会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Method for controlling the thickness of a thin crystal film
    • 控制薄晶膜厚度的方法
    • US4855013A
    • 1989-08-08
    • US92348
    • 1987-09-02
    • Kimihiro OhtaTadashi NakagawaTakeshi KojimaTsunenori SakamotoNaoyuki Kawai
    • Kimihiro OhtaTadashi NakagawaTakeshi KojimaTsunenori SakamotoNaoyuki Kawai
    • C23C14/06C30B23/02
    • C30B29/40C23C14/0617C30B23/002
    • A method for controlling the thickness of a thin crystal film which is grown in a vacuum atmosphere, comprising the steps of: generating an electron beam in the vacuum atmosphere; directing the electron beam thus generated to a crystal being grown to obtain a diffraction pattern of the crystal; detecting the variations in time of the intensity of the diffraction pattern thus obtained; obtaining the number of oscillations from the variations thus detected; and interrupting the growth of the crystal in synchronism with the oscillations of the intensity when the number reaches a predetermined number. The composition ratio of a mixed crystal can be also determined by the ratio among the frequency of oscillations of each crystal which constitutes the mixed crystal. The oscillations of the intensity of the RHEED pattern can be observed more than 400 times so that the thickness of the grown thin crystal film can be measured with the accuracy higher than 1000 .ANG. in terms of the mono-layer.
    • 一种用于控制在真空气氛中生长的薄晶体膜的厚度的方法,包括以下步骤:在真空气氛中产生电子束; 将由此产生的电子束引导到正在生长的晶体上以获得晶体的衍射图案; 检测由此获得的衍射图的强度的时间变化; 从所检测的变化中获得振荡次数; 并且当数量达到预定数量时与强度的振荡同步地中断晶体的生长。 混合晶体的组成比也可以通过构成混合晶体的各晶体的振荡频率之比来确定。 可以观察到RHEED图案的强度的振荡超过400次,从而以单层为单位,以高于1000安培的精度测量生长的薄晶体膜的厚度。