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    • 1. 发明授权
    • Electrically erasable read only memory
    • 电可擦除只读存储器
    • US4257056A
    • 1981-03-17
    • US52595
    • 1979-06-27
    • Ying K. Shum
    • Ying K. Shum
    • H01L29/788H01L29/78G11C11/34H01L29/04H01L29/34
    • H01L29/7885H01L29/7883
    • An electrically erasable floating gate storage cell (EPROM) is disclosed which comprises a body of single crystal silicon semiconductor material having a substrate of one conductivity type, a source region and a drain region each of a second conductivity type, a channel region of the first conductivity type connecting the source region and drain region, a polycrystalline silicon layer conductively connected to either the source region or the drain region, a conductive insulated floating gate which partially overlies and is separated from the polycrystalline silicon layer by a layer of silicon dioxide and a control gate which overlies and is separated from the floating gate by a layer of silicon dioxide. Fowler-Nordheim tunneling current occurs between the polycrystalline layer and the floating gate during programming and erasing of the EPROM. The floating gate influences the conductivity of the channel region in accordance with the charge stored thereon during programming. The control gate is oriented over the entire channel region to control the conductivity of the channel region in accordance with voltages applied thereto during operation of the EPROM.
    • 公开了一种电可擦除浮动存储单元(EPROM),其包括具有一种导电类型的衬底的单晶硅半导体材料体,第二导​​电类型的源极区和漏极区,第一导电类型的沟道区 连接源极区域和漏极区域的导电类型,与源极区域或漏极区域导电连接的多晶硅层,部分覆盖并通过二氧化硅层和多晶硅层与多晶硅层分离的导电绝缘浮栅,以及 控制栅极覆盖并通过一层二氧化硅与浮动栅极分离。 在EPROM的编程和擦除期间,Fowler-Nordheim隧穿电流发生在多晶层和浮栅之间。 浮动栅极根据编程期间存储的电荷影响沟道区的导电性。 控制栅极定向在整个通道区域上,以在EPROM的操作期间根据施加到其上的电压来控制沟道区的导电性。
    • 4. 发明授权
    • Electrically alterable non-volatile memory device
    • 电可变非易失性存储器件
    • US4780750A
    • 1988-10-25
    • US815869
    • 1986-01-03
    • Joseph G. NolanMichael A. Van BuskirkTe-Long ChiuYing K. Shum
    • Joseph G. NolanMichael A. Van BuskirkTe-Long ChiuYing K. Shum
    • H01L21/8247H01L21/8246H01L27/10H01L27/112H01L29/788H01L29/792H01L29/78
    • H01L29/7883
    • In this invention, an Electrically Alterable Non-Volatile Memory (EANOM) cell is disclosed. The EANOM ceil comprises an MOS transistor, having a source, a gate and a drain. The EANOM cell also has a two-terminal tunnel device, one end of which is connected to the gate of the MOS transistor. The other terminal being labelled "T". The tunnel device causes charges to be stored or removed from the gate of the MOS transistor. In a preferred embodiment, a four-terminal EANOM cell is disclosed. The four terminals of the EANOM cell are terminals T, S (source of the MOS transistor), D (drain of the MOS transistor) and a terminal C which is capacitively coupled to the gate of the MOS transistor. The EANOM cell can be used in a memory circuit to increase the reliability thereof. Two or more EANOM cells are connected in tandem and operate simultaneously. Catastrophic failure of one EANOM cell results in an open circuit with the other EANOM cell continuing to function.
    • 在本发明中,公开了电可变非易失性存储器(EANOM)单元。 EANOM ceil包括具有源极,栅极和漏极的MOS晶体管。 EANOM单元还具有两端隧道器件,其一端连接到MOS晶体管的栅极。 另一个终端标记为“T”。 隧道装置使电荷从MOS晶体管的栅极存储或去除。 在优选实施例中,公开了四端子EANOM单元。 EANOM单元的四个端子是端子T,S(MOS晶体管的源极),D(MOS晶体管的漏极)和与MOS晶体管的栅极电容耦合的端子C. EANOM单元可用于存储器电路中以提高其可靠性。 两个或多个EANOM单元串联连接并同时操作。 一个EANOM细胞的灾难性故障导致另一个EANOM细胞继续发挥功能的开路。