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    • 2. 发明授权
    • Logic-based multiple time programming memory cell
    • 基于逻辑的多时间编程存储单元
    • US08625350B2
    • 2014-01-07
    • US13485920
    • 2012-06-01
    • Wen-Hao ChingShih-Chen WangChing-Sung Yang
    • Wen-Hao ChingShih-Chen WangChing-Sung Yang
    • G11C11/34
    • G11C16/0441G11C2216/10H01L27/11519H01L27/11524H01L29/66825H01L29/7881
    • A non-volatile memory system includes one or more non-volatile memory cells. Each non-volatile memory cell provides a floating gate, a coupling device, a first floating gate transistor, and a second floating gate transistor. The coupling device is located in a first conductivity region. The first floating gate transistor is located in a second conductivity region, and supplies read current sensed during a read operation. The second floating gate transistor is located in a third conductivity region. Such non-volatile memory cell further provides two transistors for injecting negative charge into the floating gate during a programming operation, and removing negative charge from the second floating gate transistor during an erase operation. The floating gate is shared by the first floating gate transistor, the coupling device, and the second floating gate transistor, and extends over active regions of the first floating gate transistor, the coupling device and the second floating gate transistor.
    • 非易失性存储器系统包括一个或多个非易失性存储器单元。 每个非易失性存储单元提供浮动栅极,耦合器件,第一浮栅晶体管和第二浮栅晶体管。 耦合装置位于第一导电区域中。 第一浮栅晶体管位于第二导电区域中,并提供在读操作期间感测到的读电流。 第二浮栅晶体管位于第三导电区域中。 这种非易失性存储单元进一步提供两个晶体管,用于在编程操作期间将负电荷注入浮置栅极,以及在擦除操作期间从第二浮栅晶体管去除负电荷。 浮置栅极由第一浮栅晶体管,耦合器件和第二浮栅晶体管共享,并且延伸在第一浮栅晶体管,耦合器件和第二浮栅晶体管的有源区上。
    • 10. 发明授权
    • Single poly non-volatile memory
    • 单个多重非易失性存储器
    • US07209392B2
    • 2007-04-24
    • US10905736
    • 2005-01-19
    • Hsin-Ming ChenShih-Chen WangHong-Ping Tsai
    • Hsin-Ming ChenShih-Chen WangHong-Ping Tsai
    • G11C16/04
    • G11C16/0441H01L27/115
    • An erasable programmable non-volatile memory cell encompasses an ion well; a first select transistor including a select gate, source/drain formed in the ion well, and a channel region formed between its source and drain; a first floating gate transistor having a drain, a source coupled to the drain of the first select transistor, a first floating gate channel region formed between its drain and source, and a common floating gate overlying the floating gate channel region; a second select transistor including a select gate, source/drain formed in the ion well, and a channel region formed between its source and drain; and a second floating gate transistor having a drain, a source coupled to the drain of the second select transistor, a second floating gate channel region formed between its drain and source, and the common floating gate overlying the second floating gate channel region.
    • 可擦除可编程非易失性存储单元包含离子阱; 包括选择栅极的第一选择晶体管,形成在所述离子阱中的源极/漏极以及在其源极和漏极之间形成的沟道区域; 具有漏极的第一浮栅晶体管,耦合到所述第一选择晶体管的漏极的源极,形成在其漏源和源极之间的第一浮置栅极沟道区和覆盖所述浮置栅极沟道区的公共浮动栅; 包括选择栅极的第二选择晶体管,形成在离子阱中的源极/漏极,以及在其源极和漏极之间形成的沟道区域; 以及第二浮栅晶体管,其具有漏极,耦合到所述第二选择晶体管的漏极的源极,形成在其漏极和源极之间的第二浮置栅极沟道区域以及覆盖所述第二浮置栅极沟道区域的所述公共浮动栅极。