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    • 5. 发明授权
    • Resistance random access memory having common source line
    • 具有共同源极线的电阻随机存取存储器
    • US07903448B2
    • 2011-03-08
    • US11964142
    • 2007-12-26
    • Hyung-Rok OhSang-Beom KangJoon-Min ParkWoo-Yeong Cho
    • Hyung-Rok OhSang-Beom KangJoon-Min ParkWoo-Yeong Cho
    • G11C11/00
    • G11C13/0007G11C13/0069G11C2013/0071G11C2013/009G11C2213/31G11C2213/79
    • A resistance random access memory (RRAM) having a source line shared structure and an associated data access method. The RRAM, in which a write operation of writing data of first state and second state to a selected memory cell is performed through first and second write paths having mutually opposite directions, includes word lines, bit lines, a memory cell array and a plurality of source lines. The memory cell array includes a plurality of memory cells each constructed of an access transistor coupled to a resistive memory device. The memory cells are disposed in a matrix of rows and columns and located at each intersection of a word line and a bit line. Each of the plurality of source lines is disposed between a pair of word lines and in the same direction as the word lines. A positive voltage is applied to a source line in a memory cell write operation. Through the source line shared structure, occupied chip area is reduced and, in a write operating mode, a bit line potential can be determined within a positive voltage level range.
    • 具有源线共享结构的电阻随机存取存储器(RRAM)和相关联的数据存取方法。 其中通过具有相互相反方向的第一和第二写入路径来执行将第一状态和第二状态的数据写入所选存储单元的写入操作,包括字线,位线,存储单元阵列和多个 源线。 存储单元阵列包括多个存储单元,每个存储单元由耦合到电阻存储器件的存取晶体管构成。 存储单元被布置成行和列的矩阵并且位于字线和位线的每个交叉点处。 多个源极线中的每一个被设置在一对字线之间并且在与字线相同的方向上。 在存储单元写入操作中,将正电压施加到源极线。 通过源极线共享结构,占用的芯片面积减小,并且在写入操作模式中,可以在正电压电平范围内确定位线电位。
    • 10. 发明授权
    • Nonvolatile memory device and related method of operation
    • 非易失存储器件及相关操作方法
    • US07586775B2
    • 2009-09-08
    • US11850130
    • 2007-09-05
    • Sang-beom KangYong-jin YoonQi Wang
    • Sang-beom KangYong-jin YoonQi Wang
    • G11C11/00
    • G11C13/0069G11C13/0004G11C2013/009
    • A nonvolatile memory device comprises a first voltage generation unit, a second voltage generation unit, a first circuit block, and a discharge unit. The first voltage generation unit generates a first voltage with a first magnitude. The second voltage generation unit generates a second voltage with a second magnitude greater than the first magnitude. The first circuit block selectively receives the first voltage or the second voltage through an input node. The discharge unit discharges the input node between a time point where the input node has been charged with the second voltage and a time point where the input node receives the first voltage.
    • 非易失性存储器件包括第一电压产生单元,第二电压产生单元,第一电路块和放电单元。 第一电压产生单元产生具有第一量值的第一电压。 第二电压产生单元产生具有大于第一幅值的第二幅度的第二电压。 第一电路块通过输入节点选择性地接收第一电压或第二电压。 放电单元在输入节点已经被充电的时间点与第二电压之间和输入节点接收到第一电压的时间点之间对输入节点进行放电。