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    • 1. 发明申请
    • PROCESS FOR PRODUCING HARD DISK DEVICE, PROCESS FOR ADJUSTING FLYING HEIGHT OF MAGNETIC HEAD, AND HARD DISK DEVICE
    • 用于生产硬盘装置的方法,用于调节磁头的飞行高度的方法和硬盘装置
    • US20080123215A1
    • 2008-05-29
    • US11945619
    • 2007-11-27
    • Toshihiko YoshikawaYoshihito Sueoka
    • Toshihiko YoshikawaYoshihito Sueoka
    • G11B21/02
    • G11B5/6064G11B5/6058G11B5/607
    • A process for producing a hard disk device which is capable of producing a hard disk device having an excellent electromagnetic conversion characteristic at a high yield, and a process for adjusting flying height of a magnetic head having excellent reliability which is capable of improving the electromagnetic conversion characteristic of a hard disk device and preventing damage of a magnetic head derived from contact between a magnetic recording medium and a magnetic head are provided. Such a process for producing a hard disk device having a magnetic recording medium and a head gimbal assembly 20 having a magnetic head 3 which is arranged opposed to the magnetic recording medium to record and reproduce information includes an adjusting step of adjusting the flying height using an adjusting mechanism which adjusts the flying height of the magnetic head 3 to the magnetic recording medium while detecting the contact between the magnetic recording medium and the magnetic head 3 using a sensor 2 which is installed to the head gimbal assembly 20.
    • 一种制造能够以高产率制造具有优异的电磁转换特性的硬盘装置的硬盘装置的制造方法,以及用于调节具有优异的可靠性的能够改善电磁转换的磁头的飞行高度的工艺 提供了硬盘装置的特性,并且防止了由磁记录介质和磁头之间的接触导致的磁头的损坏。 这种用于制造具有磁记录介质的硬盘装置和具有与磁记录介质相对设置以记录和再现信息的磁头3的头万向架组件20的方法包括:调整步骤,使用 调节机构,其使用安装到头万向架组件20的传感器2来检测磁记录介质和磁头3之间的接触,从而将磁头3的飞行高度调节到磁记录介质。
    • 2. 发明授权
    • Surface profile inspection device
    • 表面轮廓检查装置
    • US08451878B2
    • 2013-05-28
    • US13312044
    • 2011-12-06
    • Masaru HisanagaMasataka TodaToshihiko Yoshikawa
    • Masaru HisanagaMasataka TodaToshihiko Yoshikawa
    • H01S5/00H01S5/40H01S5/022
    • H01S5/005G01B11/25H01S5/02248H01S5/4025
    • A surface profile inspection device producing a sheet of light propagating in a linear region forming a plane from a laser beam emitted from a laser light source and irradiating the sheet of light to an object to be measured, and including an image capturing unit capturing an image of the object to be measured and a configuration data generating unit extracting a light section line defined by an irradiation of the sheet of light from image data of the captured image and generating surface profile data of the object to be measured. The laser light source includes a semiconductor laser emitting a laser beam from a light emitting layer formed in a linear direction along a boarder of a p-n junction. An attitude of the semiconductor laser is set to arrange the linear direction to be unparallel to a spread direction of the sheet of light.
    • 一种表面轮廓检查装置,其产生在从激光光源发射的激光束形成平面的直线区域中传播的光束,并将光束照射到被测量物体,并且包括拍摄图像的图像捕获单元 以及配置数据生成单元,从拍摄图像的图像数据中提取由照射光束而定义的光截面线,并生成被测量物体的表面轮廓数据。 该激光源包括从p-n结的边缘沿着线性方向形成的发光层发射激光的半导体激光器。 半导体激光器的姿态被设定为使线性方向与光束的扩展方向不平行。
    • 4. 发明申请
    • SURFACE PROFILE INSPECTION DEVICE
    • 表面轮廓检查装置
    • US20120147919A1
    • 2012-06-14
    • US13312044
    • 2011-12-06
    • Masaru HISANAGAMasataka TODAToshihiko YOSHIKAWA
    • Masaru HISANAGAMasataka TODAToshihiko YOSHIKAWA
    • H01S5/026
    • H01S5/005G01B11/25H01S5/02248H01S5/4025
    • A surface profile inspection device producing a sheet of light propagating in a linear region forming a plane from a laser beam emitted from a laser light source and irradiating the sheet of light to an object to be measured, and including an image capturing unit capturing an image of the object to be measured and a configuration data generating unit extracting a light section line defined by an irradiation of the sheet of light from image data of the captured image and generating surface profile data of the object to be measured. The laser light source includes a semiconductor laser emitting a laser beam from a light emitting layer formed in a linear direction along a boarder of a p-n junction. An attitude of the semiconductor laser is set to arrange the linear direction to be unparallel to a spread direction of the sheet of light.
    • 一种表面轮廓检查装置,其产生在从激光光源发射的激光束形成平面的直线区域中传播的光束,并将光束照射到被测量物体,并且包括拍摄图像的图像捕获单元 以及配置数据生成单元,从拍摄图像的图像数据中提取由照射光束而定义的光截面线,并生成被测量物体的表面轮廓数据。 该激光源包括从p-n结的边缘沿着线性方向形成的发光层发射激光的半导体激光器。 半导体激光器的姿态被设定为使线性方向与光束的扩展方向不平行。
    • 5. 发明申请
    • CONCAVE-CONVEX SURFACE INSPECTION APPARATUS
    • CONCAVE-CONVEX表面检查装置
    • US20090231570A1
    • 2009-09-17
    • US12400140
    • 2009-03-09
    • Masataka TodaToshihiko YoshikawaKatsuya InuzukaKoji Kuno
    • Masataka TodaToshihiko YoshikawaKatsuya InuzukaKoji Kuno
    • G01C3/00
    • G01B11/25
    • A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.
    • 凹凸表面检查装置包括将狭缝光发射到被检查物体的凹凸面的狭缝光源单元,摄像单元拍摄由发射的狭缝光照射的凹凸面的图像 具有与狭缝等于或小于30度的狭缝光的光轴相交的成像光轴和获得凹凸表面的三维形状的评估部分,并评估所获得的三维形状, 其中所述狭缝光源单元包括狭缝光源和柱面透镜,所述摄像单元包括远心透镜单元,摄像部分具有相对于成像光轴倾斜的成像表面,用于增加所述摄像部分的聚焦范围 凹凸表面和P偏振器。
    • 7. 发明授权
    • Concave-convex surface inspection apparatus
    • 凹凸表面检查装置
    • US08049868B2
    • 2011-11-01
    • US12400140
    • 2009-03-09
    • Masataka TodaToshihiko YoshikawaKatsuya InuzukaKoji Kuno
    • Masataka TodaToshihiko YoshikawaKatsuya InuzukaKoji Kuno
    • G01C3/08G01N21/00
    • G01B11/25
    • A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.
    • 凹凸表面检查装置包括将狭缝光发射到被检查物体的凹凸面的狭缝光源单元,摄像单元拍摄由发射的狭缝光照射的凹凸面的图像 具有与狭缝等于或小于30度的狭缝光的光轴相交的成像光轴和获得凹凸表面的三维形状的评估部分,并评估所获得的三维形状, 其中所述狭缝光源单元包括狭缝光源和柱面透镜,所述摄像单元包括远心透镜单元,摄像部分具有相对于成像光轴倾斜的成像表面,用于增加所述摄像部分的聚焦范围 凹凸表面和P偏振器。
    • 8. 发明授权
    • Magnetic recording medium
    • 磁记录介质
    • US06274233B1
    • 2001-08-14
    • US09276466
    • 1999-03-25
    • Toshihiko YoshikawaAkira SakawakiHiroshi SakaiTetsuya Osaka
    • Toshihiko YoshikawaAkira SakawakiHiroshi SakaiTetsuya Osaka
    • G11B566
    • G11B5/66Y10S428/90Y10T428/26Y10T428/265
    • A magnetic recording medium comprising a substrate 1 having thereon an in-plane magnetic film 3 having a magnetic easy axis oriented in the in-plane direction with respect to the substrate and a vertical magnetic film 6 having a magnetic easy axis oriented perpendicularly to the substrate. The in-plane magnetic film 3 is disposed closer to the substrate 1 than the vertical magnetic film 6. In preferred embodiments, the magnetic recording medium may further comprise a separation film 4 disposed between the in-plane magnetic film 3 and the vertical magnetic film 6, a nonmagnetic intermediate layer 5 having an hcp structure disposed between the separation film 4 and the vertical magnetic film 6, and a protective film 7. The magnetic recording medium is adapted for use with a signal processing system generally used for in-plane magnetic recording media without modification of the signal processing system.
    • 一种磁记录介质,包括基板1,其上具有面向磁性薄膜3的平面磁性薄膜3,所述平面磁性薄膜3具有相对于基板在面内方向上定向的易磁化轴;垂直磁性膜6具有垂直于基板的易磁化轴 。 面内磁性膜3比垂直磁性膜6更靠近基板1.在优选实施例中,磁记录介质还可以包括设置在平面内的磁性膜3和垂直磁性膜之间的分离膜4 如图6所示,具有设置在分离膜4和垂直磁性膜6之间的hcp结构的非磁性中间层5和保护膜7.磁记录介质适用于通常用于面内磁性的信号处理系统 记录介质而不修改信号处理系统。