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    • 1. 发明申请
    • Method and apparatus for contact hole unit cell formation
    • 接触孔单元电池形成的方法和装置
    • US20060088770A1
    • 2006-04-27
    • US10973182
    • 2004-10-25
    • Soon TanSia TanQunying LinHuey ChongLiang-Choo Hsia
    • Soon TanSia TanQunying LinHuey ChongLiang-Choo Hsia
    • G03F9/00G03F7/00
    • G03F1/29G03F1/26
    • A method for forming a contact hole unit cell is provided. A light transparent contact hole region of a first phase is positioned at a first plane. A light transparent phase-shifting region of a second phase is positioned at the first plane, the second phase being substantially out of phase with the first phase. The phase-shifting region substantially surrounds the contact hole region. A light transparent border region is positioned at the first plane outside and substantially surrounding the phase-shifting region. The border region has a phase substantially the same as that of the contact hole region. The contact hole region, the phase-shifting region, and the border region are positioned to cause light from the first plane to be reinforcing in a target contact hole configuration on a second plane and to be substantially neutralizing outside the target contact hole configuration on the second plane.
    • 提供一种形成接触孔单元的方法。 第一相的透光接触孔区域位于第一平面。 第二相的光透明相移区位于第一平面处,第二相基本上与第一相不同相。 相移区域基本上围绕接触孔区域。 光透明边界区域位于第一平面的外侧并基本围绕相移区域。 边界区域具有与接触孔区域大致相同的相位。 接触孔区域,相移区域和边界区域被定位成使得来自第一平面的光在第二平面上的目标接触孔构造中被加强并且基本上在目标接触孔构造的外部中和 第二架飞机
    • 3. 发明授权
    • Integrated circuit reconfiguration techniques
    • 集成电路重构技术
    • US08183883B1
    • 2012-05-22
    • US12762295
    • 2010-04-16
    • Chee Seng TanChai Sia TanElden ChauJohn TseNeville Carvalho
    • Chee Seng TanChai Sia TanElden ChauJohn TseNeville Carvalho
    • H03K19/177G06F7/38
    • H03K19/1776G06F17/5054
    • A memory configuration circuit is provided. The memory configuration circuit may be integrated into a programmable logic device (PLD) and as such, may be used to configure and reconfigure specific elements in the PLD. The memory configuration circuit includes a comparator circuit and a counter. The comparator circuit is coupled to receive two data words from two different memory configuration sources. The comparator circuit compares the two data words received before writing one of the data words to a configuration memory. One of the data words may be written to the configuration memory if the two data words compared are not equal. The counter increments the address of the memory configuration sources so that a next data word can be processed after the current data word is processed.
    • 提供存储器配置电路。 存储器配置电路可以集成到可编程逻辑器件(PLD)中,并且因此可用于配置和重新配置PLD中的特定元件。 存储器配置电路包括比较器电路和计数器。 比较器电路被耦合以从两个不同的存储器配置源接收两个数据字。 比较器电路将在将一个数据字写入之前接收的两个数据字与配置存储器进行比较。 如果所比较的两个数据字不相等,则可以将一个数据字写入配置存储器。 计数器增加存储器配置源的地址,以便在处理当前数据字之后处理下一个数据字。
    • 6. 发明申请
    • Method to resolve line end distortion for alternating phase shift mask
    • 解决交变相移掩模线路失真的方法
    • US20060099518A1
    • 2006-05-11
    • US10985263
    • 2004-11-10
    • Sia TanQunying LinLiang-Choo Hsia
    • Sia TanQunying LinLiang-Choo Hsia
    • G06F17/50G03F1/00
    • G03F1/30
    • A embodiment method for forming a layout for a phase shift mask. A embodiment comprises providing a layout comprising a first feature, a first shifter region and a second shifter region. The first feature preferably has a L-shape portion with an elbow region. The first shifter region is on the outside of the L-shaped portion and the second shifter region is on the inside of the L-shaped portion. The elbow region has an outside corner away from the second shifter region. We identify a phase conflict region caused by the L-shaped portion of the first feature, the first shifter region and the second shifter region. We resolve the phase conflict by modifying the elbow region by moving the outside corner of the elbow region away from the first shifter region and the phase conflict region. The modification of the elbow region further comprises forming a jog region in the line end section of the first feature.
    • 一种用于形成相移掩模布局的实施例方法。 实施例包括提供包括第一特征,第一移位区和第二移位区的布局。 第一特征优选具有肘部区域的L形部分。 第一移位区域位于L形部分的外侧,第二移位区域位于L形部分的内侧。 肘部区域具有远离第二移位区域的外角。 我们识别由第一特征的L形部分,第一移位区域和第二移位区域引起的相位冲突区域。 我们通过移动肘部区域的外角远离第一移位区域和相位冲突区域来修改肘部区域来解决相位冲突。 肘部区域的修改还包括在第一特征的线端部中形成点动区域。
    • 8. 发明申请
    • Method and apparatus for removing radiation side lobes
    • 用于去除辐射旁瓣的方法和装置
    • US20060083994A1
    • 2006-04-20
    • US10970077
    • 2004-10-20
    • Sia TanSoon TanQunying LinHuey ChongLiang-Choo Hsia
    • Sia TanSoon TanQunying LinHuey ChongLiang-Choo Hsia
    • G03C5/00G06F17/50G03F1/00
    • G03F1/34G03F1/36
    • A method and structure for removing side lobes is provided by positioning first and second radiation transparent regions of respective first and second phases at a first plane with the first and second phases being substantially out of phase. Further, positioning the first and the second region to cause radiation at a second plane to be neutralized in a first region, not to be neutralized in a second region, and to have a side lobe in a third region. Further, positioning a non-transparent region at the first plane to assure radiation at the second plane to be neutralized in the first region and positioning a third radiation transparent region of the first or second phase at the first plane to neutralize the side lobes in the third region at the second plane.
    • 通过将第一和第二相的第一和第二辐射透明区域定位在第一平面上,其中第一和第二相基本上异相,来提供用于去除旁瓣的方法和结构。 此外,定位第一和第二区域以使第二平面上的辐射在第一区域中被中和,而不在第二区域中被中和,并且在第三区域中具有旁瓣。 此外,在第一平面处定位不透明区域以确保在第二平面处的辐射在第一区域中被中和,并且将第一或第二相的第三辐射透明区域定位在第一平面处以中和旁瓣 第三个地区在第二个飞机。
    • 9. 发明申请
    • Method for dual damascene patterning with single exposure using tri-tone phase shift mask
    • 使用三色相移掩模的单次曝光的双镶嵌图案化方法
    • US20050089763A1
    • 2005-04-28
    • US10693202
    • 2003-10-24
    • Sia TanQun LinSoon TanHuey Chong
    • Sia TanQun LinSoon TanHuey Chong
    • G03F1/00G03F1/14G03F7/00G03F9/00
    • G03F1/32
    • A reticle structure and a method of forming a photoresist profile on a substrate using the reticle having a multi-level profile. The reticle comprises (1) a transparent substrate, (2) a partially transmitting 180 degree phase shift film overlying predetermined areas of the transparent substrate to transmit approximately 20 to 70% of incident light, and (3) an opaque film overlying the predetermined areas of the partially transmitting 180 degree phase shift film. The method comprises the following steps: a) depositing a photoresist film over the substrate; b) directing light to the photoresist film through the reticle, and c) developing the photoresist film to form an opening in the resist layer where light only passed thru the substrate, and to remove intermediate thickness of the photoresist film, in the areas where the light passed through the partially transmitting 180 degree phase shift film. In an aspect, the photoresist film is comprised of a lower photoresist layer and an upper photoresist layer. The lower photoresist layer is less sensitive to light than the upper photoresist layer. In an aspect, the resist profile is used to form a dual damascene shaped opening.
    • 掩模版结构和使用具有多层轮廓的掩模版在基板上形成光刻胶轮廓的方法。 掩模版包括(1)透明基板,(2)覆盖透明基板的预定区域的部分透射的180度相移膜,以透射大约20至70%的入射光,以及(3)覆盖预定区域的不透明膜 的部分透射180度相移膜。 该方法包括以下步骤:a)在衬底上沉积光致抗蚀剂膜; b)通过掩模版将光引导到光致抗蚀剂膜,以及c)使光致抗蚀剂膜显影,以在抗蚀剂层中形成光,其中只有光通过基底,并且除去光致抗蚀剂膜的中间厚度, 光通过部分透射的180度相移膜。 在一个方面,光致抗蚀剂膜由下光致抗蚀剂层和上光致抗蚀剂层组成。 下部光致抗蚀剂层比上部光致抗蚀剂层对光敏感性差。 在一方面,抗蚀剂轮廓用于形成双镶嵌形状的开口。