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1. 发明授权

US06967495B2 Dynamic burn-in apparatus and adapter card for dynamic burn-in apparatus 失效
标题翻译：动态老化装置和动态老化装置适配卡
公开(公告)号：US06967495B2
公开(公告)日：2005-11-22
申请号：US10945839
申请日：2004-09-21
申请人： Yoshihiro Maesaki , Hiroshi Teshigawara , Sadao Ishihara , Yukio Tabuchi
发明人： Yoshihiro Maesaki , Hiroshi Teshigawara , Sadao Ishihara , Yukio Tabuchi
IPC分类号： G01R31/26 , G01R31/02 , G01R31/28 , G01R31/30
CPC分类号： G01R31/2879 , G01R31/2863
摘要： In an adapter card, is a clock signal converting circuit converts a clock signal, output from a signal generator of a burn-in apparatus, from a lower—to a higher-frequency clock signal. Plural delay circuits synchronize each burn-in signal output from the signal generator with the clock signal. A connector of an adapter is connected between a burn-in card and a connector mounted in a burn-in chamber, to burn in a semiconductor device mounted on the burn-in card. The output of the signal generator is fed into the adapter card via its connector, and the output of the adapter card is supplied to the semiconductor device mounted on the burn-in card to burn in the semiconductor device.
摘要翻译：在适配器卡中，时钟信号转换电路将从老化装置的信号发生器输出的时钟信号从低频到高频时钟信号转换。多个延迟电路将信号发生器输出的每个老化信号与时钟信号同步。适配器的连接器连接在老化卡和安装在老化室中的连接器之间，以便在安装在老化卡上的半导体器件中燃烧。信号发生器的输出通过其连接器馈送到适配器卡中，并且适配器卡的输出被提供给安装在老化卡上的半导体器件以在半导体器件中燃烧。

2. 发明授权

US07023228B2 Dynamic burn-in method and apparatus 失效
标题翻译：动态老化方法和装置
公开(公告)号：US07023228B2
公开(公告)日：2006-04-04
申请号：US10796035
申请日：2004-03-10
申请人： Yoshihiro Maesaki , Hiroshi Teshigawara
发明人： Yoshihiro Maesaki , Hiroshi Teshigawara
IPC分类号： G01R31/26
CPC分类号： G01R31/2879 , G01R31/287
摘要： In a dynamic burn-in apparatus wherein a signal output from a signal generator is input to a semiconductor device to be tested in the burn-in tank, a converter is arranged at the output of the signal generator. The converter increases, by N times, the frequency of the signal output from a signal generator. The signal having the increased frequency and output from the converter, is input to the semiconductor device to be tested in the burn-in tank when the burn-in is operated at high-speed. The frequency of the signal is converted to the higher frequency, and the signal having the higher frequency is provided to the semiconductor device. As the result, the burn-in can be done in a shorter time for a high-speed sophisticated semiconductor device.
摘要翻译：在动态老化装置中，从信号发生器输出的信号输入到要在老化槽中进行测试的半导体器件，在信号发生器的输出端设置转换器。转换器将从信号发生器输出的信号的频率增加N倍。具有增加的频率和来自转换器的输出的信号被输入到在老化操作高速时在老化槽中进行测试的半导体器件。信号的频率被转换为较高的频率，并且具有较高频率的信号被提供给半导体器件。结果，可以在更短的时间内为高速复杂的半导体器件进行老化。

3. 发明申请

US20050099197A1 Dynamic burn-in apparatus and adapter card for dynamic burn-in apparatus 失效
标题翻译：动态老化装置和动态老化装置适配卡
公开(公告)号：US20050099197A1
公开(公告)日：2005-05-12
申请号：US10945839
申请日：2004-09-21
申请人： Yoshihiro Maesaki , Hiroshi Teshigawara , Sadao Ishihara , Yukio Tabuchi
发明人： Yoshihiro Maesaki , Hiroshi Teshigawara , Sadao Ishihara , Yukio Tabuchi
IPC分类号： G01R31/26 , G01R31/02 , G01R31/28 , G01R31/30
CPC分类号： G01R31/2879 , G01R31/2863
摘要： An adapter card is provided which comprises: a clock signal converting circuit (1) which converts a clock signal, output from a signal generator contained in a burn-in apparatus, into a higher-frequency clock signal; and a plurality of delay circuits (2) for causing each burn-in signal output from the signal generator to synchronize with the clock signal, wherein a connector (4) of the adapter (10) is connected between a burn-in card and a connector mounted in a burn-in chamber, to burn in a semiconductor device mounted on the burn-in card. Alternatively, the input connector (4) of the adapter card (10) is connected to a connector mounted, for example, on the rear side of a back board of the burn-in apparatus; then, the output of the signal generator is fed into the adapter card via its connector (4), and the output of the adapter card (10) is supplied to the semiconductor device mounted on the burn-in card to burn in the semiconductor device.
摘要翻译：提供了一种适配器卡，包括：时钟信号转换电路（1），其将从老化装置中包含的信号发生器输出的时钟信号转换成高频时钟信号; 以及用于使从所述信号发生器输出的每个老化信号与所述时钟信号同步的多个延迟电路（2），其中所述适配器（10）的连接器（4）连接在老化卡和连接器安装在老化室中，在安装在老化卡上的半导体器件中燃烧。或者，适配器卡（10）的输入连接器（4）连接到例如安装在老化装置的背板的后侧的连接器; 然后，信号发生器的输出通过其连接器（4）馈送到适配器卡中，并且适配器卡（10）的输出被提供给安装在老化卡上的半导体器件，以在半导体器件中燃烧。

4. 发明申请

US20090287362A1 MONITORED BURN-IN TEST APPARATUS AND MONITORED BURN-IN TEST METHOD 审中-公开
标题翻译：监测烧灼试验装置和监测烧灼试验方法
公开(公告)号：US20090287362A1
公开(公告)日：2009-11-19
申请号：US12533504
申请日：2009-07-31
申请人： Yoshihiro MAESAKI , Hiroshi TESHIGAWARA , Yukihiko KODAIRA , Naoe SEKIGUCHI
发明人： Yoshihiro MAESAKI , Hiroshi TESHIGAWARA , Yukihiko KODAIRA , Naoe SEKIGUCHI
IPC分类号： G05D23/19 , G11C29/00 , G11C7/00
CPC分类号： G11C29/08 , G01R31/287 , G01R31/2875 , G01R31/319 , G11C29/06 , G11C29/56 , G11C29/56016
摘要： A monitored burn-in test method includes: subjecting an element set, including elements, to a writing process for writing data into each of the elements, the elements requiring a refresh process; subjecting the element set to the refresh process after the writing process; and interrupting the refresh process for a selected one or ones of the elements, when instructions for readout of data are supplied to the selected one or ones during the refresh process, and subjecting the selected one or ones to a readout process in accordance with the instructions.
摘要翻译：所监视的老化测试方法包括：对包括元素的元素集进行写入处理，以将数据写入每个元素，所述元素需要刷新处理; 在写入处理之后对元件进行刷新处理; 以及当在所述刷新过程期间将所述数据读取指令提供给所选择的一个或多个指令时，对所选择的一个或多个元件进行所述刷新处理，并且根据所述指令对所选择的一个或一个进行读出处理。

5. 发明授权

US07023229B2 Dynamic burn-in equipment 失效
标题翻译：动态老化设备
公开(公告)号：US07023229B2
公开(公告)日：2006-04-04
申请号：US10869966
申请日：2004-06-18
申请人： Yoshihiro Maesaki , Hiroshi Teshigawara
发明人： Yoshihiro Maesaki , Hiroshi Teshigawara
IPC分类号： G01R31/302 , G01R31/26
CPC分类号： G01R31/2874 , G01R31/2862
摘要： An infrared sensor is provided in a burn-in chamber. The surface temperatures of two or more semiconductor devices are measured by the sensor. A control unit calculates the internal temperatures of the semiconductor devices based on the thermal resistance values of the semiconductor device packages and controls the temperature inside the burn-in chamber so that the average of the internal temperatures is brought to a desired temperature by using a temperature controller. Further, an acceleration coefficient is obtained based on the internal temperatures, a burn-in time is determined based on the acceleration coefficient and a preliminarily given accelerated period, and a burn-in acceleration test is conducted. Moreover, when a defective semiconductor is found, the defective portion of the defective semiconductor device is specified based on the surface temperature distribution of the semiconductor device measured by the infrared sensor.
摘要翻译：红外传感器设置在老化室内。两个或多个半导体器件的表面温度由传感器测量。控制单元基于半导体器件封装的热阻值来计算半导体器件的内部温度，并控制老化室内部的温度，使得内部温度的平均值通过使用温度控制器。此外，基于内部温度获得加速系数，基于加速系数和预先给定的加速时间来确定老化时间，进行老化加速试验。此外，当发现有缺陷的半导体时，基于由红外传感器测量的半导体器件的表面温度分布来指定缺陷半导体器件的缺陷部分。

6. 发明授权

US6161117A Waveform generation device and method 失效
标题翻译：波形发生装置及方法
公开(公告)号：US6161117A
公开(公告)日：2000-12-12
申请号：US112446
申请日：1998-07-09
申请人： Yoshihiro Maesaki , Hiroshi Teshigawara
发明人： Yoshihiro Maesaki , Hiroshi Teshigawara
IPC分类号： G11C11/407 , G06F1/025 , G11C11/401 , G11C29/06 , G11C29/10 , G11C29/50 , G06F1/02
CPC分类号： G11C29/50 , G06F1/025 , G11C11/401
摘要： A waveform pattern file storage section is used for specifying a waveform pattern of a control signal, and storing waveform pattern bit strings formed from bits each of which specifies 1 logical state (an NRZ waveform). A waveform input section reads out the waveform pattern bit string. A waveform recognition section recognizes 1 cycle waveform pattern consisting of 3 consecutive bits in the waveform pattern bit string that has been read out. As a result, if an RZ waveform pattern has been recognized, an RZ waveform is generated with respect to the RZ waveform section; if an NRZ waveform pattern is recognized, an NRZ waveform is generated with respect to the NRZ waveform section.
摘要翻译：波形图案文件存储部分用于指定控制信号的波形图案，并且存储由每个指定1个逻辑状态（NRZ波形）的位形成的波形图形位串。波形输入部分读出波形图案位串。波形识别部分识别已经读出的波形图案位串中的3个连续位组成的1个周期波形模式。结果，如果已经识别到RZ波形图案，则相对于RZ波形部分产生RZ波形; 如果识别到NRZ波形图案，则NRZ波形相对于NRZ波形部分产生。

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