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    • 2. 发明授权
    • Method of designing semiconductor integrated circuit device, method of analyzing power consumption of circuit and apparatus for analyzing power consumption
    • 设计半导体集成电路器件的方法,分析电路功耗的方法和功耗分析仪器
    • US06513146B1
    • 2003-01-28
    • US09711885
    • 2000-11-15
    • Tomonori YonezawaTakayuki SasakiTakahiro KondoHiroki OtsukiTsuyoshi Nakamura
    • Tomonori YonezawaTakayuki SasakiTakahiro KondoHiroki OtsukiTsuyoshi Nakamura
    • G06F1750
    • G06F17/5045G06F17/5022G06F2217/78
    • The processing quantity of each description part is estimated through a source code analysis of a system operation description language or through simulation, or power consumption of each function is estimated through an operation description analysis of functions. Predetermined threshold values are set with respect to the processing quantity and the power consumption of each description part or function, so as to determine S/W and H/W implementation, and then, S/W and H/W partitioning is carried out. Thereafter, it is determined whether or not the total processing quantity or the total power consumption satisfies a desired design condition. Also, the S/W and H/W partitioning can be adjusted again in comprehensive consideration of the power consumption and the processing quantity, and the accuracy in the S/W and H/W partitioning can be improved by providing an instruction set simulator with a function to analyze power consumption. Moreover, an interface between S/W and H/W can be generated in the S/W and H/W partitioning so as to be automatically inserted into a S/W implemented part or a H/W implemented part.
    • 每个描述部分的处理量通过系统操作描述语言的源代码分析或通过仿真来估计,或者通过功能的操作描述分析来估计每个功能的功耗。 相对于每个描述部分或功能的处理量和功耗来设置预定阈值,以便确定S / W和H / W实现,然后执行S / W和H / W分区。 此后,确定总处理量或总功耗是否满足期望的设计条件。 此外,可以综合考虑功耗和处理量来再次调整S / W和H / W分区,并且可以通过提供一个指令集模拟器来提高S / W和H / W分区的精度 分析功耗的功能。 此外,可以在S / W和H / W分区中产生S / W和H / W之间的接口,以便自动插入到S / W实现部分或H / W实现部分。
    • 4. 发明申请
    • Liquid Crystal Display Apparatus
    • 液晶显示装置
    • US20100194675A1
    • 2010-08-05
    • US12699293
    • 2010-02-03
    • Tomonori YOSHIDATakahiro KONDOHidenori SATO
    • Tomonori YOSHIDATakahiro KONDOHidenori SATO
    • G09G3/36G02F1/133
    • G02F1/133385G02F2201/36
    • A liquid crystal display apparatus includes a liquid crystal panel; an illumination device that illuminates the liquid crystal panel; a cooler cooling the liquid crystal panel; a first detector detecting a surrounding temperature of the liquid crystal panel; a second detector detecting a surrounding temperature of the cooler; a controller controlling the illumination device and the cooler based on output of the first and the second detector, wherein the controller activates the cooler when the output of the second detector is larger than a second value and the output of the first detector exceeds a first value, and the controller decreases a luminance level of the illumination device without activating the cooler when the output of the second detector is less than the second value and the output of the first detector exceeds a first value.
    • 液晶显示装置包括:液晶面板; 照明液晶面板的照明装置; 冷却液体面板的冷却器; 第一检测器,检测液晶面板的周围温度; 第二检测器,检测冷却器的周围温度; 基于第一和第二检测器的输出控制照明装置和冷却器的控制器,其中当第二检测器的输出大于第二值时,控制器激活冷却器,并且第一检测器的输出超过第一值 并且当第二检测器的输出小于第二值且第一检测器的输出超过第一值时,控制器降低照明装置的亮度水平而不启动冷却器。
    • 5. 发明授权
    • Method of inspecting unevenness of partition surface of honeycomb structure and inspecting device
    • 检测蜂窝结构隔断面不均匀性及检测装置的方法
    • US07596274B2
    • 2009-09-29
    • US10577445
    • 2004-10-28
    • Takahiro KondoYoichi AokiAkihiro Mizutani
    • Takahiro KondoYoichi AokiAkihiro Mizutani
    • G06K9/62
    • G06T7/0004G01N21/95692G06T2207/30164Y10T428/24149
    • A method of inspecting unevenness of a partition wall surface of a honeycomb structure includes the steps of: allowing a diffusion light to enter from one end face 8 side by a predetermined lighting means 3 and to exit from the other end face 8 side of the honeycomb structure 2 after passing it through the inside of the cells, allowing the exited diffusion light to pass through a translucent screen 4 disposed on the other end face 9 side of the honeycomb structure 2 to act as a transmitted light, projecting a transmitted image 13 by means of the tone of the transmitted light onto the transmitted light side of the screen 4, picking up the transmitted image 13 projected on the screen 4 by an imaging means 5, and analyzing by an analyzing means 6 the gray level of the obtained image to inspect for each cell the degree of the surface unevenness of the partition walls. This method enables easy inspection on the surface unevenness of the partition walls of the honeycomb structure 2.
    • 检测蜂窝结构体的隔壁表面的不均匀性的方法包括以下步骤:允许扩散光从预定的照明装置3从一个端面8侧进入并从蜂窝的另一端面8侧退出 结构体2在将其通过电池内部之后,允许出射的扩散光通过布置在蜂窝结构体2的另一端面9侧上的半透明屏幕4以作为透射光,将透射图像13投射到 通过成像装置5拾取投射到屏幕4上的透射图像13,并将所获得图像的灰度级分析为 检查每个电池的分隔壁的表面不均匀度。 该方法能够容易地检查蜂窝结构体2的隔壁的表面凹凸。
    • 8. 发明授权
    • Ceramic honeycomb structure
    • 陶瓷蜂窝结构
    • US06656564B2
    • 2003-12-02
    • US10089692
    • 2002-04-23
    • Yukihito IchikawaTakahiro KondoMakoto MiyazakiMasahiro Shirai
    • Yukihito IchikawaTakahiro KondoMakoto MiyazakiMasahiro Shirai
    • B32B312
    • B01D53/885B01J35/04F01N3/2828F01N2330/06Y10T428/24149
    • A ceramic honeycomb structure (1) constituted by cell walls (ribs) (2) forming a composite structure from a plurality of cells (3) being adjacent each other and a honeycomb outer wall (4) surrounding and holding the outermost peripheral cells located at the circumference of the composite structure; said composite structure satisfying the followings: the basic thickness of the cell walls (2) (the basic cell wall thickness) (Tc) is Tc≦0.12 mm, the outer wall thickness (Ts) of the honeycomb structure is Ts≧0.05 mm, and the open frontal area (P) is P≧80%, and there is a relation shown by formula: 1.10≦(Tr1˜Tr3-20)/Tc≦3.00 between the basic cell wall thickness (Tc) and each cell wall thickness (Tr1˜Tr3-20) of cells existing between an outermost peripheral cell and any cell within a first end cell from a third cell to a twentieth cell extending inwardly, taking the outermost peripheral cell as a first starting cell.
    • 一种陶瓷蜂窝结构体(1),由从彼此相邻的多个单元(3)形成复合结构的单元壁(肋)(2)构成,蜂窝外壁(4)围绕并保持位于 复合结构的周长; 所述复合结构满足以下条件:细胞壁(2)的基本厚度(基本细胞壁厚度)(Tc)为Tc <= 0.12mm,蜂窝结构体的外壁厚度(Ts)为Ts> = 0.05 mm,开放正面面积(P)为P> = 80%,并且存在如下公式之间的关系:基本细胞壁厚度(Tc)与存在的细胞的每个细胞壁厚度(Tr1〜Tr3-20)之间 在最外周细胞和第一末端细胞内从第三细胞向内延伸的第二十细胞的任何细胞之间,以最外周细胞为第一起始细胞。