06625785B2
公开(公告)日：2003-09-23
申请号：US09838404
申请日：2001-04-19
申请人： Abhijit Chatterjee , Sasikumar Cherubal
发明人： Abhijit Chatterjee , Sasikumar Cherubal
IPC分类号： G06F1750
CPC分类号： H01L22/20 , G06F17/5036 , G06F2217/10
摘要： A method for diagnosing process parameter variations from measurements in analog circuits. The diagnosability conditions for the accurate computation of device parameters are extended in the presence of measurement noise. In case this diagnosability condition is not met by standard test signals, a method is provided for automatically generating optimized tests that enable the computation of device parameters. The test generator explicitly optimizes the ability to compute device parameters from the test response. A cause-effect analysis engine is provided to diagnose the cause of variation in IC performance metrics in terms of the variation in device parameter values. Once the cause of parametric yield loss is diagnosed in terms of device parameters variations, the information can be used by process engineers to tune the manufacturing process to improve yield.

5. 发明授权

US06476741B2 Method and system for making optimal estimates of linearity metrics of analog-to-digital converters 失效
标题翻译：用于对模拟 - 数字转换器进行线性度量的最佳估计的方法和系统
公开(公告)号：US06476741B2
公开(公告)日：2002-11-05
申请号：US09838359
申请日：2001-04-19
申请人： Sasikumar Cherubal , Abhijit Chatterjee
发明人： Sasikumar Cherubal , Abhijit Chatterjee
IPC分类号： H03M110
CPC分类号： H03M1/109 , H03M1/12
摘要： A method and system for making optimal estimates of linearity metrics of analog-to-digital converters. A model building phase and a production test strategy are employed. During the model-building phase, a linear model an analog-to-digital converter is constructed from a set of accurately measured transition code voltages for a set of training analog-to-digital converters. During a production test of an individual analog-to-digital converter, a ramp test signal is applied to the individual analog-to-digital converter, a histogram of codes is produced, and the transition code voltages for the individual analog-to-digital converter are estimated from the resulting histogram. Linearity characteristics of the individual analog-to-digital converter may then be computed.
摘要翻译：一种用于对模数转换器的线性度量进行最佳估计的方法和系统。采用模型建立阶段和生产测试策略。在模型构建阶段期间，模拟 - 数字转换器的线性模型由一组训练模数转换器的一组准确测量的转换代码电压构成。在单个模拟 - 数字转换器的生产测试期间，斜坡测试信号被施加到单个模数转换器，产生代码直方图，并且针对各个模数转换器的转换代码电压转换器根据最终的直方图进行估计。然后可以计算各个模拟 - 数字转换器的线性特性。

6. 发明申请

US20160099683A1 AMPLIFIER HAVING ORTHOGONAL TUNING ELEMENTS 有权
标题翻译：具有正交调谐元件的放大器
公开(公告)号：US20160099683A1
公开(公告)日：2016-04-07
申请号：US13831192
申请日：2013-03-14
申请人： Shreyas Sen , Abhijit Chatterjee
发明人： Shreyas Sen , Abhijit Chatterjee
IPC分类号： H03F1/02 , H03F3/193
CPC分类号： H03F3/193 , H03F1/0261 , H03F1/3205 , H03F2200/294 , H03F2200/451
摘要： An amplifier having orthogonal tuning elements is provided. In one embodiment, an amplifier comprises an input amplifier stage having a first tuning element used to control a first performance criteria of the amplifier; an output amplifier stage operatively coupled to the first amplifier stage; a bias circuit operatively coupled to the second amplifier stage and having a second tuning element used to control a second performance criteria of the amplifier; and wherein the first tuning element operates substantially independent of the second tuning element.
摘要翻译：提供具有正交调谐元件的放大器。在一个实施例中，放大器包括具有用于控制放大器的第一性能标准的第一调谐元件的输入放大器级; 可操作地耦合到第一放大器级的输出放大器级; 偏置电路，可操作地耦合到第二放大器级，并具有用于控制放大器的第二性能标准的第二调谐元件; 并且其中所述第一调谐元件基本上独立于所述第二调谐元件工作。

7. 发明授权

US08983390B2 Power conscious self-healing transceiver systems and methods 有权
标题翻译：电力意识自愈收发器系统和方法
公开(公告)号：US08983390B2
公开(公告)日：2015-03-17
申请号：US13109506
申请日：2011-05-17
申请人： Abhijit Chatterjee , Shreyas Sen , Shyam Kumar Devarakond , Vishwanath Natarajan
发明人： Abhijit Chatterjee , Shreyas Sen , Shyam Kumar Devarakond , Vishwanath Natarajan
IPC分类号： H04B17/00 , H04B1/40 , H04B1/00
CPC分类号： H04B1/0003
摘要： The various embodiments of the present disclosure relate generally to power-conscious self-healing transceiver systems and methods. An embodiment of the present invention provides a method of power-consciously self-healing a transceiver system. The method comprises providing a transceiver device having a plurality of tuning elements configured to control a plurality of specifications of the device, determining initial values for the plurality of tuning elements, and performing a hardware-iterative gradient search to obtain values for each tuning element such that the plurality of specifications are within a tolerated range.
摘要翻译：本公开的各种实施例总体上涉及功率意识的自愈收发器系统和方法。本发明的一个实施例提供了一种有能力自愈自愈收发机系统的方法。该方法包括提供收发器设备，其具有被配置为控制设备的多个规格的多个调谐元件，确定多个调谐元件的初始值，以及执行硬件迭代梯度搜索以获得每个调谐元件的值，如多个规格在允许的范围内。

8. 发明申请

US20100240709A1 Sulfoximine Derivatives as p38 MAP Kinase Inhibitors 审中-公开
标题翻译：磺酰亚胺衍生物作为p38 MAP激酶抑制剂
公开(公告)号：US20100240709A1
公开(公告)日：2010-09-23
申请号：US12086282
申请日：2006-12-11
申请人： Shanker Jayram Shetty , Gautam D. Patel , Braj Bhushan Lohray , Vidya Bhushan Lohray , Ganes Chakrabarti , Abhijit Chatterjee , Mukul R. Jain , Pankaj Ramanbhai Patel
发明人： Shanker Jayram Shetty , Gautam D. Patel , Braj Bhushan Lohray , Vidya Bhushan Lohray , Ganes Chakrabarti , Abhijit Chatterjee , Mukul R. Jain , Pankaj Ramanbhai Patel
IPC分类号： A61K31/4439 , C07D417/04 , C07D417/14 , A61P29/00
CPC分类号： C07D417/04
摘要： The present invention relates to novel compounds of general formula (I), their regioisomers, tautomeric forms, novel intermediates involved in their synthesis, their pharmaceutically acceptable salts and pharmaceutical compositions containing them. The present invention also relates to a process of preparing compounds of general formula (I), their regioisomers, their tautomeric forms, their pharmaceutically acceptable salts pharmaceutical compositions containing them, and novel intermediates involved in their synthesis.
摘要翻译：本发明涉及通式（I）的新型化合物，其区域异构体，互变异构形式，涉及其合成的新中间体，其药学上可接受的盐和含有它们的药物组合物。本发明还涉及制备通式（I）的化合物，其区域异构体，其互变异构形式，其药学上可接受的盐含有它们的药物组合物和涉及其合成的新中间体的方法。

9. 发明授权

US07756663B2 Self-calibration systems and methods 失效
标题翻译：自校准系统和方法
公开(公告)号：US07756663B2
公开(公告)日：2010-07-13
申请号：US11475684
申请日：2006-06-27
申请人： Dong Hoon Han , Abhijit Chatterjee , Selim Sermet Akbay , Soumendu Bhattacharya , William R. Eisenstadt
发明人： Dong Hoon Han , Abhijit Chatterjee , Selim Sermet Akbay , Soumendu Bhattacharya , William R. Eisenstadt
IPC分类号： G01R35/00 , G01D18/00 , G01P21/00
CPC分类号： H04B17/21
摘要： Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components.
摘要翻译：描述了自校准系统和方法的各种实施例。一个方法实施例包括对设备内的组件施加替代测试，响应于施加替代测试，提供对应于组件的测试响应，并且基本上同时将每个测试响应映射到相应的规范值组件。

10. 发明授权

US07250882B2 High speed data converter testing devices, methods, & systems 有权
标题翻译：高速数据转换器测试设备，方法和系统
公开(公告)号：US07250882B2
公开(公告)日：2007-07-31
申请号：US11368079
申请日：2006-03-03
申请人： Shalabh Goyal , Abhijit Chatterjee
发明人： Shalabh Goyal , Abhijit Chatterjee
IPC分类号： H03M1/10
CPC分类号： H03M1/1095 , H03M1/12
摘要： Devices and methods to test high speed analog-to-digital and digital-to-analog signal converters are provided. According to one embodiment, a testing device can comprise an output, a mixer, and an input. The output can provide a signal, and the mixer can receive the signal and provide a test signal to a data converter having a sampling frequency. The test signal can be spectrally impure. The input can sample the data converter output at a frequency less the sampling frequency so that the data converter output is under sampled. According to another embodiment, a first set of data converters are tested to obtain a mapping function that relates dynamic specifications to device signatures. Then a second set of data converters can be tested and based on their device signatures mapped with the mapping function, dynamic specifications for the second set of data converters can be obtained. Other embodiments are also claimed and described.
摘要翻译：提供了测试高速模数和数模转换器的设备和方法。根据一个实施例，测试装置可以包括输出，混频器和输入。输出可以提供信号，并且混频器可以接收信号并向具有采样频率的数据转换器提供测试信号。测试信号可以是光谱不纯的。输入可以采样频率较低的数据转换器输出，以便数据转换器输出采样。根据另一个实施例，测试第一组数据转换器以获得将动态规范与设备签名相关联的映射功能。然后，可以测试第二组数据转换器，并且基于其与映射函数映射的设备签名，可以获得第二组数据转换器的动态规范。还要求保护和描述其它实施例。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式