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    • 2. 发明申请
    • Semiconductor integrated circuit and method for testing the same
    • US20050201500A1
    • 2005-09-15
    • US10901165
    • 2004-07-29
    • Yasushi Shizuki
    • Yasushi Shizuki
    • G01R31/28G01R31/317H01L21/822H01L27/04H03K5/26H04B1/10H04L7/033
    • G01R31/31716
    • According to the present invention, there is provided a semiconductor integrated circuit having a receiver which receives reception data and executes reception processing on the basis of a clock signal supplied from a PLL and a transmitter which receives parallel transmission data and executes serial transmission processing on the basis of the clock signal, and having a loop back function of supplying data output from the transmitter to the receiver for test, the receiver, as a CDR circuit, executing control so as to make the phase of the input data coincide with that of the recovery clock by a negative feedback loop having a phase comparator which receives input data and a recovery clock, compares a phase of the input data with that of the recovery clock, and outputs recovery data and a phase comparison result in a serial form, a serial/parallel conversion circuit which receives the phase comparison result, or the phase comparison result and the recovery data from the phase comparator, executes serial/parallel conversion, and outputs the phase comparison result in a parallel form, a digital filer which receives the phase comparison result from the serial/parallel conversion circuit, executes averaging processing for the phase comparison result in a predetermined period, and outputs the phase comparison result, a control circuit which receives the phase comparison result from the digital filer and outputs a control signal to control the phase of the recovery clock, and a phase interpolator which receives the clock signal and generates the recovery clock on the basis of the control signal, and the CDR circuit including a signal output circuit which inputs, to one of the control circuit and the digital filer, a signal to forcibly shift the phase of the recovery data in the negative feedback loop by a predetermined amount, a first counter which counts the number of pulses of the signal output from the signal output circuit in a predetermined period and outputs a first count value, a second counter which counts the number of pulses of the phase comparison result, which has undergone the averaging processing and is output from the digital filer, and outputs a second count value, and a signal processing circuit which receives the first count value and the second count value and compares the first count value with the second count value to determine presence/absence of a capability for absorbing the phase shift generated by the signal.
    • 3. 发明授权
    • Semiconductor integrated circuit device with differential output driver circuit, and system for semiconductor integrated circuit device
    • 具有差分输出驱动电路的半导体集成电路器件,以及用于半导体集成电路器件的系统
    • US06801071B1
    • 2004-10-05
    • US10620382
    • 2003-07-17
    • Yasushi Shizuki
    • Yasushi Shizuki
    • H03K1716
    • H03K19/00323H04L25/0272
    • A semiconductor integrated circuit device includes a differential output driver circuit arranged at each I/O portion, and a delay element. The differential output driver circuit receives a pair of differential signals generated by a circuit on the input stage. An output signal from the differential output driver circuit is transmitted through the first and second signal lines. Each of the first and second signal lines includes a global interconnection, bump, and transmission line. The delay element is inserted in at least one of the first and second signal lines. The delay element delays signals passing through the signal lines so as to make the delays of the signals substantially equal to each other, compensating for the signal delay time generated by the line length difference.
    • 半导体集成电路器件包括布置在每个I / O部分的差分输出驱动器电路和延迟元件。 差分输出驱动电路接收由输入级上的电路产生的一对差分信号。 来自差分输出驱动电路的输出信号通过第一和第二信号线传输。 第一和第二信号线中的每一个包括全局互连,凸起和传输线。 延迟元件插入第一和第二信号线中的至少一个。 延迟元件延迟通过信号线的信号,使得信号的延迟基本相等,补偿由线长差产生的信号延迟时间。