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    • 2. 发明申请
    • STENT FOR EXPENDING INTRA LUMINAL
    • 支付内部灯泡
    • US20100049302A1
    • 2010-02-25
    • US12531262
    • 2007-10-30
    • Sung-Gwon KangSeung-Hwan JaegalWoo-Sung YangSoo-Ho LeeSe-Chul Lee
    • Sung-Gwon KangSeung-Hwan JaegalWoo-Sung YangSoo-Ho LeeSe-Chul Lee
    • A61F2/06
    • A61F2/90A61F2/852A61F2230/0054
    • The present invention relates to a stent for intraluminal expansion. The stent for intraluminal expansion comprises an inner stent A, an outer stent B and fixing threads C for fixing these stents as one unit. The outer stent B is inserted over the inner stent A in such a way that the space portions of the inner stent A and the space portions of the outer stent B are alternated with each other, so the outer surface of the inner stent and the inner surface of the outer stent are in close contact with each other, and both ends of the outer stent and inner stent are fixed as one unit by fixing threads C. According to the stent for intraluminal expansion of the present invention, in which form recoverability of each of the inner stent A and the outer stent B is excellent, expansion is easy after it is inserted into the lumen body because the cylindrical film membrane is not fixed by fixing thread C, and the space portions Id of the inner and outer stents are overlapped alternately with each other so that it is possible to effectively prevent cancer cells, etc. from penetrating into the lumen.
    • 本发明涉及一种用于管腔内扩张的支架。 用于管腔内扩张的支架包括内支架A,外支架B和用于将这些支架固定为一个单元的固定线C. 外支架B以内支架A的空间部和外支架B的空间部彼此交替的方式插入内支架A上,内支架的外表面和内支架 外支架的表面彼此紧密接触,并且外支架和内支架的两端通过固定螺纹C固定为一个单元。根据本发明的用于管腔内扩张的支架,其中形状可恢复性 内支架A和外支架B各自优异,因为圆柱形膜膜不通过固定螺纹C固定,因此内插体和外支架的空间部分Id之间容易扩张,因此, 交替地重叠,使得可以有效地防止癌细胞等渗透到内腔中。
    • 3. 发明申请
    • TEST SOCKET FOR SEMICONDUCTOR
    • 半导体测试插座
    • US20080157806A1
    • 2008-07-03
    • US11960993
    • 2007-12-20
    • Soo Ho Lee
    • Soo Ho Lee
    • G01R31/26
    • G01R1/0466
    • The present invention relates to a test socket for a semiconductor device, which may correspond to a narrow pitch of terminal interval and high speed test in a simplified structure, thereby reducing manufacturing cost thereof. The test socket for a semiconductor device includes conductive substrates having contact point parts exposed at upper and lower surfaces for contacting the terminals of the semiconductor device and the lead terminals of the test board, and slant parts connecting the contact point parts and facing each other in repetitive arrangement, and an insulating elastic element filled in positions where the slant parts are formed as the contact point parts of the conductive substrate are exposed to the outside so as to fix the conductive substrates.
    • 本发明涉及一种用于半导体器件的测试插座,其可以对应于简化结构中的端子间隔的窄间距和高速测试,从而降低其制造成本。 用于半导体器件的测试插座包括具有暴露在上表面和下表面处的接触点部分的导电基底,用于接触半导体器件的端子和测试板的引线端子,以及将接触点部件彼此面对的倾斜部件 重复布置以及填充在作为导电基板的接触点的倾斜部分形成的位置的绝缘弹性元件暴露于外部以固定导电基板。
    • 5. 发明申请
    • WATERPROOF BOARD SWITCH AND METHOD OF MANUFACTURING WATERPROOF BOARD SWITCH
    • US20170148586A1
    • 2017-05-25
    • US15309718
    • 2015-05-07
    • Soo Ho LEE
    • Soo Ho LEE
    • H01H13/06H01H13/14H01H11/04
    • A method of manufacturing a waterproof board switch according to the first embodiment comprises the following steps: (A) arranging a plurality of print circuit boards on a board plate, each of the print circuit board having a top pattern on a front surface and a bottom pattern on a rear surface; (B) insulating the rear surface of the print circuit board; (C) forming a board ass'y by thermo-compression bonding an insulation adhesive film having a dome hole to the front surface of the print circuit board; (D) forming a plurality of board holes near both edges of the dome hole on the board ass'y; (E) resting a metal dome on the dome hole such that the metal dome is able to be in contact with the top pattern; (F) arranging a top coverlay having bigger width than the insulation adhesive film on the board ass'y such that the top coverlay covers the dome hole; (G) arranging a thermoplastic resin above the top coverlay, arranging a top jig above the thermoplastic resin, arranging a bottom jig below the board ass'y and then applying thermo-compression to the thermoplastic resin by means of the top jig and the bottom jig; (H) making the thermoplastic resin having flowability flow from the top coverlay to the board hole by the step (G) such that ends of the top coverlay are bended so as to be in contact with sides of the board ass'y and then are inserted into the board hole, and then thermo-compression bonding the top coverlay to the top of the board ass'y and the sides of the board ass'y by means of the thermoplastic resin; and (I) separating the board ass'y to which the top coverlay was bonded from the board plate after the step (H).
    • 6. 发明申请
    • PCB TACT SWITCH
    • US20140144765A1
    • 2014-05-29
    • US13812463
    • 2011-07-11
    • Soo Ho Lee
    • Soo Ho Lee
    • H01H13/12
    • H01H13/12H01H13/06H01H13/48H01H2205/016H01H2207/032H01H2215/004H01H2223/002H01H2229/04
    • The invention relates to a PCB tact switch, and more particularly, to a PCB tact switch having excellent water resistance because same does not have holes on the top and bottom which are open to the outside, capable of preventing erroneous operation through improved contact point safety, and capable of preventing product disengagement through improved fixing strength by being soldered to a substrate. The PCB tact switch of the present invention comprises: an insulation member (100) forming an insulator in a thin plate-shape through which electricity does not pass; an upper conductive substrate (300) formed of a conductor through which electricity may pass, covering the upper surface of the insulation member (100), and including a central contact point terminal (340) and an external contact point terminal (330) by means of a disconnecting portion (310); a lower conductive substrate (400) at the lower surface of the insulation member (100), having an insulation adhesive film (200) deposited on the upper portion thereof, and electrically connected with the upper substrate (300) by means of a through-hole (410); a metal dome (500) which is resiliently deformed by the click from a user, and which electrically connects or disconnects the upper conductive substrate (300) and the lower conductive substrate (400); an insulation film as an insulation cover (600) entirely covering the top portions of the upper conductive substrate (300) and the metal dome (500) and protecting the insides thereof; and an insulation solder mask (700) bonded to the undersurface of the lower conductive substrate (400) and covering the portions with an insulator, except for those requiring soldering, wherein a receiving slot (360) is formed by a receiving slot (110) defined through the insulation member (100) and the insulation film (111), and the metal dome (500) is disposed within the receiving slot (360).
    • 7. 发明授权
    • Test socket for semiconductor
    • 半导体测试插座
    • US07579826B2
    • 2009-08-25
    • US11960993
    • 2007-12-20
    • Soo Ho Lee
    • Soo Ho Lee
    • G01R31/28
    • G01R1/0466
    • The present invention relates to a test socket for a semiconductor device, which may correspond to a narrow pitch of terminal interval and high speed test in a simplified structure, thereby reducing manufacturing cost thereof. The test socket for a semiconductor device includes conductive substrates having contact point parts exposed at upper and lower surfaces for contacting the terminals of the semiconductor device and the lead terminals of the test board, and slant parts connecting the contact point parts and facing each other in repetitive arrangement, and an insulating elastic element filled in positions where the slant parts are formed as the contact point parts of the conductive substrate are exposed to the outside so as to fix the conductive substrates.
    • 本发明涉及一种用于半导体器件的测试插座,其可以对应于简化结构中的端子间隔的窄间距和高速测试,从而降低其制造成本。 用于半导体器件的测试插座包括具有暴露在上表面和下表面处的接触点部分的导电基底,用于接触半导体器件的端子和测试板的引线端子,以及将接触点部件彼此面对的倾斜部件 重复布置以及填充在作为导电基板的接触点的倾斜部分形成的位置的绝缘弹性元件暴露于外部以固定导电基板。