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    • 1. 发明申请
    • MEMS-BASED FTIR SPECTROMETER
    • 基于MEMS的FTIR光谱仪
    • US20110139990A1
    • 2011-06-16
    • US12989871
    • 2009-08-04
    • Huikai XieLei WuAndrea PaisSean Robert Samuelson
    • Huikai XieLei WuAndrea PaisSean Robert Samuelson
    • G01N21/35G01J3/45
    • G01J3/4535G01J5/08G01J5/0853G01J5/38G01N2021/3595G02B26/0866
    • A MEMS-based Fourier Transform (FT) spectrometer is provided. According to an embodiment, the MEMS-based FT spectrometer is an FT infrared (FTIR) spectrometer. The FT spectrometer can include a beam splitter positioned to receive an incoming beam from a light source and split the incoming beam into a first sub-beam and a second sub-beam, a fixed mirror positioned to receive the first sub-beam from the beam splitter, a scanning MEMS mirror positioned to receive the second sub-beam from the beam splitter, and a photodetector, wherein a reflected first sub-beam from the fixed mirror and a reflected second sub-beam from the scanning MEMS mirror recombine at the beam splitter and become directed to the photodetector. According to one embodiment, the photodetector is a MEMS-based IR detector. In addition, the MEMS-based IR detector can be an un-cooled IR detector having a capacitive sensing structure.
    • 提供了基于MEMS的傅里叶变换(FT)光谱仪。 根据实施例,基于MEMS的FT光谱仪是FT红外(FTIR)光谱仪。 FT分光计可以包括分束器,其被定位成接收来自光源的入射光束,并将入射光束分成第一子光束和第二子光束,固定镜定位成从光束接收第一子光束 分离器,定位成从分束器接收第二子光束的扫描MEMS镜和光电检测器,其中来自固定镜的反射的第一子光束和来自扫描MEMS镜的反射的第二子光束在光束处复合 分离器并且被引导到光电检测器。 根据一个实施例,光电检测器是基于MEMS的IR检测器。 此外,基于MEMS的IR检测器可以是具有电容感测结构的未冷却的IR检测器。