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1. 发明授权

US08653845B2 Test handler and method for operating the same for testing semiconductor devices 有权
标题翻译：用于测试半导体器件的测试处理器和操作方法
公开(公告)号：US08653845B2
公开(公告)日：2014-02-18
申请号：US13296421
申请日：2011-11-15
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/20
CPC分类号： G01R31/2893 , G01R31/2886
摘要： A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.
摘要翻译：提供了一种测试处理器，其包括测试托盘，至少一个打开单元和位置改变装置。测试盘在其侧面对准多个插入件。每个插件在其上载入至少一个半导体器件。打开单元在测试托盘的一侧的一部分打开插入件。位置改变装置移动至少一个开口单元，使得至少一个开口单元可以位于测试托盘的一侧的另一部分，使得至少一个开口单元可以在所述另一个开口单元处打开插入件测试托盘一侧的一部分。本发明可以根据半导体器件尺寸，生产成本和部件更换时间的变化来减少更换部件的数量。

2. 发明授权

US08523158B2 Opener and buffer table for test handler 有权
标题翻译：打开器和缓冲表用于测试处理程序
公开(公告)号：US08523158B2
公开(公告)日：2013-09-03
申请号：US12666124
申请日：2008-07-02
申请人： Yun-Sung Na , In-Gu Jeon , Seung-Chul Ahn , Dong-Han Kim , Jae-Hyun Son
发明人： Yun-Sung Na , In-Gu Jeon , Seung-Chul Ahn , Dong-Han Kim , Jae-Hyun Son
IPC分类号： B23Q1/64 , B23Q3/00 , B23Q3/02 , B25B1/22 , B25B1/00 , B25B11/00 , G01R31/00 , H01R13/648
CPC分类号： G01R31/2893
摘要： An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.
摘要翻译：公开了用于测试处理器的开启器和缓冲表。开启器包括开口板，多个成对的销块，以及用于保持形成一对的销块之间的间隔的至少一个或多个间隔保持装置。每个销块可移动地联接到开启板，并且包括用于释放将半导体器件保持在承载板中的保持装置的保持状态的打开销。尽管要测试的半导体器件的尺寸被改变，并且因此更换了与半导体器件的载体板，但是开关器不需要更换，从而降低了重置成本和浪费资源。

3. 发明授权

US08333083B2 System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the system 有权
标题翻译：系统支持电子设备的测试，系统的温度控制单元以及控制系统室内温度的方法
公开(公告)号：US08333083B2
公开(公告)日：2012-12-18
申请号：US12400243
申请日：2009-03-09
申请人： Yun-Sung Na , Tae-Hung Ku , Cheul-Gyu Boo
发明人： Yun-Sung Na , Tae-Hung Ku , Cheul-Gyu Boo
IPC分类号： F25D23/12 , F28D15/00 , G01R31/00 , H05K7/20
CPC分类号： G05D23/19 , G01R31/2874
摘要： A system to support the testing of electronic devices and a temperature control unit for the system are disclosed. A temperature controlling method for a chamber of the system is also disclosed. Low or high temperature air is supplied to the inside of the chamber when the electronic devices are tested at low or high temperature. External air is supplied to the inside of the chamber when the electronic devices are tested at room temperature.
摘要翻译：公开了一种支持电子设备测试和系统温度控制单元的系统。还公开了一种用于该系统的室的温度控制方法。当电子设备在低温或高温下进行测试时，将低或高温空气供应到室内。当电子设备在室温下进行测试时，外部空气供应到室内。

4. 发明授权

US08159252B2 Test handler and method for operating the same for testing semiconductor devices 有权
标题翻译：用于测试半导体器件的测试处理器和操作方法
公开(公告)号：US08159252B2
公开(公告)日：2012-04-17
申请号：US12097398
申请日：2007-02-09
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/20
CPC分类号： G01R31/2893 , G01R31/2886
摘要： A test handler and method for operating a test handler for testing semiconductor devices are provided. The test handler includes a test tray located on one side of an opening apparatus in which a plurality of inserts are arrayed, wherein each insert comprises at least one semiconductor device loaded thereon, at least one opening unit for opening inserts at one part of the one side of the test tray, and a position changing apparatus comprises a motor including a driving pulley for moving at least one opening unit along a contact surface of the test tray such that the at least one opening unit changes positions on the test tray and is located at another part of the one side of the test tray in order to open inserts at the other part of the one side of the test tray.
摘要翻译：提供了一种用于操作用于测试半导体器件的测试处理器的测试处理器和方法。测试处理器包括位于打开装置的一侧的测试托盘，其中排列有多个插入件，其中每个插入件包括装载在其上的至少一个半导体器件，至少一个开口单元，用于在一个部分处打开插入件并且位置改变装置包括电动机，其包括用于沿着测试托盘的接触表面移动至少一个开口单元的驱动滑轮，使得至少一个打开单元改变测试托盘上的位置并且位于在测试托盘的一侧的另一部分，以便在测试托盘的一侧的另一部分处打开插入件。

5. 发明申请

US20120056636A1 TEST HANDLER AND METHOD FOR OPERATING THE SAME FOR TESTING SEMICONDUCTOR DEVICES 有权
标题翻译：用于测试半导体器件的测试操作器及其操作方法
公开(公告)号：US20120056636A1
公开(公告)日：2012-03-08
申请号：US13296421
申请日：2011-11-15
申请人： Jae-Gyun SHIM , Yun-Sung Na , In-Gu JEON , Tae-Hung KU , Dong-Han KIM
发明人： Jae-Gyun SHIM , Yun-Sung Na , In-Gu JEON , Tae-Hung KU , Dong-Han KIM
IPC分类号： G01R31/26
CPC分类号： G01R31/2893 , G01R31/2886
摘要： A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.
摘要翻译：提供了一种测试处理器，其包括测试托盘，至少一个打开单元和位置改变装置。测试盘在其侧面对准多个插入件。每个插件在其上载入至少一个半导体器件。打开单元在测试托盘的一侧的一部分打开插入件。位置改变装置移动至少一个开口单元，使得至少一个开口单元可以位于测试托盘的一侧的另一部分，使得至少一个开口单元可以在所述另一个开口单元处打开插入件测试托盘一侧的一部分。本发明可以根据半导体器件尺寸，生产成本和部件更换时间的变化来减少更换部件的数量。

6. 发明授权

US08058890B2 Test Handler 有权
标题翻译：测试处理程序
公开(公告)号：US08058890B2
公开(公告)日：2011-11-15
申请号：US13033262
申请日：2011-02-23
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
IPC分类号： G01R31/20
CPC分类号： H01L21/67745 , G01R31/2893 , H01L21/67271 , H01L21/67778
摘要： A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in a horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.
摘要翻译：公开了一种测试处理程序。测试处理器包括用于传送用户托盘的第一至第三传送，以及适于分别在水平方向上移动第一至第三传送的第一至第三水平移动单元。第一至第三水平移动单元独立地操作，使得第一至第三传送中的每一个可以独立地执行水平移动。第一至第三传送中的每一个基于其先前分配的功能执行，从而提高设备的测试处理速度。

7. 发明授权

US07923989B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US07923989B2
公开(公告)日：2011-04-12
申请号：US12170680
申请日：2008-07-10
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： G01R31/28
CPC分类号： G01R31/2893
摘要： A test handler includes a loading unit for loading semiconductor devices from customer trays onto a test tray; a test chamber for performing a test for the semiconductor devices loaded on the test tray; a pushing unit having at least one pushing member for pushing the test tray located in the test chamber to be tested, and a press unit for operating the pushing member; a position control unit for adjusting a position of the pushing member to compensate a deviation between the pushing member and the test tray due to a thermal expansion or contraction of any one of the pushing member and the test tray; and an unloading unit for unloading the semiconductor devices loaded on the test tray onto the customer trays after a test for the semiconductor devices is completed.
摘要翻译：测试处理器包括用于将半导体器件从客户托盘加载到测试托盘上的加载单元; 测试室，用于对装载在测试盘上的半导体器件进行测试; 推动单元，具有至少一个用于推动位于待测试的测试室中的测试托盘的推动构件和用于操作推动构件的按压单元; 位置控制单元，用于调节推动构件的位置，以补偿推动构件和测试托盘之间由于推动构件和测试托盘中的任一个的热膨胀或收缩而产生的偏差; 以及卸载单元，用于在半导体器件的测试完成之后，将装载在测试托盘上的半导体器件卸载到客户托盘上。

8. 发明申请

US20100097089A1 Test Handler and Loading Method Thereof 有权
标题翻译：测试处理器及其装载方法
公开(公告)号：US20100097089A1
公开(公告)日：2010-04-22
申请号：US12634900
申请日：2009-12-10
申请人： Jae-Gyun SHIM , Yun-Sung NA , In-Gu JEON , Tae-Hung KU , Hyun-Jun YOO
发明人： Jae-Gyun SHIM , Yun-Sung NA , In-Gu JEON , Tae-Hung KU , Hyun-Jun YOO
IPC分类号： G01R31/26 , G01N1/00
CPC分类号： G01R31/2893 , G01R31/2867
摘要： When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.
摘要翻译：当测试处理器将用户托盘的半导体器件加载到测试托盘上时，测试处理器调整半导体器件之间的前/后间距或右/左间距，调整右/左节距或前/后间距，以及负载半导体器件。测试处理器可以分别顺序地调节半导体器件之间的前/后间距和右/左间距，从而减少设备重量和加载时间。

9. 发明申请

US20100019790A1 TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE 有权
标题翻译：具有尺寸可变测试点的测试操作员
公开(公告)号：US20100019790A1
公开(公告)日：2010-01-28
申请号：US12574395
申请日：2009-10-06
申请人： JAE GYUN SHIM , Yun Sung Na , In Gu Jeon
发明人： JAE GYUN SHIM , Yun Sung Na , In Gu Jeon
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/2893
摘要： A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of M×N array (where M and N represent an integer greater than a value of =), a cover (170) detachably fixed to the main body t close a part of the window and convert the window into the test site having a size corresponding to a [M−A)×(n−B)] Hi-Fix board (where A is an integer equal to or greater than 0 but smaller than M, and B is an integer having a value other than 0). In the test handler, the size of window is easily modified to adapt that of the Hi-Fix board of M×N array by closing or opening a part of the window using the cover. Therefore, the test handler is capable of applying Hi-Fix boards having different sizes.
摘要翻译：本发明的测试处理器（122）包括主体，窗体（142），其形成在主体的表面上并且具有与MxN阵列的Hi-Fix板相对应的尺寸（其中M和N表示整数大于值=），可拆卸地固定到主体t的盖子（170）将窗口的一部分关闭并将窗口转换成具有对应于[MA] x（nB）] Hi- 修正板（其中A为等于或大于0但小于M的整数，B为0以外的整数）。在测试处理程序中，通过使用盖子关闭或打开窗口的一部分，可以轻松修改窗口的大小以适应MxN阵列的Hi-Fix板。因此，测试处理机能够应用具有不同尺寸的Hi-Fix板。

10. 发明申请

US20100001753A1 Position changing apparatus for test handler and power transferring apparatus 有权
标题翻译：用于测试处理器和动力传送装置的位置改变装置
公开(公告)号：US20100001753A1
公开(公告)日：2010-01-07
申请号：US12385790
申请日：2009-04-20
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/26 , G01R1/04
CPC分类号： G01R31/2867
摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.
摘要翻译：公开了一种测试处理程序。用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

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