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    • 6. 发明授权
    • Testboard for IC tester
    • IC测试仪测试板
    • US5994894A
    • 1999-11-30
    • US897110
    • 1997-07-18
    • Yoshihiro Fujita
    • Yoshihiro Fujita
    • G01R31/26G01R31/28G01R31/02
    • G01R31/2886G01R31/2889
    • This testboard for an IC tester comprises second connector 4, housing 7, cable 9, and socket board 12; and second connector 4 is mounted on base card 5 and engages first connectors 3 of a plurality of pincards 1. Housing 7 is mounted on base card 5 on the opposite side to second connector 4, holds third connector 8 which is fitted into second connector 4, while being arranged orthogonally to the above-mentioned plurality of pincards 1; and there is one housing 7 for each device 14 being tested. Cable 9 is connected to third connector 8 of housing 7 and to fourth connector 10 at the socket board 12 end. Fifth connector 11 which engages fourth connector 10 and IC socket 13 for the above-mentioned device 14 being tested are mounted on socket board 12.
    • 用于IC测试器的该测试板包括第二连接器4,壳体7,电缆9和插座板12; 并且第二连接器4安装在基卡5上并与多个卡扣1的第一连接器3接合。外壳7在与第二连接器4相反的一侧上的基卡5上安装,并保持装配到第二连接器4中的第三连接器8 同时正交配置在上述多个卡扣1上; 并且每个被测试的设备14都有一个外壳7。 电缆9连接到壳体7的第三连接器8,并且在插座板12端连接到第四连接器10。 与第四连接器10接合的第五连接器11和被测试的上述装置14的IC插座13安装在插座板12上。