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1. 发明授权

US08405415B2 Test apparatus synchronous module and synchronous method 有权
标题翻译：测试仪器同步模块和同步方式
公开(公告)号：US08405415B2
公开(公告)日：2013-03-26
申请号：US12557478
申请日：2009-09-10
申请人： Satoshi Iwamoto , Koichi Yatsuka
发明人： Satoshi Iwamoto , Koichi Yatsuka
IPC分类号： G01R31/26
CPC分类号： G01R31/31907
摘要： Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; a synchronization module that is connected to each of the plurality of test modules, and that synchronizes the plurality of test modules; and a test control section that is connected to the plurality of test modules and the synchronization module, and that controls the test modules and the synchronization module. The synchronization module includes a receiving section that receives, from each of the plurality of test modules, a state signal indicating a state of the test module; an aggregating section that generates an aggregate state signal by calculating an aggregate of the state signals received by the receiving section; and a transmitting section that transmits, to the plurality of test modules, a control signal ordering an operation corresponding to the aggregate state signal.
摘要翻译：提供了一种测试被测设备的测试设备，包括测试被测设备的多个测试模块; 同步模块，其连接到所述多个测试模块中的每一个，并且使所述多个测试模块同步; 以及连接到所述多个测试模块和所述同步模块并且控制所述测试模块和所述同步模块的测试控制部分。所述同步模块包括从所述多个测试模块中的每一个接收指示所述测试模块的状态的状态信号的接收部分; 聚合部分，其通过计算由所述接收部分接收的所述状态信号的聚合来生成聚合状态信号; 以及发送部，其向所述多个测试模块发送排序对应于所述聚合状态信号的操作的控制信号。

2. 发明授权

US08362791B2 Test apparatus additional module and test method 有权
标题翻译：测试仪附加模块和测试方法
公开(公告)号：US08362791B2
公开(公告)日：2013-01-29
申请号：US12557468
申请日：2009-09-10
申请人： Motoo Ueda , Satoshi Iwamoto , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
发明人： Motoo Ueda , Satoshi Iwamoto , Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
IPC分类号： G01R31/28 , G01R31/00
CPC分类号： G01R31/31907 , G01R31/31905
摘要： A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test, the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.
摘要翻译：测试装置包括：与被测设备通信的测试模块，以测试被测设备; 连接在被测设备和测试模块之间的附加模块，每个附加模块与被测设备进行通信，所述通信是以较高速度执行的通信和以较低延迟执行的通信中的至少一个，相比之下与测试模块进行通信; 测试头具有分别连接测试模块和附加模块的多个连接器，测试模块和附加模块安装在测试头上; 放置在测试头上的性能板，其连接在多个连接器的至少一部分端子和被测设备之间。测试模块通过性能板连接到附加模块。

3. 发明申请

US20110012612A1 TEST APPARATUS 失效
标题翻译：测试仪器
公开(公告)号：US20110012612A1
公开(公告)日：2011-01-20
申请号：US12838428
申请日：2010-07-16
申请人： Satoshi IWAMOTO
发明人： Satoshi IWAMOTO
IPC分类号： G01R31/02
CPC分类号： G01R31/31932
摘要： There is provided a test apparatus for testing a device under test, including a signal supply section that supplies a test signal to the device under test via a transmission line, and a comparing and judging section that receives a response signal from the device under test via the transmission line shared with the signal supply section, and judges whether the device under test is acceptable by referring to a comparison result obtained by comparing a signal level of the response signal with a reference level corresponding to a logic pattern of the test signal.
摘要翻译：提供了一种用于测试被测设备的测试装置，包括：通过传输线向被测设备提供测试信号的信号提供部分;以及比较和判断部分，其从被测设备接收响应信号，传输线路与信号提供部分共用，并且通过参考通过将响应信号的信号电平与对应于测试信号的逻辑模式的参考电平进行比较而获得的比较结果来判断受测装置是否可接受。

4. 发明申请

US20100102840A1 TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD 有权
标题翻译：测试装置附加模块和测试方法
公开(公告)号：US20100102840A1
公开(公告)日：2010-04-29
申请号：US12557468
申请日：2009-09-10
申请人： Motoo UEDA , Satoshi Iwamoto , Masaru Goishi , Hiryoyasu Nakayama , Masaru Tsuto
发明人： Motoo UEDA , Satoshi Iwamoto , Masaru Goishi , Hiryoyasu Nakayama , Masaru Tsuto
IPC分类号： G01R31/02
CPC分类号： G01R31/31907 , G01R31/31905
摘要： A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules, each additional module performing a communication with the device under test; the communication being at least one of a communication performed at a higher speed and a communication performed with a lower latency, in comparison with a communication performed by the test modules; a test head having a plurality of connectors that connect the test modules and the additional modules, respectively, the test modules and the additional modules are mounted on the test head; a performance board placed on the test head that connects between at least a part of terminals of the plurality of connectors and the device under test. The test modules are connected to the additional modules without through the performance board.
摘要翻译：测试装置包括：与被测设备通信的测试模块，以测试被测设备; 连接在被测设备和测试模块之间的附加模块，每个附加模块与被测设备进行通信; 所述通信是与由所述测试模块执行的通信相比较，以较高速度执行的通信和以较低延迟执行的通信中的至少一个通信; 测试头具有分别连接测试模块和附加模块的多个连接器，测试模块和附加模块安装在测试头上; 放置在测试头上的性能板，其连接在多个连接器的至少一部分端子和被测设备之间。测试模块通过性能板连接到附加模块。

5. 发明授权

US07158908B2 Test apparatus, diagnosing program and diagnosing method therefor 失效
标题翻译：测试仪器，诊断程序及其诊断方法
公开(公告)号：US07158908B2
公开(公告)日：2007-01-02
申请号：US11137861
申请日：2005-05-25
申请人： Satoshi Iwamoto
发明人： Satoshi Iwamoto
IPC分类号： G06F19/00
CPC分类号： G01R31/31901
摘要： There is provided a test apparatus having a plurality of test modules. The test apparatus stores object diagnosing programs for controlling diagnosis of the object test module to be diagnosed of a certain type per type of the test module to be diagnosed and stores, separately from it, a set of identification information of diagnostic performance board to be mounted on a test head to diagnose the object test module to be diagnosed by the respective object diagnosing programs per type of the object test modules to be diagnosed. When the diagnostic performance board is mounted on the test head, the test apparatus obtains identification information of the diagnostic performance board and executes the object diagnosing program corresponding to that type under the condition that the identification information coincides with the identification information stored correlatively with the type of the designated object test module to be diagnosed.
摘要翻译：提供了具有多个测试模块的测试装置。测试装置存储用于控制待诊断的对象测试模块的诊断对象诊断程序，每个类型的待诊断的测试模块的类型与其分开存储要安装的诊断性能板的识别信息的集合在测试头上诊断由要诊断的对象测试模块的每个对象诊断程序诊断的对象测试模块。当诊断性能板安装在测试头上时，测试设备获得诊断性能板的识别信息，并且在识别信息与与该类型相关的存储的识别信息一致的条件下执行与该类型相对应的对象诊断程序的被指定对象测试模块进行诊断。

6. 发明授权

US5916990A Propylene-based polymer, method of its production, composition thereof, catalyst component for polymerization, and method for its production 失效
标题翻译：丙烯系聚合物，其制造方法，其组成，聚合用催化剂成分及其制造方法
公开(公告)号：US5916990A
公开(公告)日：1999-06-29
申请号：US256407
申请日：1994-09-07
申请人： Hisayoshi Yanagihara , Kazuyuki Watanabe , Satoshi Iwamoto , Hirotoshi Takahashi , Kazuharu Itoh
发明人： Hisayoshi Yanagihara , Kazuyuki Watanabe , Satoshi Iwamoto , Hirotoshi Takahashi , Kazuharu Itoh
IPC分类号： C08F4/651 , C08F4/654 , C08F10/00 , C08F10/06 , C08F110/06 , C08L23/10
CPC分类号： C08F110/06 , C08F10/00 , Y10S526/904
摘要： There are provided a propylene-based polymer characterized in that (1) the xylene-extraction insoluble portion (XI) is 99.0 wt % or greater, (2) the isotactic pentad ratio (IP) is 98.0% or greater as measured by .sup.13 C nuclear magnetic resonance spectroscopy, (3) the isotactic average chain length (N) is 500 or greater, and (4) the total amount of each of the fractions obtained by column separation of the xylene insolubles whose average chain length (N.sub.f) is 800 or greater accounts for 10 wt % or more of the entirety, and a method for its production, as well as a propylene-based polymer composition prepared by combining with this propylene-based polymer at least a nucleating agent in the range of 0.05-15 wt %. In addition, there are provided a polymerization catalyst component allowing the production of such a propylene-based polymer, and a method for its production.
摘要翻译： PCT No.PCT / JP94 / 00770 Sec。 371日期：1994年9月7日 102（e）1994年9月7日PCT PCT 1994年5月12日PCT公布。公开号WO95 / 31490 日期：1995年11月23日提供了一种丙烯类聚合物，其特征在于，（1）二甲苯萃取不溶部分（XI）为99.0重量％以上，（2）全同立构五单元比（IP）为98.0％以上如通过13C核磁共振光谱法测定的，（3）全同立构平均链长（N）为500以上，（4）将二甲苯不溶物的平均链长（ Nf）为800以上，占整体的10重量％以上，其制造方法以及通过与该丙烯类聚合物组合而成的丙烯类聚合物组合物，所述组合物至少在该范围内的成核剂为0.05-15重量％。此外，提供了一种允许生产这种丙烯类聚合物的聚合催化剂组分及其制备方法。

7. 发明授权

US08261119B2 Test apparatus for testing device has synchronization module which synchronizes analog test module to digital test module based on synchronization signal received from digital test module 失效
标题翻译：用于测试装置的测试装置具有同步模块，其基于从数字测试模块接收的同步信号，将模拟测试模块与数字测试模块同步
公开(公告)号：US08261119B2
公开(公告)日：2012-09-04
申请号：US12557474
申请日：2009-09-10
申请人： Satoshi Iwamoto
发明人： Satoshi Iwamoto
IPC分类号： G06F1/12
CPC分类号： G01R31/31907
摘要： There is provided a test apparatus for testing a device under test, including a plurality of test modules that test the device under test, and a synchronization module that is connected to each of the plurality of test modules, where the synchronization module synchronizes together the plurality of test modules. Here, based on a synchronization signal received from a digital module, the synchronization module synchronizes an analog module to the digital module, and the digital module is one of the plurality of test modules that exchanges a digital signal with the device under test, and the analog module is one of the plurality of test modules that performs an analog test on the device under test.
摘要翻译：提供了一种用于测试被测设备的测试设备，包括测试被测设备的多个测试模块和连接到多个测试模块中的每一个的同步模块，其中同步模块将多个测试模块的测试模块。这里，基于从数字模块接收到的同步信号，同步模块将模拟模块同步到数字模块，数字模块是与被测设备交换数字信号的多个测试模块之一，模拟模块是对被测设备进行模拟测试的多个测试模块之一。

8. 发明申请

US20110057663A1 TEST APPARATUS SYNCHRONOUS MODULE AND SYNCHRONOUS METHOD 有权
标题翻译：测试装置同步模块和同步方法
公开(公告)号：US20110057663A1
公开(公告)日：2011-03-10
申请号：US12557478
申请日：2009-09-10
申请人： Satoshi IWAMOTO , Koichi YATSUKA
发明人： Satoshi IWAMOTO , Koichi YATSUKA
IPC分类号： G01R31/02
CPC分类号： G01R31/31907
摘要： Provided is a test apparatus that tests a device under test, comprising a plurality of test modules that test the device under test; a synchronization module that is connected to each of the plurality of test modules, and that synchronizes the plurality of test modules; and a test control section that is connected to the plurality of test modules and the synchronization module, and that controls the test modules and the synchronization module. The synchronization module includes a receiving section that receives, from each of the plurality of test modules, a state signal indicating a state of the test module; an aggregating section that generates an aggregate state signal by calculating an aggregate of the state signals received by the receiving section; and a transmitting section that transmits, to the plurality of test modules, a control signal ordering an operation corresponding to the aggregate state signal.
摘要翻译：提供了一种测试被测设备的测试设备，包括测试被测设备的多个测试模块; 同步模块，其连接到所述多个测试模块中的每一个，并且使所述多个测试模块同步; 以及连接到所述多个测试模块和所述同步模块并且控制所述测试模块和所述同步模块的测试控制部分。所述同步模块包括从所述多个测试模块中的每一个接收指示所述测试模块的状态的状态信号的接收部分; 聚合部分，其通过计算由所述接收部分接收的所述状态信号的聚合来生成聚合状态信号; 以及发送部，其向所述多个测试模块发送排序对应于所述聚合状态信号的操作的控制信号。

9. 发明申请

US20100260508A1 FIXING DEVICE WHICH DETECTS ANOMALY OF HEATER 有权
标题翻译：检测加热器异常的固定装置
公开(公告)号：US20100260508A1
公开(公告)日：2010-10-14
申请号：US12752711
申请日：2010-04-01
申请人： Satoshi IWAMOTO
发明人： Satoshi IWAMOTO
IPC分类号： G03G15/20
CPC分类号： G03G15/55 , G03G15/2039
摘要： A fixing device shifts to the anomaly detection mode in arbitrary timing except during printing. In the anomaly detection mode, a first heat generation member and a second heat generation member are off and only a third heat generation member is turned on for a predetermined time. A quantity of temperature change in a fixing member during that time is detected by a first temperature detection member or a second temperature detection member. When the quantity of temperature change is within a predetermined range, it is determined that the third heat generation member is normal. In inspecting whether the third heat generation member is normal or not, when the temperature of the fixing member is in the area exceeding T1° C. where the temperature rise gradient of the fixing member is gentler, the inspection is skipped.
摘要翻译：除了打印之外，定影装置以任意定时移动到异常检测模式。在异常检测模式中，第一发热构件和第二发热构件断开，仅第三发热构件接通预定时间。第一温度检测部件或第二温度检测部件检测在该时间内的固定部件的温度变化量。当温度变化量在预定范围内时，确定第三发热件正常。在检查第三发热体是否正常的情况下，当固定部件的温度在定影部件的温度上升趋于平缓的地方超过T1℃的区域时，跳过检查。

10. 发明授权

US07781291B2 Semiconductor device and method for fabricating the same 有权
标题翻译：半导体装置及其制造方法
公开(公告)号：US07781291B2
公开(公告)日：2010-08-24
申请号：US12551848
申请日：2009-09-01
申请人： Nobuyoshi Takahashi , Satoshi Iwamoto , Fumihiko Noro , Masatoshi Arai
发明人： Nobuyoshi Takahashi , Satoshi Iwamoto , Fumihiko Noro , Masatoshi Arai
IPC分类号： H01L21/336
CPC分类号： H01L27/11568 , H01L21/823878 , H01L27/105 , H01L27/1052 , H01L27/11573 , H01L29/792 , Y10S438/954
摘要： A semiconductor device includes a memory section formed at a semiconductor substrate and including a first transistor having an ONO film that can store charges between the semiconductor substrate and a memory electrode and a first STI region for isolating the first transistor, and a CMOS section formed at the semiconductor substrate and including a second transistor having a CMOS electrode and a gate dielectric and a second STI region for isolating the second transistor. The height of the top surface of the first STI region is set equal to or smaller than the height of the top surface of the second STI region.
摘要翻译：一种半导体器件包括形成在半导体衬底上的存储器部分，并且包括具有可存储半导体衬底和存储电极之间的电荷的ONO膜的第一晶体管和用于隔离第一晶体管的第一STI区域和形成在半导体衬底并且包括具有CMOS电极和栅极电介质的第二晶体管和用于隔离第二晶体管的第二STI区域。第一STI区域的顶表面的高度被设定为等于或小于第二STI区域的顶表面的高度。

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