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1. 发明授权

US4652814A Circuit testing utilizing data compression and derivative mode vectors 失效
标题翻译：使用数据压缩和导数模式向量的电路测试
公开(公告)号：US4652814A
公开(公告)日：1987-03-24
申请号：US503464
申请日：1983-06-13
申请人： William A. Groves , Matthew L. Snook , Rodney Browen
发明人： William A. Groves , Matthew L. Snook , Rodney Browen
IPC分类号： G01R31/28 , G01R31/317 , G01R31/3183 , G01R31/319 , G01R31/3193 , G06F11/22
CPC分类号： G01R31/318335 , G01R31/2834 , G01R31/31713 , G01R31/318371 , G01R31/31921 , G01R31/31935
摘要： A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.
摘要翻译：提出了一种电路测试器和测试技术，其压缩存储在本地测试数据RAM中的数据量用于实现电路测试，从而减少必须下载到本地测试数据RAM的数据量，从而提高测试吞吐量。衍生数据向量除了作为数据压缩技术的一部分的原始数据向量之外也被使用。通过仅在本地测试数据RAM中存储唯一数据向量并利用定序器来控制使用唯一数据向量的顺序，进一步的压缩。定序器包括能够在测试引脚间接计数器上实现的测试程序逻辑和逻辑。

2. 发明授权

US4785235A Shorts testing technique reducing phantom shorts problems 失效
标题翻译：短裤测试技术减少幻影短裤问题
公开(公告)号：US4785235A
公开(公告)日：1988-11-15
申请号：US169157
申请日：1988-03-08
申请人： T. Michael Hendricks , William A. Groves
发明人： T. Michael Hendricks , William A. Groves
IPC分类号： G01R27/02 , G01R31/02
CPC分类号： G01R27/02 , G01R31/025
摘要： This shorts test method reduces the occurence of phantom shorts and also in those cases where phantom shorts occur, reduces the time required to eliminate the phantom shorts. When an unexpected open or short occurs or when an expected open or short does not occur, the test is repeated either until the phantom result ceases or until a sufficient time has elapsed that the result is real rather than a transient response. Test points are arranged in an order which decreases monotonically with the parallel impedance of all elements connected directly to that test point. This reduces the rate of occurance of phantom shorts caused by parallel inpedances below the shorts threshold even though none of the individual impedances is below the shorts threshold.
摘要翻译：这种短裤测试方法减少了幻影短裤的发生，也减少了幻影短裤发生的情况，减少了消除假想短裤所需的时间。当出现意外的开路或短路时，或者当不发生预期的开路或短路时，重复该测试，直到幻影结果停止，或直到经过足够的时间，结果为真实而不是瞬态响应。测试点按照与直接连接到该测试点的所有元件的并联阻抗单调减小的顺序排列。这样即使没有一个单独的阻抗低于短路阈值，也会降低由短路阈值以下的并联阻抗造成的幻影短路的发生率。

3. 发明授权

US4588945A High throughput circuit tester and test technique avoiding overdriving damage 失效
标题翻译：高通量电路测试仪和测试技术避免过驱动损坏
公开(公告)号：US4588945A
公开(公告)日：1986-05-13
申请号：US503465
申请日：1983-06-13
申请人： William A. Groves , Vance R. Harwood , Thomas R. Fay , Elton C. Bingham , Michael A. Teska
发明人： William A. Groves , Vance R. Harwood , Thomas R. Fay , Elton C. Bingham , Michael A. Teska
IPC分类号： G01R31/26 , G01R31/28 , G01R31/319 , G01R15/12
CPC分类号： G01R31/31915 , G01R31/28
摘要： A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital incircuit test techniques.
摘要翻译：公开了一种方法和装置，用于降低在被测设备处的数字逻辑器件的损坏的可能性，或者使用数字电路测试技术来尝试定位电路组件中的故障时，与被测器件紧密接近。

4. 发明授权

US4642561A Circuit tester having on-the-fly comparison of actual and expected signals on test pins and improved homing capability 失效
标题翻译：电路测试仪具有测试引脚上实际和预期信号的即时比较，并提高了归位能力
公开(公告)号：US4642561A
公开(公告)日：1987-02-10
申请号：US567824
申请日：1984-01-03
申请人： William A. Groves , Matthew L. Snook , Rodney Browen
发明人： William A. Groves , Matthew L. Snook , Rodney Browen
IPC分类号： G01R31/28 , G01R31/317 , G01R31/3183 , G01R31/3193
CPC分类号： G01R31/318335 , G01R31/2834 , G01R31/31713 , G01R31/318371 , G01R31/31935
摘要： A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.
摘要翻译：提出了一种电路测试器和测试技术，其压缩存储在本地测试数据RAM中的数据量用于实现电路测试，从而减少必须下载到本地测试数据RAM的数据量，从而提高测试吞吐量。衍生数据向量除了作为数据压缩技术的一部分的原始数据向量之外也被使用。通过仅在本地测试数据RAM中存储唯一数据向量并利用定序器来控制使用唯一数据向量的顺序，进一步的压缩。定序器包括能够在测试引脚间接计数器上实现的测试程序逻辑和逻辑。

5. 发明授权

US4598245A Circuit tester having indirect counters 失效
标题翻译：具有间接计数器的电路测试仪
公开(公告)号：US4598245A
公开(公告)日：1986-07-01
申请号：US567588
申请日：1984-01-03
申请人： William A. Groves , Matthew L. Snook , Rodney Browen
发明人： William A. Groves , Matthew L. Snook , Rodney Browen
IPC分类号： G01R31/28 , G01R31/317 , G01R31/3183 , G01R31/3193 , G06F11/00
CPC分类号： G01R31/318335 , G01R31/2834 , G01R31/31713 , G01R31/318371 , G01R31/31935
摘要： A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.
摘要翻译：提出了一种电路测试器和测试技术，其压缩存储在本地测试数据RAM中的数据量用于实现电路测试，从而减少必须下载到本地测试数据RAM的数据量，从而提高测试吞吐量。衍生数据向量除了作为数据压缩技术的一部分的原始数据向量之外也被使用。通过仅在本地测试数据RAM中存储唯一数据向量并利用定序器来控制使用唯一数据向量的顺序，进一步的压缩。定序器包括能够在测试引脚间接计数器上实现的测试程序逻辑和逻辑。

6. 发明授权

US4557376A Self activating amalgam capsule 失效
标题翻译：自激合金胶囊
公开(公告)号：US4557376A
公开(公告)日：1985-12-10
申请号：US501209
申请日：1983-06-06
申请人： Robert L. Probst , William A. Groves
发明人： Robert L. Probst , William A. Groves
IPC分类号： A61C5/06 , B65D81/32
CPC分类号： A61C5/066 , B65D81/32 , Y10S366/602
摘要： A two-piece, two chamber self-activating capsule having mercury in one chamber and metal powder in the other. In use, the capsule is shaken and the resulting force due to the inertia of the mercury forces its way through a normally-closed valve into the metal powder chamber, whereby the metal powder and mercury become triturated by the shaking and form dental amalgam for filling teeth. A pestle may be included to facilitate mingling and triturating the amalgam components.
摘要翻译：一个两件式，两室自动启动胶囊，在一个室中有汞，另一个是金属粉末。在使用中，胶囊被摇动，由于汞的惯性而产生的力迫使其通过常闭阀进入金属粉末室，由此金属粉末和汞通过振动研磨并形成用于填充的牙科汞合金牙齿可以包括杵，以便混合和研磨汞齐组分。

7. 发明授权

US4260379A Endodontic instrument 失效
标题翻译：牙髓器械
公开(公告)号：US4260379A
公开(公告)日：1981-04-07
申请号：US39927
申请日：1979-05-17
申请人： William A. Groves , Frank N. Lentine
发明人： William A. Groves , Frank N. Lentine
IPC分类号： A61C5/02 , A61C17/00
CPC分类号： A61C5/023 , Y10T408/898
摘要： An endodontic instrument formed by twisting a tapered blank which in cross section is ground to an oblique parallelogram, the obtuse angles of the oblique parallelogram cross section being between 105.degree.-120.degree..
摘要翻译：通过扭曲锥形坯料形成的根管矫正器，其横截面被研磨成倾斜平行四边形，倾斜平行四边形横截面的钝角在105°-120°之间。

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