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    • 1. 发明授权
    • Plasma processing system
    • 等离子体处理系统
    • US07489145B2
    • 2009-02-10
    • US11636389
    • 2006-12-08
    • Hiroshi MatobaRyohei TanakaShuji OmaeShigeki Amadatsu
    • Hiroshi MatobaRyohei TanakaShuji OmaeShigeki Amadatsu
    • G01R27/08
    • H05H1/46H01J37/321H01J37/32174H01J37/32935
    • A high-frequency measurement unit includes a signal detector for detecting a high-frequency signal, and a calibration coefficient storage for storing calibration coefficients Cmin and Cmax used to calibrate a value Amin detected at the lowest limit frequency fmin and a value Amax detected at the uppermost limit frequency fmax to a proper measurement value Asmin and to a proper measurement value Asmax, respectively. The high-frequency measurement unit further includes a frequency detection unit for detecting a frequency fm of the high-frequency signal, a calibration coefficient calculation unit for calculating a calibration coefficient Cm for the frequency fm, and a calibration unit for calibrating the value Am detected by the signal detector to a proper measurement value Asm by using the calibration coefficient Cm calculated by the calibration coefficient calculation unit.
    • 高频测量单元包括用于检测高频信号的信号检测器和用于存储校准系数Cmin和Cmax的校准系数存储器,用于校准在最低限频率fmin处检测到的值A a和 分别为适当的测量值Asmin和适当的测量值Asmax的最上限频率fmax。 高频测量单元还包括用于检测高频信号的频率fm的频率检测单元,用于计算频率fm的校准系数Cm的校准系数计算单元和用于校准检测到的值Am的校准单元 通过使用由校准系数计算单元计算出的校准系数Cm,通过信号检测器到适当的测量值Asm。
    • 9. 发明申请
    • Plasma processing system
    • 等离子体处理系统
    • US20070152678A1
    • 2007-07-05
    • US11636389
    • 2006-12-08
    • Hiroshi MatobaRyohei TanakaShuji OmaeShigeki Amadatsu
    • Hiroshi MatobaRyohei TanakaShuji OmaeShigeki Amadatsu
    • G01R35/00
    • H05H1/46H01J37/321H01J37/32174H01J37/32935
    • A high-frequency measurement unit includes a signal detector for detecting a high-frequency signal, and a calibration coefficient storage for storing calibration coefficients Cmin and Cmax used to calibrate a value Amin detected at the lowest limit frequency fmin and a value Amax detected at the uppermost limit frequency fmax to a proper measurement value Asmin and to a proper measurement value Asmax, respectively. The high-frequency measurement unit further includes a frequency detection unit for detecting a frequency fm of the high-frequency signal, a calibration coefficient calculation unit for calculating a calibration coefficient Cm for the frequency fm, and a calibration unit for calibrating the value Am detected by the signal detector to a proper measurement value Asm by using the calibration coefficient Cm calculated by the calibration coefficient calculation unit.
    • 高频测量单元包括用于检测高频信号的信号检测器和用于存储校准系数Cmin和Cmax的校准系数存储器,用于校准在最低限频率fmin处检测到的值A a和 分别为适当的测量值Asmin和适当的测量值Asmax的最上限频率fmax。 高频测量单元还包括用于检测高频信号的频率fm的频率检测单元,用于计算频率fm的校准系数Cm的校准系数计算单元和用于校准检测到的值Am的校准单元 通过使用由校准系数计算单元计算出的校准系数Cm,通过信号检测器到适当的测量值Asm。