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1. 发明授权

US09291678B2 Method and controller for an electric motor with switch testing 有权
标题翻译：具有开关测试的电动机的方法和控制器
公开(公告)号：US09291678B2
公开(公告)日：2016-03-22
申请号：US13484947
申请日：2012-05-31
申请人： Whitney M. Aalund , Alan K. Gilman , Long Wu
发明人： Whitney M. Aalund , Alan K. Gilman , Long Wu
IPC分类号： G01R31/02 , G05F3/00 , G01R31/34 , H02P29/02 , G01R31/42 , H02H7/08 , H02H7/122 , G01R31/327 , H02H7/085
CPC分类号： G01R31/343 , G01R31/025 , G01R31/327 , G01R31/42 , H02H7/0838 , H02H7/0852 , H02H7/1225 , H02P29/0241
摘要： For each phase of a controller, a pair of semiconductor switches comprises a high side switch and a low side switch. A direct current voltage bus provides electrical energy to the semiconductor switches at a test voltage level less than a full operational voltage level. A measuring circuit is adapted to measure the direct current bus voltage. A data processor determines that a deficiency in a tested, related semiconductor switch is present if the measured direct current bus voltage decreases or collapses upon activation of a particular semiconductor switch in the same phase of the controller, or if other sequential test results indicate a deficiency. If the deficiency in the related semiconductor switch is present the processor may prevent the voltage supply from providing the full operational voltage to the direct current data bus to prevent damage to the motor or the controller, for example.
摘要翻译：对于控制器的每个相，一对半导体开关包括高侧开关和低侧开关。直流电压总线在小于全工作电压电平的测试电压电平下向半导体开关提供电能。测量电路适用于测量直流母线电压。如果测量的直流母线电压在控制器的相同阶段激活特定半导体开关时降低或崩溃，或者如果其他顺序测试结果表明不足，则数据处理器确定存在测试的相关半导体开关中的缺陷。如果存在相关半导体开关的缺陷，则处理器可以防止电压供应向直流数据总线提供完整的操作电压，以防止例如对电动机或控制器的损坏。

2. 发明申请

US20130320903A1 METHOD AND CONTROLLER FOR AN ELECTRIC MOTOR WITH SWITCH TESTING 有权
标题翻译：用于具有开关测试的电动机的方法和控制器
公开(公告)号：US20130320903A1
公开(公告)日：2013-12-05
申请号：US13484947
申请日：2012-05-31
申请人： Whitney M. Aalund , Alan K. Gilman , Wu Long
发明人： Whitney M. Aalund , Alan K. Gilman , Wu Long
IPC分类号： H02P31/00
CPC分类号： G01R31/343 , G01R31/025 , G01R31/327 , G01R31/42 , H02H7/0838 , H02H7/0852 , H02H7/1225 , H02P29/0241
摘要： For each phase of a controller, a pair of semiconductor switches comprises a high side switch and a low side switch. A direct current voltage bus provides electrical energy to the semiconductor switches at a test voltage level less than a full operational voltage level. A measuring circuit is adapted to measure the direct current bus voltage. A data processor determines that a deficiency in a tested, related semiconductor switch is present if the measured direct current bus voltage decreases or collapses upon activation of a particular semiconductor switch in the same phase of the controller, or if other sequential test results indicate a deficiency. If the deficiency in the related semiconductor switch is present the processor may prevent the voltage supply from providing the full operational voltage to the direct current data bus to prevent damage to the motor or the controller, for example.
摘要翻译：对于控制器的每个相，一对半导体开关包括高侧开关和低侧开关。直流电压总线在小于全工作电压电平的测试电压电平下向半导体开关提供电能。测量电路适用于测量直流母线电压。如果测量的直流母线电压在控制器的相同阶段激活特定半导体开关时降低或崩溃，或者如果其他顺序测试结果表明不足，则数据处理器确定存在测试的相关半导体开关中的缺陷。如果存在相关半导体开关的缺陷，则处理器可以防止电压供应向直流数据总线提供完整的操作电压，以防止例如对电动机或控制器的损坏。

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