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    • 2. 发明授权
    • Integrated circuit tester
    • 集成电路测试仪
    • US07034520B1
    • 2006-04-25
    • US11223421
    • 2005-09-09
    • Wayne H. MillerChris S. ParetichJames K. LubinStuart M. Firestone
    • Wayne H. MillerChris S. ParetichJames K. LubinStuart M. Firestone
    • G01R31/26
    • G01R31/2889G01R1/0433
    • A product change tool for selectively engaging a product change element with an IC tester interface and disengaging the product change element from the tester interface includes a mobile frame mounted to a base frame and constrained to move relative to the base frame along an axis of linear movement, and a force mechanism for urging the mobile frame to move along the axis of linear movement relative to the base frame. The force mechanism includes first and second links pivotally connected together at their proximal ends and secured at their distal ends to the mobile frame and the base frame respectively. The distal ends of the links are spaced apart along the axis of linear movement and the proximal ends of the links are between the distal ends relative to that axis. An actuator is coupled to the proximal ends of the links for urging the proximal ends of the links in directions transverse to the axis of linear movement, whereby the spacing of the distal ends of the links along the axis changes and the mobile frame moves relative to the base frame along the axis.
    • 用于选择性地将产品更换元件与IC测试器接口接合并将产品更换元件与测试器接口分离的产品更换工具包括安装到基座框架并被限制为沿着线性运动的轴线相对于基座移动的移动框架 以及用于推动移动框架相对于基架沿着线性运动的轴线移动的力机构。 力机构包括在其近端处枢转地连接在一起并且在其远端处分别固定到移动框架和基架的第一和第二连杆。 连杆的远端沿着线性运动的轴线间隔开,并且连杆的近端相对于该轴线位于远端之间。 致动器联接到链节的近端,用于在横向于线性运动的轴线的方向上推动链节的近端,由此沿着轴线的链节的远端的间隔改变,并且移动框架相对于 沿着轴的基架。