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    • 2. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US07203117B2
    • 2007-04-10
    • US11245075
    • 2005-10-07
    • Masashi AgataMasanori ShirahamaToshiaki KawasakiRyuji Nishihara
    • Masashi AgataMasanori ShirahamaToshiaki KawasakiRyuji Nishihara
    • G11C17/18
    • G11C17/18
    • A fuse device and a program transistor are connected in series with each other. A flip-flop turns ON, in response to a start signal, the program transistor to start program of the fuse device. A 2-input NAND circuit outputs an end signal at a time point where change in a resistance value of the fuse device is increased to reach a predetermined level while monitoring change in the resistance value of the fuse device through change in a voltage at a junction point of the fuse device and the program transistor. The flip-flop turns OFF, in response to the end signal, the program transistor to automatically terminate the program of the fuse device. Thus, the resistance value of the fuse device is increased to the predetermined level in a minimum program time.
    • 熔丝器件和程序晶体管彼此串联连接。 触发器响应于启动信号而导通,程序晶体管开始保险丝装置的编程。 2输入NAND电路在熔断器件的电阻值的变化增加以达到预定值的时间点输出结束信号,同时通过接点处的电压变化来监测熔丝器件的电阻值的变化 保险丝装置和程序晶体管的点。 触发器关闭,响应于结束信号,程序晶体管自动终止保险丝装置的程序。 因此,保险丝装置的电阻值在最小程序时间内增加到预定电平。
    • 5. 发明申请
    • Charge-pump circuit
    • 电荷泵电路
    • US20070069803A1
    • 2007-03-29
    • US11526060
    • 2006-09-25
    • Yasue YamamotoYasuhiro AgataMasanori ShirahamaToshiaki Kawasaki
    • Yasue YamamotoYasuhiro AgataMasanori ShirahamaToshiaki Kawasaki
    • G05F1/10
    • H02M3/07
    • A circuit includes a plurality of stages each including a MOS transistor and a capacitor of which one end is connected to one of a drain and a source of the MOS transistor. The plurality of stages are connected with each other by cascade connection of the MOS transistors. A gate of the MOS transistor is connected electrically to one of the drain and the source thereof in each stage, and a substrate for at least one pair of adjacent MOS transistors are connected electrically to one of the drain and the source of one of the pair. The back bias effect is suppressed, and the layout area is reduced. Further, a plurality of booster capacitors connected in series are provided in succeeding stages, thereby suppressing degradation of breakdown voltage of each capacitor.
    • 电路包括多个级,每个级包括MOS晶体管和电容器,其一端连接到MOS晶体管的漏极和源极之一。 多个级通过MOS晶体管的级联连接而相互连接。 MOS晶体管的栅极在每个级中电连接到漏极和源极之一,并且用于至少一对相邻MOS晶体管的衬底电连接到该对之一的漏极和源极之一 。 背偏置效果被抑制,布局面积减小。 此外,在后续阶段提供串联连接的多个升压电容器,从而抑制每个电容器的击穿电压的劣化。
    • 8. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US6118723A
    • 2000-09-12
    • US326230
    • 1999-06-04
    • Masashi AgataToshiaki Kawasaki
    • Masashi AgataToshiaki Kawasaki
    • G11C11/407G11C8/14G11C11/401H01L21/8242H01L27/108G11C8/00
    • G11C8/14
    • A semiconductor memory device includes: an array of memory cells that is divided into a plurality of sub-arrays; main word lines; sub-word lines; sub-word select lines; and sub-word drivers. A predetermined number of main word lines are associated with a block of sub-arrays arranged on the same row, and extend over all of these sub-arrays. A set of sub-word lines are provided per sub-array and driven by the same number of sub-word drivers corresponding thereto. Each sub-word select line consists of: a parallel portion, which is placed in parallel to the main word lines; and a plurality of vertical portions crossing the main word lines at right angles. Each sub-word driver is selected by specifying, in combination, one of the main word lines and one of the sub-word select lines. In this arrangement, a difference in signal propagation delay between a main word line and an associated parallel portion of a sub-word select line can be minimized, thus remarkably increasing the operating speed of a semiconductor memory device like a DRAM.
    • 半导体存储器件包括:被分成多个子阵列的存储器单元的阵列; 主字线 子字线 子字选择行; 和子字驱动程序。 预定数量的主字线与布置在同一行上的子阵列块相关联,并且在所有这些子阵列上延伸。 每个子阵列提供一组子字线,并由相应数量的子字驱动器驱动。 每个子字选择线由以下部分组成:与主字线平行放置的平行部分; 以及与主字线交叉成直角的多个垂直部分。 通过组合指定主字线之一和子字选择线中的一个来选择每个子字驱动器。 在这种布置中,可以将主字线和子字选择线的相关联的并行部分之间的信号传播延迟的差最小化,从而显着增加诸如DRAM的半导体存储器件的操作速度。