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1. 发明申请

US20070217675A1 Z-axis optical detection of mechanical feature height 有权
标题翻译： Z轴光学检测机械特征高度
公开(公告)号：US20070217675A1
公开(公告)日：2007-09-20
申请号：US11376022
申请日：2006-03-15
申请人： Vincent Mulligan
发明人： Vincent Mulligan
IPC分类号： G06K9/00
CPC分类号： G06K9/4661 , G01B11/0608 , G06K9/4642 , G06T7/0004 , G06T7/507 , G06T2200/24 , G06T2207/30141 , G06T2207/30152
摘要： Height attributes of features of an object having a plurality of physical features thereon is determined by illuminating the features of the object at a low angle and capturing the reflected light at a camera mounted along the z-axis perpendicular to the object. The reflected light from the features is analyzed to determine if any of the features is of an unacceptable height. The reflected light being either brighter or dimmer than the average determines that the corresponding feature is higher or lower respectively than the average feature.
摘要翻译：通过以低角度照射物体的特征并且捕获沿着垂直于物体的z轴安装的相机的反射光来确定其上具有多个物理特征的物体的特征的高度属性。分析来自特征的反射光以确定任何特征是否具有不可接受的高度。反射光比平均亮度更亮或更暗，确定相应的特征分别高于或低于平均特征。

2. 发明申请

US20080132097A1 INTERCONNECTED APPARATUS UTILIZING METAL ON ELASTOMER RING CHAIN STYLE 审中-公开
标题翻译：使用弹性体环形金属的互连装置
公开(公告)号：US20080132097A1
公开(公告)日：2008-06-05
申请号：US11565091
申请日：2006-11-30
申请人： Robert Florence , Vincent Mulligan , Thomas Ramundo , Charles Tompkins
发明人： Robert Florence , Vincent Mulligan , Thomas Ramundo , Charles Tompkins
IPC分类号： H01R25/00
CPC分类号： H01R13/6461 , H01R12/714 , H01R13/2414
摘要： A connector for the interconnection of electrical components, the connector component comprising a framing segment, a planar grid constructed from a plurality of contact support cores, rails, and conductive annular cylinders, wherein the conductive annular cylinders comprising a predetermined geometric configuration, the rails are formed with a plurality of holes that are spaced a predetermined distance apart from one another along length of the body of the rail, and the plurality of contact support cores longitudinally extending through the holes that are formed within the plurality rails and the conductive annular cylinders. The rails and conductive annular cylinders being positioned along the length of a contact support core so that a conductive annular cylinder is positioned in the spacing between rails, further, the plurality conductive annular cylinders physically protrude beyond the width of the bodies of the plurality rails to form a conductive contact area surface. Further, the planar grid is mechanically mounted to framing segment.
摘要翻译：一种用于电气部件互连的连接器，所述连接器部件包括框架段，由多个接触支撑芯，导轨和导电环形气缸构成的平面格栅，其中所述导电环形圆柱体包括预定的几何构型，形成有沿着轨道主体的长度彼此间隔开预定距离的多个孔，并且多个接触支撑芯纵向延伸穿过形成在多个轨道和导电环形气缸内的孔。轨道和导电环形圆柱体沿着接触支撑芯的长度定位，使得导电环形圆柱体定位在轨道之间的间隔中，此外，多个导电环形气缸物理地突出超过多个轨道的主体的宽度，形成导电接触区域表面。此外，平面栅格机械地安装到框架段。

3. 发明申请

US20060271326A1 Power short circuit testing of an electronics assembly employing pre-characterized power off resistance of an electronic component thereof from a power boundary 失效
标题翻译：电子组件的电力短路测试，其采用电力边界的电子部件的预定义的断电电阻
公开(公告)号：US20060271326A1
公开(公告)日：2006-11-30
申请号：US11137878
申请日：2005-05-26
申请人： Frank Bosco , Gerald Fahr , Raymond Longhi , Vincent Mulligan
发明人： Frank Bosco , Gerald Fahr , Raymond Longhi , Vincent Mulligan
IPC分类号： G01R31/14
CPC分类号： G01R31/025
摘要： A technique for testing an electronics assembly for a power short circuit is provided. The technique includes pre-characterizing power off resistance of an electronic component(s) of a first packaging level from at least one power boundary of the electronic component(s). The characterizing of the power off resistance occurs prior to placement of the electronic component(s) into an electronics assembly of a higher packaging level. The technique further includes determining actual power off resistance of the electronics component(s) after placement thereof into the electronics assembly, with the actual power off resistance being determined from the at least one power boundary. Thereafter, the actual power off resistance of the electronic component(s) in the electronics assembly is compared with the pre-characterized power off resistance of the at least one electronic component(s), and a determination is made therefrom whether a power short circuit exists within the electronics assembly.
摘要翻译：提供了一种用于测试用于电源短路的电子组件的技术。该技术包括从电子部件的至少一个电源边界预先表征第一封装级别的电子部件的断电电阻。在将电子部件放置到更高封装水平的电子组件之前，断电阻力的表征发生。该技术还包括在将电子元件放入电子组件之后确定电子元件的实际断电电阻，其中实际断电电阻是从至少一个电源边界确定的。此后，将电子组件中的电子部件的实际断电电阻与至少一个电子部件的预表示的断电电阻进行比较，并且确定电力短路存在于电子组件内。

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