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    • 1. 发明授权
    • Method of positioning work piece and system therefor
    • 定位工件及其系统的方法
    • US6145422A
    • 2000-11-14
    • US196154
    • 1998-11-20
    • Shozo KatamachiShinji Shibaoka
    • Shozo KatamachiShinji Shibaoka
    • B23Q16/00B28D5/00B28D5/04B26D1/50
    • B23Q16/001B28D5/0058B28D5/0088B28D5/045
    • A work piece such as a semiconductor ingot is positioned and bonded to a work piece bonding block by a bonding jig which is provided separately from a wire saw in such a manner that the central axis of the work piece and respective horizontal and vertical surfaces of the work piece bonding block come into parallel to each other. Then, the work piece bonding block is positioned and mounted at a mounting jig which is provided on a cutting-feeding table of the wire saw and which has horizontal and vertical reference surfaces perpendicularly intersecting a cutting plane, so that the central axis of the work piece automatically and perpendicularly intersects the cutting plane. Then, the mounting jig is tilted to tilt the work piece by a tilting mechanism in such a manner that the central axis is inclined against the cutting plane at a predetermined angle on the basis of shift value data of the crystal orientation with the central axis of the work piece a reference, which has previously been measured outside the wire saw.
    • 通过与线锯分开设置的接合夹具将诸如半导体锭的工件定位并结合到工件接合块,使得工件的中心轴线和工件的相应的水平和垂直表面 工件粘结块彼此平行。 然后,将工件接合块定位并安装在安装夹具上,该安装夹具设置在线锯的切割进给台上,并且具有与切割平面垂直相交的水平和垂直参考表面,使得工件的中心轴线 片自动垂直于切割平面相交。 然后,通过倾斜机构使安装夹具倾斜以使工件倾斜,使得中心轴基于具有中心轴的晶体取向的偏移值数据以预定角度倾斜于切割平面 工件参考,其以前已经在线锯外测量。
    • 4. 发明授权
    • Wire saw and method of slicing ingot by wire saw
    • 线锯和线锯切片方法
    • US5857454A
    • 1999-01-12
    • US675894
    • 1996-07-05
    • Shinji Shibaoka
    • Shinji Shibaoka
    • B28D5/00B28D5/04B24D3/00
    • B28D5/0088B28D5/045
    • An ingot mounting block consists of an attachment block, a horizontal rocking block and a vertical rocking block. The horizontal rocking block is provided in such a manner to rock horizontally with regard to the attachment block. The vertical rocking block is provided in such a manner to rock vertically with regard to the attachment block. A semiconductor ingot is positioned at the top of the vertical rocking block and is secured thereto. During an alignment of a crystal orientation, the horizontal rocking block and the vertical rocking block are previously inclined at a predetermined angle with regard to the attachment block, and then they are attached to a work feed table of a wire saw.
    • 铸锭安装块由附接块,水平摇摆块和垂直摇摆块组成。 以相对于附接块水平摇摆的方式设置水平摇摆块。 垂直摆动块以相对于附接块垂直摇摆的方式设置。 半导体锭位于垂直摇摆块的顶部并固定在其上。 在晶体取向的对准期间,水平摆动块和垂直摆动块预先相对于附接块倾斜预定角度,然后它们附接到线锯的工作进给台。
    • 5. 发明授权
    • Method of chamfering semiconductor wafer
    • 倒角半导体晶圆的方法
    • US5295331A
    • 1994-03-22
    • US977889
    • 1992-11-18
    • Katsuo HondaYoshio KamoshitaShinji ShibaokaKatsuhiro Tago
    • Katsuo HondaYoshio KamoshitaShinji ShibaokaKatsuhiro Tago
    • B24B9/06H01L21/304B24B1/00
    • H01L21/02021B24B9/065
    • According to the present invention, the rotary axis O--O of a grindstone 22 is inclined to the rotary axis P--P of a semiconductor wafer 20 through an angle .theta. in a direction of the tangent line of the semiconductor wafer. Accordingly, a moving direction of abrasive grains of the grindstone 22 is divided into two including a component force A.sub.1 in the grinding direction and a component force A.sub.2 in the perpendicular direction, and these component forces increase the number of acting abrasive grains, so that the accuracy of the chamfering shape and the surface roughness can be improved. According to the present invention, the peripheral edge of the rotating semiconductor wafer is chamfered while the rotating grindstone 22 is reciprocatingly moved along the inclined grinding surface 24, whereby the number of the acting abrasive grains are increased, so that the accuracy of the chamfering shape and the surface roughness can be improved.
    • 根据本发明,磨石22的旋转轴O-O相对于半导体晶片20的旋转轴P-P在半导体晶片的切线方向上以角度(θ)倾斜。 因此,磨石22的磨粒的移动方向分为磨削方向上的分力A1和垂直方向的分力A2,这些分力增加了作用磨粒的数量, 可以提高倒角形状和表面粗糙度的精度。 根据本发明,旋转的半导体晶片的周边边缘被倒角,同时旋转的磨石22沿着倾斜研磨表面24往复移动,由此增加作用磨粒的数量,使得倒角形状的精度 可以提高表面粗糙度。
    • 6. 发明授权
    • Method of positioning work piece and system therefor
    • 定位工件及其系统的方法
    • US5893308A
    • 1999-04-13
    • US852605
    • 1997-05-07
    • Shozo KatamachiShinji Shibaoka
    • Shozo KatamachiShinji Shibaoka
    • B23Q16/00B28D5/00B28D5/04B26D1/50
    • B23Q16/001B28D5/0058B28D5/0088B28D5/045Y10T83/04Y10T83/148Y10T83/6577Y10T83/6612Y10T83/9292
    • A work piece such as a semiconductor ingot is positioned and bonded to a work piece bonding block by means of a bonding jig which is provided separately from a wire saw in such a manner that the central axis of the work piece and respective horizontal and vertical surfaces of the work piece bonding block come into parallel to each other. Then, the work piece bonding block is positioned and mounted at a mounting jig which is provided on a cutting-feeding table of the wire saw and which has horizontal and vertical reference surfaces perpendicularly intersecting a cutting plane, so that the central axis of the work piece automatically and perpendicularly intersects the cutting plane. Then, the mounting jig is tilted to tilt the work piece by a tilting mechanism in such a manner that the central axis is inclined against the cutting plane at a predetermined angle on the basis of shift value data of the crystal orientation with the central axis of the work piece a reference, which has previously been measured outside the wire saw.
    • 通过与线锯分开设置的接合夹具将诸如半导体锭的工件定位并结合到工件接合块,使得工件的中心轴线和相应的水平和垂直表面 的工件接合块彼此平行。 然后,将工件接合块定位并安装在安装夹具上,该安装夹具设置在线锯的切割进给台上,并且具有与切割平面垂直相交的水平和垂直参考表面,使得工件的中心轴线 片自动垂直于切割平面相交。 然后,通过倾斜机构使安装夹具倾斜以使工件倾斜,使得中心轴基于具有中心轴的晶体取向的偏移值数据以预定角度倾斜于切割平面 工件参考,其以前已经在线锯外测量。