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    • 2. 发明授权
    • Effective silicide blocking
    • 有效的硅化物阻塞
    • US6020242A
    • 2000-02-01
    • US926590
    • 1997-09-04
    • Jiunn-Yann TsaiShiuh-Luen WangWen-Chin Yeh
    • Jiunn-Yann TsaiShiuh-Luen WangWen-Chin Yeh
    • H01L21/8242H01L21/336
    • H01L27/10888H01L27/10894
    • A metal silicide blocking process for preventing formation of metal silicide on a first device and allowing formation of metal silicide on elements of a second device of an integrated circuit substrate is described. The process includes forming a gate electrode above the integrated circuit substrate, forming a first dielectric layer over the gate electrode and the substrate surface, forming a second dielectric layer above the first dielectric layer, etching anisotropically the second dielectric layer to form a second spacer portion adjacent to the first dielectric layer; masking the substrate surface of the first device to protect the first dielectric layer above the first device from being removed such that the substrate surface at the second device where the metal silicide is to be formed is exposed, etching the first dielectric layer to form a first spacer portion disposed between the gate electrode of the second device and the second spacer portion, the first spacer portion extends underneath the second spacer portion such that the first spacer portion is disposed between the second spacer portion and a portion of the substrate disposed beneath the second spacer portion, exposing the substrate surface of the first device, depositing a metal layer on the substrate surface and fusing metal ions from the metal layer with silicon ions from a plurality of device elements from the portion of the substrate surface where the metal silicide is to be formed to form metal silicide contact areas above the plurality of device elements.
    • 描述了用于防止在第一器件上形成金属硅化物并且允许在集成电路衬底的第二器件的元件上形成金属硅化物的金属硅化物封装工艺。 该方法包括在集成电路衬底上形成栅电极,在栅电极和衬底表面上形成第一电介质层,在第一电介质层上形成第二电介质层,各向异性蚀刻第二电介质层以形成第二间隔部分 邻近第一电介质层; 掩蔽第一器件的衬底表面以保护第一器件上方的第一电介质层被去除,使得将要形成金属硅化物的第二器件处的衬底表面暴露,蚀刻第一介电层以形成第一 间隔部分设置在第二装置的栅电极和第二间隔部分之间,第一间隔部分在第二间隔部分下方延伸,使得第一间隔部分设置在第二间隔部分和布置在第二间隔部分下方的基底部分之间 间隔部分,暴露第一器件的衬底表面,在衬底表面上沉积金属层,并将来自金属层的金属离子与来自多个器件元件的硅离子从金属硅化物的衬底表面的部分 形成为在多个器件元件上方形成金属硅化物接触区域。
    • 4. 发明授权
    • Method of making a split gate non-volatile floating gate memory cell having a separate erase gate, and a memory cell made thereby
    • 制造具有单独的擦除栅极的分离栅极非易失性浮动栅极存储单元以及由此形成的存储单元的方法
    • US09190532B2
    • 2015-11-17
    • US14240440
    • 2012-08-08
    • Chunming WangBaowei QiaoZufa ZhangYi ZhangShiuh Luen WangWen-Juei Lu
    • Chunming WangBaowei QiaoZufa ZhangYi ZhangShiuh Luen WangWen-Juei Lu
    • H01L29/788H01L21/28H01L29/423H01L29/66H01L27/115
    • H01L29/788H01L21/28273H01L27/11521H01L29/42328H01L29/66825H01L29/66833
    • A non-volatile memory cell has a single crystalline substrate of a first conductivity type with a top surface. A first region of a second conductivity type is in the substrate along the top surface. A second region of the second conductivity type is in the substrate along the top surface, spaced apart from the first region. A channel region is the first region and the second region. A word line gate is positioned over a first portion of the channel region, immediately adjacent to the first region. The word line gate is spaced apart from the channel region by a first insulating layer. A floating gate is positioned over another portion of the channel region. The floating gate has a lower surface separated from the channel region by a second insulating layer, and an upper surface opposite the lower surface. The floating gate has a first side wall adjacent to but separated from the word line gate; and a second side wall opposite the first side wall. The second side wall and the upper surface form a sharp edge, with the second side wall greater in length than the first side wall. The upper surface slopes upward from the first side wall to the second side wall. A coupling gate is positioned over the upper surface of the floating gate and is insulated therefrom by a third insulating layer. An erase gate is positioned adjacent to the second side wall of the floating gate. The erase gate is positioned over the second region and insulated therefrom.
    • 非易失性存储单元具有具有顶表面的第一导电类型的单晶衬底。 第二导电类型的第一区域沿着顶表面在衬底中。 第二导电类型的第二区域沿着顶表面在与第一区域间隔开的衬底中。 通道区域是第一区域和第二区域。 字线门位于与第一区域紧邻的沟道区域的第一部分上方。 字线栅极通过第一绝缘层与沟道区间隔开。 浮动栅极位于通道区域的另一部分上。 浮栅具有通过第二绝缘层与沟道区分离的下表面和与下表面相对的上表面。 浮栅具有与字线门相邻但与字线门隔开的第一侧壁; 以及与第一侧壁相对的第二侧壁。 第二侧壁和上表面形成锋利的边缘,第二侧壁的长度大于第一侧壁。 上表面从第一侧壁向上倾斜到第二侧壁。 耦合栅极位于浮动栅极的上表面上方,并通过第三绝缘层与其隔离。 擦除栅极位于浮动栅极的第二侧壁附近。 擦除栅极定位在第二区域上并与之绝缘。
    • 6. 发明申请
    • A METHOD OF MAKING A SPLIT GATE NON-VOLATILE FLOATING GATE MEMORY CELL HAVING A SEPARATE ERASE GATE, AND A MEMORY CELL MADE THEREBY
    • 制造具有单独擦除闸门的分离栅门非挥发性闸门存储单元的方法及其存储单元
    • US20140217489A1
    • 2014-08-07
    • US14240440
    • 2012-08-08
    • Chunming WangBaowei QiaoZufa ZhangYi ZhangShiuh luen WangWen-Juei Lu
    • Chunming WangBaowei QiaoZufa ZhangYi ZhangShiuh luen WangWen-Juei Lu
    • H01L29/788H01L29/66
    • H01L29/788H01L21/28273H01L27/11521H01L29/42328H01L29/66825H01L29/66833
    • A non-volatile memory cell has a single crystalline substrate of a first conductivity type with a top surface. A first region of a second conductivity type is in the substrate along the top surface. A second region of the second conductivity type is in the substrate along the top surface, spaced apart from the first region. A channel region is the first region and the second region. A word line gate is positioned over a first portion of the channel region, immediately adjacent to the first region. The word line gate is spaced apart from the channel region by a first insulating layer. A floating gate is positioned over another portion of the channel region. The floating gate has a lower surface separated from the channel region by a second insulating layer, and an upper surface opposite the lower surface. The floating gate has a first side wall adjacent to but separated from the word line gate; and a second side wall opposite the first side wall. The second side wall and the upper surface form a sharp edge, with the second side wall greater in length than the first side wall. The upper surface slopes upward from the first side wall to the second side wall. A coupling gate is positioned over the upper surface of the floating gate and is insulated therefrom by a third insulating layer. An erase gate is positioned adjacent to the second side wall of the floating gate. The erase gate is positioned over the second region and insulated therefrom.
    • 非易失性存储单元具有具有顶表面的第一导电类型的单晶衬底。 第二导电类型的第一区域沿着顶表面在衬底中。 第二导电类型的第二区域沿着顶表面在与第一区域间隔开的衬底中。 通道区域是第一区域和第二区域。 字线门位于与第一区域紧邻的沟道区域的第一部分上方。 字线栅极通过第一绝缘层与沟道区间隔开。 浮动栅极位于通道区域的另一部分上。 浮栅具有通过第二绝缘层与沟道区分离的下表面和与下表面相对的上表面。 浮栅具有与字线门相邻但与字线门隔开的第一侧壁; 以及与第一侧壁相对的第二侧壁。 第二侧壁和上表面形成锋利的边缘,第二侧壁的长度大于第一侧壁。 上表面从第一侧壁向上倾斜到第二侧壁。 耦合栅极位于浮动栅极的上表面上方,并通过第三绝缘层与其隔离。 擦除栅极位于浮动栅极的第二侧壁附近。 擦除栅极定位在第二区域上并与之绝缘。