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1. 发明授权

US09291599B2 Magnetic testing method and apparatus 有权
标题翻译：磁测试方法及装置
公开(公告)号：US09291599B2
公开(公告)日：2016-03-22
申请号：US14238958
申请日：2012-08-15
申请人： Toshiyuki Suzuma , Yoshiyuki Nakao , Makoto Sakamoto , Yoshiyuki Oota
发明人： Toshiyuki Suzuma , Yoshiyuki Nakao , Makoto Sakamoto , Yoshiyuki Oota
IPC分类号： G01N27/82 , G01N27/83 , G01N27/90
CPC分类号： G01N27/82 , G01N27/83 , G01N27/902
摘要： A magnetic testing apparatus 100 according to the present invention comprises: a first magnetizing device 1 for applying a DC bias magnetic field to a test object P in substantially parallel to the direction in which a flaw F to be detected extends; a second magnetizing device 2 for applying an AC magnetic field to the test object P substantially perpendicularly to the direction in which the flaw F to be detected extends; and a detecting device 3 for detecting leakage flux produced by the magnetization of the test object P accomplished by the first magnetizing device 1 and the second magnetizing device 2.
摘要翻译：根据本发明的磁性测试装置100包括：第一磁化装置1，用于将基本上平行于待检测的缺陷F的方向延伸的测试对象P施加直流偏置磁场; 第二磁化装置2，用于将大致垂直于待检测的缺陷F的方向延伸的测试对象P的交流磁场施加; 以及检测装置3，用于检测由第一磁化装置1和第二磁化装置2实现的被测试物体P的磁化产生的漏磁通。

2. 发明申请

US20110163741A1 MAGNETIC TESTING METHOD AND MAGNETIC TESTING APPARATUS 有权
标题翻译：磁性测试方法和磁性测试装置
公开(公告)号：US20110163741A1
公开(公告)日：2011-07-07
申请号：US12992618
申请日：2009-05-14
申请人： Toshiyuki Suzuma , Kenji Imanishi
发明人： Toshiyuki Suzuma , Kenji Imanishi
IPC分类号： G01N27/82
CPC分类号： G01N27/9013 , G01N27/9046
摘要： A magnetic testing apparatus has a magnetizing device applying a rotating magnetic field to a material to be tested, a testing signal detecting device, and a signal processing device applying signal processing to the testing signal. The signal processing device has a first synchronous detecting device detecting a testing signal by using the first current as a reference signal, a second synchronous detecting device detecting an output signal of the first synchronous detecting device by using the second current as a reference signal to extract a candidate flaw signal, and a testing image display device displaying a testing image in which each of pixels has a gray level corresponding to an intensity of the candidate flaw signal at each of positions of the material to be tested, and a phase of the candidate flaw signal at each of the positions is capable of being identified.
摘要翻译：磁性测试装置具有向被测试材料施加旋转磁场的磁化装置，测试信号检测装置和对测试信号应用信号处理的信号处理装置。信号处理装置具有通过使用第一电流作为参考信号来检测测试信号的第一同步检测装置，通过使用第二电流作为参考信号来检测第一同步检测装置的输出信号的第二同步检测装置，候选缺陷信号，以及显示测试图像的测试图像显示设备，其中每个像素具有与待测试材料的每个位置处的候选缺陷信号的强度相对应的灰度级，并且候选的相位能够识别每个位置处的缺陷信号。

3. 发明申请

US20130248505A1 WELDING QUALITY CLASSIFICATION APPARATUS 审中-公开
标题翻译：焊接质量分类装置
公开(公告)号：US20130248505A1
公开(公告)日：2013-09-26
申请号：US13878917
申请日：2011-10-12
申请人： Kazunori Anayama , Toshiyuki Suzuma , Hitomi Nishibata , Hiroki Fujimoto , Kiyoyuki Fukui , Masato Uchihara
发明人： Kazunori Anayama , Toshiyuki Suzuma , Hitomi Nishibata , Hiroki Fujimoto , Kiyoyuki Fukui , Masato Uchihara
IPC分类号： B23K9/095
CPC分类号： B23K9/095 , B23K11/115 , B23K31/125
摘要： The welding quality classification apparatus relating to the present invention is an apparatus, wherein a data point indicating feature information of a welded joint to be classified whose welding quality is unknown is mapped to a point in a mapping space which has a dimensional number higher than the number of the features constituting the feature information, and the welding quality of a welded joint to be classified is classified based on which of regions of two welding qualities, which are formed by separating the mapping space with a decision boundary, contains the mapped point, and wherein a discriminant function is determined by adopting a weight which minimizes the sum of the classification error corresponding to classification accuracy of a training dataset and a regularization term having a positive correlation with the dimensional number of the discriminant function as weight for each feature constituting the discriminant function indicating the decision boundary.
摘要翻译：关于本发明的焊接质量分类装置是一种装置，其中指示焊接质量未知的待分类的焊接接头的特征信息的数据点被映射到具有高于基于通过将映射空间与判定边界分离而形成的两个焊接质量的区域中的哪一个包含映射点来分类构成特征信息的特征的数量和待分类的焊接接头的焊接质量，并且其中通过采用最小化对应于训练数据集的分类精度的分类误差和与判别函数的维数成正相关的正则化项的正则化项的权重作为构成每个特征的每个特征的权重来确定判别函数判别函数表示决策边界。

4. 发明申请

US20120327217A1 DEFECT INSPECTING APPARATUS 有权
标题翻译：缺陷检查装置
公开(公告)号：US20120327217A1
公开(公告)日：2012-12-27
申请号：US13551014
申请日：2012-07-17
申请人： Kazunori ANAYAMA , Toshiyuki SUZUMA , Yoshiyuki NAKAO , Masami IKEDA , Kenta SAKAI
发明人： Kazunori ANAYAMA , Toshiyuki SUZUMA , Yoshiyuki NAKAO , Masami IKEDA , Kenta SAKAI
IPC分类号： H04N7/18
CPC分类号： G01N21/952
摘要： A defect inspecting apparatus includes a first light source, a first image capture device that receives the reflection light emitted from the first light source and reflected by the outer peripheral surface of a lip part to grab the image of the outer peripheral surface of the lip part, a second light source, a second image capture device 8 that receives the reflection light emitted from the second light source and reflected by a load face to grab the image of the load face, a third light source, a third image capture device that receives the reflection light emitted from the third light source and reflected by a thread bottom face inspection zone 106 to grab the image of the thread bottom face inspection zone, and an inspection device for inspecting defects by processing the captured images grabbed by the first to third image capture devices.
摘要翻译：缺陷检查装置包括第一光源，第一图像捕获装置，其接收从第一光源发射并被唇部的外周面反射的反射光，以抓取唇部的外周面的图像，第二光源，第二图像捕获装置8，其接收从第二光源发射并被负载面反射以吸收负载面的图像的反射光;第三光源;第三图像捕获装置，其接收从第三光源发射并由线底面检查区域106反射的反射光，以抓取线底面检查区域的图像;以及检查装置，用于通过处理由第一至第三图像抓取的捕获图像来检查缺陷捕获设备。

5. 发明授权

US09121833B2 Defect inspecting apparatus 有权
标题翻译：缺陷检查装置
公开(公告)号：US09121833B2
公开(公告)日：2015-09-01
申请号：US13551014
申请日：2012-07-17
申请人： Kazunori Anayama , Toshiyuki Suzuma , Yoshiyuki Nakao , Masami Ikeda , Kenta Sakai
发明人： Kazunori Anayama , Toshiyuki Suzuma , Yoshiyuki Nakao , Masami Ikeda , Kenta Sakai
IPC分类号： H04N7/18 , G01N21/952
CPC分类号： G01N21/952
摘要： A defect inspecting apparatus includes a first light source, a first image capture device that receives the reflection light emitted from the first light source and reflected by the outer peripheral surface of a lip part to grab the image of the outer peripheral surface of the lip part, a second light source, a second image capture device 8 that receives the reflection light emitted from the second light source and reflected by a load face to grab the image of the load face, a third light source, a third image capture device that receives the reflection light emitted from the third light source and reflected by a thread bottom face inspection zone 106 to grab the image of the thread bottom face inspection zone, and an inspection device for inspecting defects by processing the captured images grabbed by the first to third image capture devices.
摘要翻译：缺陷检查装置包括第一光源，第一图像捕获装置，其接收从第一光源发射并被唇部的外周面反射的反射光，以抓住唇部的外周面的图像，第二光源，第二图像捕获装置8，其接收从第二光源发射并被负载面反射以吸收负载面的图像的反射光;第三光源;第三图像捕获装置，其接收从第三光源发射并由线底面检查区域106反射的反射光，以抓取线底面检查区域的图像;以及检查装置，用于通过处理由第一至第三图像抓取的捕获图像来检查缺陷捕获设备。

6. 发明授权

US08977580B2 Defect classification apparatus 有权
标题翻译：缺陷分类仪
公开(公告)号：US08977580B2
公开(公告)日：2015-03-10
申请号：US13703536
申请日：2011-06-08
申请人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
发明人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
IPC分类号： G06F15/18 , G06N99/00 , G01N21/892 , G01N21/952 , G06T7/00 , G01N21/89
CPC分类号： G06N99/005 , G01N21/892 , G01N21/952 , G01N2021/8918 , G06T7/0004 , G06T2207/20081 , G06T2207/30136
摘要： The present invention has its objective to provide a defect classification apparatus which suppresses over-fitting and accurately classify the defect type of a defect. A defect classification apparatus is provided in which a data point indicating feature information of a defect to be classified having an unknown defect type is mapped to a point in a mapping space having a dimensional number higher than the number of features constituting the feature information, and the defect type of the defect to be classified is classified based on in which of two regions of defect type, which are formed by separating the mapping space by a decision boundary, the mapped point is located, wherein a discriminant function indicating the decision boundary is determined by adopting a weight which minimizes the sum of the classification error, which corresponds to the accuracy in classifying a training defect dataset, and a regularization term, which has a positive correlation with the dimensional number of the decision boundary, as the weight for each feature constituting the discriminant function.
摘要翻译：本发明的目的是提供一种缺陷分类装置，其能够抑制缺陷的缺陷类型的过度拟合和精确分类。提供了一种缺陷分类装置，其中指示具有未知缺陷类型的要分类的缺陷的特征信息的数据点被映射到具有高于构成特征信息的特征数的维度数的映射空间中的点，以及基于通过将映射空间分离为决策边界而形成的两个缺陷类型区域中的哪一个进行分类的缺陷类型，映射点位于其中，其中指示判定边界的判别函数为通过采用最小化对应于训练缺陷数据集的分类精度的分类误差和与决策边界的维数有正相关关系的正则化项的权重作为每个特征构成判别函数。

7. 发明授权

US5739685A Method and apparatus for flaw detection by leakage fluexes and leakage flux sensor 失效
标题翻译：泄漏流感和漏磁传感器探伤的方法和装置
公开(公告)号：US5739685A
公开(公告)日：1998-04-14
申请号：US751693
申请日：1996-11-18
申请人： Toshiyuki Suzuma
发明人： Toshiyuki Suzuma
IPC分类号： G01N27/82 , G01N27/83
CPC分类号： G01N27/82
摘要： A leakage flux flaw detection apparatus in which an object material is magnetized and leakage fluxes derived from a flaw are detected to thereby search for a flaw of the object material in a predetermined flaw-detection direction. The apparatus has a pair of magnet poles for magnetizing the object material in a direction different from the flaw-detection direction, another pair of magnet poles for magnetizing the object material in a direction different from the magnetization direction and flaw-detection direction of the first pair of magnet poles at a predetermined distance in the flaw-detection direction from the magnetization area of the two magnet poles, and two leakage sensors each of which is interposed between each of the two pairs of magnet poles. The leakage flux sensor which detects leakage fluxes from a flaw of the magnetized object material through two flux-sensing parts arranged in opposed relation to the object material and in predetermined spaced relation with each other along the flaw-detection direction includes two flux-sensing parts having the center distance d thereof not more than 4 mm, the length L of not less than 0.5 mm in the direction perpendicular to the flaw-detection direction, and the value d/L of nor less than 1. The leakage flux sensor includes two concentrically-arranged flux-sensing parts having circular cross sections with different cross sectional areas.
摘要翻译：检测对象材料被磁化的漏磁通探伤装置和从缺陷导出的漏磁通，从而以预定的探伤方向搜索物体材料的缺陷。该装置具有一对用于沿着与探伤方向不同的方向磁化对象材料的磁极，另一对磁极用于沿着与第一磁体的磁化方向和第一磁迹的磁化方向和缺陷检测方向不同的方向磁化目标材料在两个磁极的磁化区域的探伤方向上的预定距离的一对磁极和两个两个磁极之间插入的两个泄漏传感器。漏磁通传感器，其通过与物体相对设置并沿着探伤方向彼此以预定的间隔关系布置的两个磁通检测部件检测来自被磁化物体的缺陷的漏磁通量，该漏磁通传感器包括两个磁通检测部件其中心距离d不大于4mm，长度L在垂直于探伤方向的方向上不小于0.5mm，值d / L不小于1.漏磁通量传感器包括两个具有不同横截面积的圆形横截面的同心布置的磁通检测部件。

8. 发明申请

US20140191751A1 MAGNETIC TESTING METHOD AND APPARATUS 有权
标题翻译：磁性测试方法和装置
公开(公告)号：US20140191751A1
公开(公告)日：2014-07-10
申请号：US14238958
申请日：2012-08-15
申请人： Toshiyuki Suzuma , Yoshiyuki Nakao , Makoto Sakamoto , Yoshiuki Oota
发明人： Toshiyuki Suzuma , Yoshiyuki Nakao , Makoto Sakamoto , Yoshiuki Oota
IPC分类号： G01N27/82
CPC分类号： G01N27/82 , G01N27/83 , G01N27/902
摘要： A magnetic testing method and apparatus can accurately detect a flaw by magnetizing a test object to such a degree that the object becomes magnetically saturated while solving the problems of a large magnetizing device is required when only a DC magnetic field is applied and that the test object generates heat when only an AC magnetic field is applied.A magnetic testing apparatus comprises a first magnetizing device for applying a DC bias magnetic field to a test object P in substantially parallel to the direction in which a flaw F to be detected extends, a second magnetizing device for applying an AC magnetic field to the test object P substantially perpendicularly to the direction in which the flaw F to be detected extends, and a detecting device for detecting leakage flux produced by the magnetization of the test object P accomplished by the first and second magnetizing devices.
摘要翻译：磁性测试方法和装置可以通过将测试对象磁化以使物体变得磁饱和的程度来准确地检测缺陷，同时在仅施加DC磁场的同时解决大的磁化装置的问题，并且测试对象仅在施加交流磁场时产生热量。磁性测试装置包括：第一磁化装置，用于将大致平行于待检测的缺陷F的方向的测试对象P施加直流偏置磁场延伸的第二磁化装置，用于将AC磁场施加到测试的第二磁化装置物体P大体上垂直于待检测的缺陷F的方向延伸;以及检测装置，用于检测由第一和第二磁化装置实现的被测试物体P的磁化产生的漏磁通。

9. 发明申请

US20130173508A1 DEFECT CLASSIFICATION APPARATUS 有权
标题翻译：缺陷分类设备
公开(公告)号：US20130173508A1
公开(公告)日：2013-07-04
申请号：US13703536
申请日：2011-06-08
申请人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
发明人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
IPC分类号： G06N99/00
CPC分类号： G06N99/005 , G01N21/892 , G01N21/952 , G01N2021/8918 , G06T7/0004 , G06T2207/20081 , G06T2207/30136
摘要： The present invention has its objective to provide a defect classification apparatus which suppresses over-fitting and accurately classify the defect type of a defect. A defect classification apparatus is provided in which a data point indicating feature information of a defect to be classified having an unknown defect type is mapped to a point in a mapping space having a dimensional number higher than the number of features constituting the feature information, and the defect type of the defect to be classified is classified based on in which of two regions of defect type, which are formed by separating the mapping space by a decision boundary, the mapped point is located, wherein a discriminant function indicating the decision boundary is determined by adopting a weight which minimizes the sum of the classification error, which corresponds to the accuracy in classifying a training defect dataset, and a regularization term, which has a positive correlation with the dimensional number of the decision boundary, as the weight for each feature constituting the discriminant function.
摘要翻译：本发明的目的是提供一种缺陷分类装置，其能够抑制缺陷的缺陷类型的过度拟合和精确分类。提供了一种缺陷分类装置，其中指示具有未知缺陷类型的要分类的缺陷的特征信息的数据点被映射到具有高于构成特征信息的特征数的维度数的映射空间中的点，以及基于通过将映射空间分离为决策边界而形成的两个缺陷类型区域中的哪一个进行分类的缺陷类型，映射点位于其中，其中指示判定边界的判别函数为通过采用最小化对应于训练缺陷数据集的分类精度的分类误差和与决策边界的维数有正相关关系的正则化项的权重作为每个特征构成判别函数。

10. 发明授权

US08466674B2 Magnetic testing method and magnetic testing apparatus 有权
标题翻译：磁性试验方法及磁性试验装置
公开(公告)号：US08466674B2
公开(公告)日：2013-06-18
申请号：US12992618
申请日：2009-05-14
申请人： Toshiyuki Suzuma , Kenji Imanishi
发明人： Toshiyuki Suzuma , Kenji Imanishi
IPC分类号： G01N27/82
CPC分类号： G01N27/9013 , G01N27/9046
摘要： A magnetic testing apparatus has a magnetizing device applying a rotating magnetic field to a material to be tested, a testing signal detecting device, and a signal processing device applying signal processing to the testing signal. The signal processing device has a first synchronous detecting device detecting a testing signal by using the first current as a reference signal, a second synchronous detecting device detecting an output signal of the first synchronous detecting device by using the second current as a reference signal to extract a candidate flaw signal, and a testing image display device displaying a testing image in which each of pixels has a gray level corresponding to an intensity of the candidate flaw signal at each of positions of the material to be tested, and a phase of the candidate flaw signal at each of the positions is capable of being identified.
摘要翻译：磁性测试装置具有向被测试材料施加旋转磁场的磁化装置，测试信号检测装置和对测试信号应用信号处理的信号处理装置。信号处理装置具有通过使用第一电流作为参考信号来检测测试信号的第一同步检测装置，通过使用第二电流作为参考信号来检测第一同步检测装置的输出信号的第二同步检测装置，候选缺陷信号，以及显示测试图像的测试图像显示设备，其中每个像素具有与待测试材料的每个位置处的候选缺陷信号的强度相对应的灰度级，并且候选的相位能够识别每个位置处的缺陷信号。

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